01.10.2009 | Ferroelectrics | Ausgabe 19/2009
Nanoscale insight into the statics and dynamics of polarization behavior in thin film ferroelectric capacitors
- Zeitschrift:
- Journal of Materials Science > Ausgabe 19/2009
Abstract
In this study, we review recent advances in PFM studies of micrometer scale ferroelectric capacitors, summarize the experimental PFM-based approach to investigation of fast switching processes, illustrate what information can be obtained from PFM experiments on domains kinetics, and delineate the scaling effect on polarization reversal mechanism. Particular attention is given to PFM studies of mechanical stress effect on polarization stability.
