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Erschienen in:
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2011 | OriginalPaper | Buchkapitel

3. Nanoscale Reference Materials

verfasst von : Gert Roebben, Hendrik Emons, Georg Reiners

Erschienen in: Nanotechnology Standards

Verlag: Springer New York

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Abstract

Globalisation of both science and trade has increased the relevance of the ­comparability of measurement data whether in research, industry or regulatory contexts. Reference materials (RMs) are essential tools in the quest for comparable and reliable measurement results, a quest which laboratories, worldwide, are tasked with every day. An explicit acknowledgement of the importance of RMs in today’s measurement systems is found, for instance, in the laboratory accreditation standards, such as ISO/IEC 17025 [1].

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Vorheriges Kapitel Current Perspectives in Nanotechnology Terminology and Nomenclature
Nächstes Kapitel Nanoscale Metrology and Needs for an Emerging Technology
Glossar
AES
Auger electron spectrometry
AFM
Atomic force microscope
BAM
Bundesanstalt für Materialforschung und –prüfung
BET
Brunauer-Emmett-Teller (inventors of the BET technique for surface area measurements)
CNT
Carbon nanotube
CRM
Certified reference material
ERM
European Reference Materials
ESCA
Electron spectroscopy chemical analysis
IEC
International Electrotechnical Commission
ILC
Interlaboratory comparison
IRMM
Institute for Reference Materials and Measurements
ISO
International Organization for Standardization
ISO/REMCO
The ISO Committee on Reference Materials
JRC
Joint Research Centre of the European Commission
NIST
National Institute for Standards and Technology (USA)
NMI
National Metrology Institute
NMIJ
National Metrology Institute of Japan
PS
Polystyrene
RM
Reference material
SAXS
Small-angle x-ray scattering
SEM
Scanning electron microscope
SI
International System of Units
SIMS
Secondary ion mass spectrometry
SPM
Scanning probe microscope
SWCNT
Single wall carbon nanotube
TC
Technical Committee
TEM
Transmission electron microscope
TS
Technical Specification
USA
United States of America
VIM
International Vocabulary of Metrology
Literatur
1.
International Organization for Standardization: ISO/IEC 17025:2005 General Requirements for the Competence of Testing and Calibration Laboratories. ISO, Geneva (2005)
2.
3.
Lövestam, G., Rauscher, H., Roebben, G., Sokull Klütgen, B., Gibson, N., Putaud, J-Ph, Stamm, H.: Considerations on a Definition of Nanomaterial for Regulatory Purposes. Publications Office of the European Union, Luxembourg (2010). ISBN 978-92-79-16014-1
4.
International Organization for Standardization: ISO/TS 27687:2008 Nanotechnologies – Terminology and Definitions for Nano-Objects – Nanoparticle, Nanofibre and Nanoplate. ISO, Geneva (2008)
5.
6.
The National Nanotechnology Coordination Office: The National Nanotechnology Initiative Strategic Plan December 2007. Subcommittee on Nanoscale Science, Engineering, and Technology, Committee on Technology, National Science and Technology Council, The National Nanotechnology Coordination Office, Washington, DC (2007)
7.
8.
International Organization for Standardization: ISO Guide 30:1992/Amd 1:2008, Revision of Definitions for Reference Material and Certified Reference Material. ISO, Geneva (2008)
9.
International Organization for Standardization: ISO/IEC Guide 99:2007, International Vocabulary of Metrology – Basic and General Concepts and Associated Terms (VIM). ISO, Geneva (2007)
10.
Linsinger, T.P.J., Pauwels, J., van der Veen, A.M.H., Schimmel, H., Lamberty, A.: Homogeneity and stability of reference materials. Accred. Qual. Assur. 6, 20–25 (2001)CrossRef
11.
Lamberty, A., Schimmel, H., Pauwels, J.: The study of the stability of reference materials by isochronous measurements. Fresenius J Anal Chem 361, 359–361 (1998)CrossRef
12.
Emons, H.: The ‘RM family’ – Identification of all of its members. Accred. Qual. Assur. 10, 690–691 (2006)CrossRef
13.
International Organization for Standardization: ISO Guide 34: Reference Materials – General Requirements for the Competence of Reference Material Producers. ISO, Geneva (2009)
14.
International Organization for Standardization: ISO Guide 35: Reference Materials – General and Statistical Principles for Certification. ISO, Geneva (2006)
15.
International Organization for Standardization: ISO Guide 31:2000, Reference materials – Contents of Certificates and Labels. ISO, Geneva (2000)
16.
Linsinger, T.: ERM Application Note 1, Comparison of a measurement result with the ­certified value. European Reference Materials. http://​www.​erc-crm.​org (2005)
17.
Roebben, G., Linsinger, T.P.J., Lamberty, A., Emons, H.: Metrological traceability of the measured values of properties of engineering materials. Metrologia 47, S23–S31 (2010)CrossRef
18.
Emons, H.: Policy for the statement of metrological traceability on certificates of ERM® certified reference materials. European Reference Materials. http://​www.​erm-crm.​org (2008)
19.
Koeber, R., Linsinger, T., Emons, H.: An approach for more precise statements of metrological traceability on reference material certificates. Accred. Qual. Assur. 15, 255–262 (2010)CrossRef
20.
Wang, C.Y., Fu, W.E., Lin, H.L., Peng, G.S.: Preliminary study on nanoparticle sizes under the APEC technology cooperative framework. Meas. Sci. Technol. 18, 487–495 (2007)CrossRef
21.
ASTM Committee E56 on Nanotechnology: Interlaboratory Study to Establish Precision Statements for ASTM E2490-09 Standard Guide for Measurement of Particle Size Distribution of Nanomaterials in Suspension by Photon Correlation Spectroscopy (PCS). Research Report E56-1001, ASTM Committee E56 on Nanotechnology, Subcommittee E56.02 on Characterization: Physical, Chemical, and Toxicological Properties, April 2009
22.
Lamberty, A., Franks, K., Braun, A., Kestens, V., Roebben, G., Linsinger, T.: Interlaboratory comparison of methods for the measurement of particle size, effective particle density and zeta potential of silica nanoparticles in an aqueous solution. JRC Scientific and Technical Reports, IRMM Internal Report RM-10-003, 2010
23.
Koenders, L., Dziomba, T., Thomson-Schmidt, P., Wilkening, G.: Standards for the calibration of instruments for dimensional nanometrology. In: Wilkening, G., Koenders, L. (eds.) Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro- and Nanometer Range, pp. 245–258. Wiley-VCH, Weinheim, Germany (2005). ISBN 3-527-40502-X
24.
25.
26.
27.
International Organization for Standardization: ISO 13321:1996, Particle Size Analysis – Photon Correlation Spectroscopy. ISO, Geneva (1996)
28.
International Organization for Standardization: ISO 22412:2008, Particle Size Analysis – Dynamic Light Scattering (DLS). ISO, Geneva (2008)
29.
International Organization for Standardization: ISO 13318–2:2007, Determination of Particle Size Distribution by Centrifugal Liquid Sedimentation Methods – Part 2: Photocentrifuge Method. ISO, Geneva (2007)
30.
Kestens, V., Braun, A., Couteau, O., Franks, K., Lamberty, A., Linsinger, T., Roebben, G.: The use of a colloidal silica reference material IRMM-304 for quality control in nanoparticle sizing by dynamic light scattering and centrifugal sedimentation. Presented at the 6th world congress on particle technology, WCPT6, April 2010
31.
32.
33.
34.
35.
36.
37.
38.
Cheng Sui, Y., Saniger, J.M.: Characterization of anodic porous alumina by AFM. Mater. Lett. 48, 127–136 (2001)CrossRef
39.
40.
41.
Braun, A., Kestens, V., Franks, K., Couteau, O., Lamberty, A., Linsinger, T., Roebben, G.: Validation of dynamic light scattering and differential centrifugal sedimentation methods for nanoparticles characterisation. Presented at the 6th world congress on particle technology, WCPT6, April 2010
42.
Metadaten
Titel
Nanoscale Reference Materials
verfasst von
Gert Roebben
Hendrik Emons
Georg Reiners
Copyright-Jahr
2011
Verlag
Springer New York
Buch
Nanotechnology Standards

Print ISBN: 978-1-4419-7852-3

Electronic ISBN: 978-1-4419-7853-0

Copyright-Jahr: 2011

DOI
https://doi.org/10.1007/978-1-4419-7853-0_3

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