nach oben

Erschienen in:

2011 | OriginalPaper | Buchkapitel

5. Nanoscopic Architecture and Microstructure

verfasst von : Koji Maeda, Prof., Hiroshi Mizubayashi

Erschienen in: Springer Handbook of Metrology and Testing

Verlag: Springer Berlin Heidelberg

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config

KI-gestützte Suche

Aus

Abstract

The methods compiled in this chapter are important in many areas of materials science and technology because various physical properties of materials (mechanical, thermal, electronic, optical, magnetic, dielectric, biological) depend on their geometric architecture, on scales ranging from the atomic or nanoscopic to the semimicroscopic. Some of the properties are governed only by an elementary atomic group in the structural hierarchy while others are brought about by cooperative functioning of multiple phases or microscopic structures in different dimensions. Corresponding to the vast variety of materials and their properties, a wide range of experimental techniques are available, so that the choice of which technique to employ on starting a study may not be clear. In this respect one should also bear in mind that some of the techniques presented in this chapter are based on physical principles, which are also relevant to the measurement methods compiled in Chaps. 6 and 11.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

über 102.000 Bücher
über 537 Zeitschriften

aus folgenden Fachgebieten:

Automobil + Motoren
Bauwesen + Immobilien
Business IT + Informatik
Elektrotechnik + Elektronik
Energie + Nachhaltigkeit
Finance + Banking
Management + Führung
Marketing + Vertrieb
Maschinenbau + Werkstoffe
Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Jetzt informieren

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

über 67.000 Bücher
über 390 Zeitschriften

aus folgenden Fachgebieten:

Automobil + Motoren
Bauwesen + Immobilien
Business IT + Informatik
Elektrotechnik + Elektronik
Energie + Nachhaltigkeit
Maschinenbau + Werkstoffe

Jetzt Wissensvorsprung sichern!

Jetzt informieren

Vorheriges Kapitel Analytical Chemistry

Nächstes Kapitel Surface and Interface Characterization

5.1.

A. Briggs, W. Arnold: Advances in Acoustic Microscopy (Plenum, New York 1995)CrossRef

5.2.

K. Sakai, T. Ogawa: Fourier-transformed light scattering tomography for determination of scatterer shapes, Meas. Sci. Technol. 8, 1090 (1997)CrossRef

5.3.

S.V. Gupta: Practical Density Measurement and Hydrometry (IOP, Bristol 2002)CrossRef

5.4.

Z. Alfassi: Activation Analysis, Vol. I&II (CRC, Boca Raton 1990)

5.5.

A. Tonomura: Electron Holography (Springer, Berlin, Heidelberg 1999)CrossRef

5.6.

J. Shah: Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures (Springer, Berlin, Heidelberg 1996)CrossRef

5.7.

T. Wimbauer, K. Ito, Y. Mochizuki, M. Horikawa, T. Kitano, M.S. Brandt, M. Stutzmann: Defects in planar Si pn junctions studied with electrically detected magnetic resonance, Appl. Phys. Lett. 76, 2280 (2000)CrossRef

5.8.

L.V. Azároff: Elements of X-ray Crystallography (McGraw-Hill, New York 1968)

5.9.

J.M. Cowley: Diffraction Physics (North-Holland, Amsterdam 1975)

5.10.

B.D. Cullity: Elements of X-ray Diffraction (Addison-Wesley, Reading 1977)

5.11.

A. Guinier: X-ray Diffraction in Crystals and Imperfect Crystals, Amorphous Bodies (Dover, New York 1994)

5.12.

G. Rhodes: Crystallography Made Crystal Clear (Academic, San Diego 2000)

5.13.

S. Bradbury: An Introduction to the Optical Microscope (Oxford Sci. Publ., Oxford 1989)

5.14.

P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley, M.J. Whelan: Electron Microscopy of Thin Crystals (Butterworths, London 1965)

5.15.

D.B. Williams, C.B. Carter: Transmission Electron Microscopy (Plenum, New York 1996)CrossRef

5.16.

M.J. Whelan: Dynamical Theory of Electron Diffraction. In: Modern Diffraction and Imaging Techniques in Materials Science, ed. by S. Amelinckx, R. Gevers, G. Remaut, J. Van Landuyt (North-Holland, Amsterdam 1970) p. 35

5.17.

C.E. Lyman, D.E. Newbury, J.I. Goldstein, D.B. Williams, A.D. Romig Jr., J.T. Armstrong, P. Echlin, C.E. Fiori, D.C. Joy, E. Lifshin, K. Peters: Scanning Electron Microscopy, X-ray Microanalysis and Analytical Electron Microscopy (Plenum, New York 1990)CrossRef

5.18.

D. Bonnell (Ed.): Scanning Probe Microscopy and Spectroscopy (Wiley, Weinheim 2001)

5.19.

B. Bhushan, H. Huchs, S. Hosaka (Eds.): Applied Scanning Probe Methods (Springer, Berlin, Heidelberg 2004)

5.20.

K.S. Birdi: Scanning Probe Microscopes (CRC, Boca Raton 2003)CrossRef

5.21.

V.J. Morris, A.R. Kirby, A.P. Gunning: Atomic Force Microscopy for Biologists (Imperial College Press, London 1999)CrossRef

5.22.

S. Morita, R. Wiesendanger, E. Meyer: Noncontact Atomic Force Microscopy (Springer, Berlin, Heidelberg 2002)CrossRef

5.23.

M. Ohtsu: Near-Field Nano-Atom Optics and Technology (Plenum, New York 1999)CrossRef

5.24.

M.K. Miller, G.D.W. Smith: Atom Probe Microanalysis (Materials Research Society, Pittsburgh 1989)

5.25.

S. Morita, N. Oyabu: Atom selective imaging and mechanical atom manipulation based on noncontact atomic force microscope method, e-J. Surf. Sci. Technol. 1, 158 (2003)

5.26.

D. Attwood: Soft X-rays and Extreme Ultraviolet Radiation (Cambridge Univ. Press, Cambridge 1999)CrossRef

5.27.

H. Kusmany: Solid State Spectroscopy (Springer, Berlin, Heidelberg 1998) p. 210CrossRef

5.28.

M. Fleischman, P.J. Hendra, A.J. McQuillan: Raman-spectra of pyridine adsorbed at a silver electrode, Chem. Phys. Lett. 26, 163 (1974)CrossRef

5.29.

D.L. Feldheim, C.A. Foss Jr.: Metal Nanoparticles (Marcel Dekker, New York 2002)

5.30.

A.S. Nowick, B.S. Berry: Anelastic Relaxation in Crystalline Solids (Academic, New York 1972)

5.31.

G. Bricogne: Maximum-entropy and the foundations of direct methods, Acta Cryst. A 40, 410 (1984)CrossRef

5.32.

S. Ogawa, M. Hirabayashi, D. Watanabe, H. Iwasaki: Long-period Ordered Alloys (Agne Gijutsu Center, Tokyo 1997)

5.33.

R. Kitaura, S. Kitagawa, Y. Kubota, T.C. Kobayashi: Formation of a one-dimensional array of oxygen in a microporous metal-organic solid, Science 298, 2358 (2002)CrossRef

5.34.

R.B. Von Dreele: Combined Rietveld and stereochemical restraint refinement of a protein crystal structure, J. Appl. Cryst. 32, 1084 (1999)CrossRef

5.35.

M. Ito, H. Narumi, T. Mizoguchi, T. Kawamura, H. Iwasaki, N. Shiotani: Structural change of amorphous Mg₇0Zn₃0 alloy under isothermal annealing, J. Phys. Soc. Jpn. 54, 1843–1854 (1985)CrossRef

5.36.

S.R.P. Silva: Properties of Amorphous Carbon (INSPEC, London 2003)

5.37.

P. Ehrhart, H.G. Haubold, W. Schilling: Investigation of Point Defects and Their Agglomerates in Irradiated Metals by Diffuse X-ray Scattering. In: Festkörperprobleme XIV/Advances in Solid State Phys, ed. by H.J. Queisser (Vieweg, Braunschweig 1974)

5.38.

A. Hida, Y. Mera, K. Maeda: Identification of arsenic antisite defects with EL2 by nanospectroscopic studies of individual centers, Physica B 308–310, 738 (2001)CrossRef

5.39.

P.M. Voyles, D.A. Muller, J.L. Grazul, P.H. Citrin, H.-J.L. Gossmann: Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si, Nature 416, 826 (2002)CrossRef

5.40.

D.A. Muller, N. Nakagawa, A. Ohtomo, J. Grazul, H.Y. Hwang: Atomic-scale imaging of nanoengineered oxygen vacancy profiles in SrTiO₃, Nature 430, 657 (2004)CrossRef

5.41.

F. Lüty: FA centers in alkali halide crystals. In: Physics of Color Centers, ed. by W.B. Fowler (Academic Press, New York 1968) p. 181

5.42.

A. van der Ziel: Noise in Solid State Devices and Circuits (Wiley, New York 1986)

5.43.

N.B. Lukyanchikova: Noise Research in Semiconductor Physics (Gordon Breach, Amsterdam 1996)

5.44.

N. Fukata, T. Ohori, M. Suezawa, H. Takahashi: Hydrogen-defect complexes formed by neutron irradiation of hydrogenated silicon observed by optical absorption measurement, J. Appl. Phys. 91, 5831 (2002)CrossRef

5.45.

A. Hida: unpublished

5.46.

J.P. Buisson, S. Lefrant, A. Sadoc, L. Taureland, M. Billardon: Raman-scattering by KI containing F-centers, Phys. Status Solidi (b) 78, 779 (1976)CrossRef

5.47.

T. Sekiguchi, Y. Sakuma, Y. Awano, N. Yokoyama: Cathodoluminescence study of InGaAs/GaAs quantum dot structures formed on the tetrahedral-shaped recesses on GaAs (111)B substrates, J. Appl. Phys. 83, 4944 (1998)CrossRef

5.48.

G.D. Watkins: Radiation Damage in Semiconductors (Dunod, Paris 1964) p. 97

5.49.

B. Henderson: Defects in Crystalline Solids (Arnold, London 1972)

5.50.

L.F. Mollenauer, S. Pan: Dynamics of the optical-pumping cycle of F centers in alkali halides-theory and application to detection of electron-spin and electron-nuclear-double-spin resonance in the relaxed-excited state, Phys. Rev. B 6, 772 (1972)CrossRef

5.51.

S.E. Barrett, R. Tycko, L.N. Pfeiffer, K.W. West: Directly detected nuclear-magnetic-resonance of optically pumped GaAs quantum-wells, Phys. Rev. Lett. 72, 1368 (1994)CrossRef

5.52.

K. Morigaki: Spin-dependent radiative and nonradiative recombinations in hydrogenated amorphous silicon: Optically detected magnetic resonance, J. Phys. Soc. Jpn. 50, 2279 (1981)CrossRef

5.53.

A. Möslang, H. Graf, G. Balzer, E. Recknagel, A. Weidinger, T. Wichert, R.I. Grynszpan: Muon trapping at monovacancies in iron, Phys. Rev. B 27, 2674 (1983)CrossRef

5.54.

C.P. Slichter, D. Ailion: Low-field relaxation and the study of ultraslow atomic motions by magnetic resonance, Phys. Rev. 135, A1099 (1964)CrossRef

5.55.

M.J. Puska, C. Corbel: Positron states in Si and GaAs, Phys. Rev. B 38, 9874 (1988)CrossRef

5.56.

M. Hakala, M.J. Puska, R.M. Nieminen: Momentum distributions of electron-positron pairs annihilating at vacancy clusters in Si, Phys. Rev. B 57, 7621 (1998)CrossRef

5.57.

M. Hasegawa: private communication

5.58.

M. Saito, A. Oshiyama: Lifetimes of positrons trapped at Si vacancies, Phys. Rev. B 53, 7810 (1996)CrossRef

5.59.

Z. Tang, M. Saito, M. Hasegawa: unpublished

5.60.

H. Ohkubo, Z. Tang, Y. Nagai, M. Hasegawa, T. Tawara, M. Kiritani: Positron annihilation study of vacancy-type defects in high-speed deformed Ni, Cu and Fe, Mater. Sci. Eng. A 350, 95 (2003)CrossRef

5.61.

P. Hautojärvi: Positrons in Solids (Springer, Berlin, Heidelberg 1979)CrossRef

5.62.

R. Krause-Rehberg, H.S. Leipner: Positron Annihilation in Semiconductors (Springer, Berlin, Heidelberg 1999)CrossRef

5.63.

W. Triftshäuser, J.D. McGervey: Monovacancy formation energy in copper, silver, and gold by positron-annihilation, Appl. Phys. 6, 177 (1975)CrossRef

5.64.

R.O. Simmons, R.W. Balluffi: Measurements of equilibrium vacancy concentrations in aluminum, Phys. Rev. 117, 52 (1960)CrossRef

5.65.

M. Hasegawa, Z. Tang, Y. Nagai, T. Nonaka, K. Nakamura: Positron lifetime and coincidence Doppler broadening study of vacancy-oxygen complexes in Si: Experiments and first-principles calculations, Appl. Surf. Sci. 194, 76 (2002)CrossRef

5.66.

S. Mantl, W. Triftshäuser: Defect annealing studies on metals by positron-annihilation and electrical-resistivity measurement, Phys. Rev. B 17, 1645 (1978)CrossRef

5.67.

M. Hasegawa, Z. Tang, Y. Nagai, T. Chiba, E. Kuramoto, M. Takenaka: Irradiation-induced vacancy and Cu aggregations in Fe-Cu model alloys of reactor pressure vessel steels: State-of-the-art positron annihilation spectroscopy, Philos. Mag. 85, 467 (2005)CrossRef

5.68.

T. Moriya, H. Ino, F.E. Fujita, Y. Maeda: Mössbauer effect in iron-carbon martensite structure, J. Phys. Soc. Jpn. 24, 60 (1968)CrossRef

5.69.

K. Nakagawa, K. Maeda, S. Takeuchi: Observation of dislocations in cadmium telluride by cathodoluminescence microscopy, Appl. Phys. Lett. 34, 574 (1979)CrossRef

5.70.

L.N. Pronina, S. Takeuchi, K. Suzuki, M. Ichihara: Dislocation-structures in rolled and annealed (001) [110] single-crystal molybdenum, Philos. Mag. A 45, 859 (1982)CrossRef

5.71.

M.J. Hÿtch, J. Putaux, J. Pénisson: Measurement of the displacement field of dislocations to 0.03 Åby electron microscopy, Nature 423, 270–273 (2003)CrossRef

5.72.

R.L. Snyder, J. Fiala, H.J. Bunge: Defect, Microstructure Analysis by Diffraction (Oxford Univ. Press, Oxford 1999)

5.73.

G. Rhodes: Crystallography: A Guide for Users of Macromolecular Models, 2nd edn. (Academic, San Diego 2000)

5.74.

K. Wüthrich: NMR of Proteins and Nucleic Acids (Wiley, New York 1986)

5.75.

J.K.M. Sanders, B.K. Hunter: Modern NMR Spectroscopy (Oxford Univ. Press, Oxford 1993)

5.76.

T.D.W. Claridge: High Resolution NMR Techniques in Organic Chemistry (Elsevier, Oxford 1999)

5.77.

Y. Arata: NMR in Proteins (Kyoritsu, Tokyo 1996)

5.78.

S. Weiss: Measuring conformational dynamics of biomolecules by single molecule fluorescence spectroscopy, Nat. Struct. Biol. 7, 724 (2000)CrossRef

5.79.

V. Randle, O. Engler: Introduction to Texture Analysis (Taylor Francis, London 2000)

5.80.

D.C. Joy, D.E. Newbury, D.L. Davidson: Electron channeling patterns in the scanning electron-microscope, J. Appl. Phys. 53, R81 (1982)CrossRef

5.81.

K. Suenaga, T. Tence, C. Mori, C. Colliex, H. Kato, T. Okazaki, H. Shinohara, K. Hirahara, S. Bandow, S. Iijima: Element-selective single atom imaging, Science 290, 2280 (2000)CrossRef

5.82.

N. Hayazawa, A. Tarun, Y. Inouye, S. Kawata: Near-field enhanced Raman spectroscopy using side illumination optics, J. Appl. Phys. 92, 6983 (2002)CrossRef

5.83.

R. Snyder, J. Fiala, H.J. Bunge: Defect and Microstructure Analysis by Diffraction (Oxford Univ. Press, Oxford 1999)

5.84.

B.D. Cullity: Elements of X-ray Diffraction, 2nd edn. (Addison-Wesley, Reading 1978)

5.85.

M.E. Fitzpatrick, A. Lodini: Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radiation (CRC, Boca Raton 2004)

5.86.

K. Hono: Nanoscale microstructural analysis of metallic materials by atom probe field ion microscopy, Prog. Mater. Sci. 47, 621 (2002)CrossRef

5.87.

H. Jinnai, Y. Nishikawa, T. Ikehara, T. Nishi: Emerging technologies for the 3D analysis of polymer structures, Adv. Polym. Sci. 170, 115 (2004)

5.88.

A. Momose: Phase-contrast X-ray imaging based on interferometry, J. Synchrotron Rad. 9, 136 (2002)CrossRef

5.89.

A. Momose: Demonstration of phase-contrast X-ray computed tomography using an X-ray interferometer, Nucl. Instrum. Methods A 352, 622 (1995)CrossRef

Titel: Nanoscopic Architecture and Microstructure
verfasst von: Koji Maeda, Prof.
Hiroshi Mizubayashi
Verlag: Springer Berlin Heidelberg
Buch: Springer Handbook of Metrology and Testing
Print ISBN: 978-3-642-16640-2

Electronic ISBN: 978-3-642-16641-9

Copyright-Jahr: 2011
DOI: https://doi.org/10.1007/978-3-642-16641-9_5

Premium Partner

Marktübersichten

Die im Laufe eines Jahres in der „adhäsion“ veröffentlichten Marktübersichten helfen Anwendern verschiedenster Branchen, sich einen gezielten Überblick über Lieferantenangebote zu verschaffen.

Zur Marktübersicht