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2015 | OriginalPaper | Buchkapitel

8. Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces

verfasst von : Mehmet Z. Baykara

Erschienen in: Surface Science Tools for Nanomaterials Characterization

Verlag: Springer Berlin Heidelberg

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Abstract

Among the large variety of scanning probe microscopy techniques, noncontact atomic force microscopy (NC-AFM) stands out with its capability of atomic-resolution imaging and spectroscopy measurements on conducting, semiconducting as well as insulating sample surfaces. In this chapter, we review the fundamental experimental and instrumental methodology associated with the technique and present key results obtained on different classes of material surfaces. In addition to atomic-resolution imaging, the use of NC-AFM towards the goal of atomic-resolution force spectroscopy is emphasized.

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Binnig G, Rohrer H (1982) Scanning tunneling microscopy. Helv Phys Acta 55(6):726–735

Binnig G, Rohrer H, Gerber C, Weibel E (1983) 7x7 Reconstruction on Si(111) resolved in real space. Phys Rev Lett 50(2):120–123CrossRef

Chen CJ (2007) Introduction to scanning tunneling microscopy. Oxford University Press, OxfordCrossRef

Bonnell DA, Basov DN, Bode M, Diebold U, Kalinin SV, Madhavan V, Novotny L, Salmeron M, Schwarz UD, Weiss PS (2012) Imaging physical phenomena with local probes: from electrons to photons. Rev Mod Phys 84(3):1343CrossRef

Binnig G, Quate CF, Gerber C (1986) Atomic force microscope. Phys Rev Lett 56(9):930–933CrossRef

Albrecht TR, Quate CF (1988) Atomic resolution with the atomic force microscope on conductors and nonconductors. J Vac Sci Technol Vac Surf Films 6(2):271–274CrossRef

Albrecht TR, Akamine S, Carver TE, Quate CF (1990) Microfabrication of cantilever styli for the atomic force microscope. J Vac Sci Technol-Vac Surf Films 8(4):3386–3396CrossRef

Akamine S, Barrett RC, Quate CF (1990) Improved atomic force microscope images using microcantilevers with sharp tips. Appl Phys Lett 57(3):316–318CrossRef

Wolter O, Bayer T, Greschner J (1991) Micromachined silicon sensors for scanning force microscopy. J Vac Sci Technol B 9(2):1353–1357CrossRef

10.

Meyer G, Amer NM (1988) Novel optical approach to atomic force microscopy. Appl Phys Lett 53(12):1045–1047CrossRef

11.

Alexander S, Hellemans L, Marti O, Schneir J, Elings V, Hansma PK, Longmire M, Gurley J (1989) An atomic-resolution atomic-force microscope implemented using an optical-lever. J Appl Phys 65(1):164–167CrossRef

12.

Rugar D, Mamin HJ, Guethner P (1989) Improved fiber-optic interferometer for atomic force microscopy. Appl Phys Lett 55(25):2588–2590CrossRef

13.

Moser A, Hug HJ, Jung T, Schwarz UD, Guntherodt HJ (1993) A miniature fiber optic force microscope scan head. Meas Sci Technol 4(7):769–775CrossRef

14.

Binnig G, Gerber C, Stoll E, Albrecht TR, Quate CF (1987) Atomic resolution with atomic force microscope. Europhys Lett 3(12):1281–1286CrossRef

15.

Meyer G, Amer NM (1990) Optical-beam-deflection atomic force microscopy – the nacl (001) surface. Appl Phys Lett 56(21):2100–2101CrossRef

16.

Marti O, Colchero J, Mlynek J (1993) Friction and forces on an atomic-scale. Nanosour Manip Atoms Under High Fields Temp Appl 235:253–269CrossRef

17.

Meyer G, Amer NM (1990) Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope. Appl Phys Lett 57(20):2089–2091CrossRef

18.

Mate CM, McClelland GM, Erlandsson R, Chiang S (1987) Atomic-scale friction of a tungsten tip on a graphite surface. Phys Rev Lett 59(17):1942–1945CrossRef

19.

Eaton PJ, West P (2010) Atomic force microscopy. Oxford University Press, OxfordCrossRef

20.

Giessibl FJ, Binnig G (1992) Investigation of the (001) cleavage plane of potassium-bromide with an atomic force microscope at 4.2-k in ultra-high vacuum. Ultramicroscopy 42:281–289CrossRef

21.

Ohnesorge F, Binnig G (1993) True atomic-resolution by atomic force microscopy through repulsive and attractive forces. Science 260(5113):1451–1456CrossRef

22.

Baykara MZ, Schwendemann TC, Altman EI, Schwarz UD (2010) Three-dimensional atomic force microscopy – taking surface imaging to the next level. Adv Mater 22(26–27):2838–2853CrossRef

23.

Giessibl FJ (1995) Atomic-resolution of the silicon (111)-(7x7) surface by atomic-force microscopy. Science 267(5194):68–71CrossRef

24.

Sugawara Y, Ohta M, Ueyama H, Morita S (1995) Defect motion on an InP(110) surface observed with noncontact atomic-force microscopy. Science 270(5242):1646–1648CrossRef

25.

Kitamura S, Iwatsuki M (1995) Observation of 7x7 reconstructed structure on the silicon (111) surface using ultrahigh-vacuum noncontact atomic-force microscopy. Jpn J Appl Phys Part 2 Lett 34(1B):L145–L148CrossRef

26.

Ueyama H, Ohta M, Sugawara Y, Morita S (1995) Atomically resolved InP(110) surface observed with noncontact ultrahigh-vacuum atomic-force microscope. Jpn J Appl Phys Part 2 Lett 34(8B):L1086–L1088CrossRef

27.

Morita S, Wiesendanger R, Meyer E (2002) Noncontact atomic force microscopy. Springer, BerlinCrossRef

28.

Morita S, Giessibl FJ, Wiesendanger R (2009) Noncontact atomic force microscopy, vol 2. Springer, BerlinCrossRef

29.

Garcia R, Perez R (2002) Dynamic atomic force microscopy methods. Surf Sci Rep 47(6–8):197–301CrossRef

30.

Giessibl FJ (2003) Advances in atomic force microscopy. Rev Mod Phys 75(3):949–983CrossRef

31.

Hofer WA, Foster AS, Shluger AL (2003) Theories of scanning probe microscopes at the atomic scale. Rev Mod Phys 75(4):1287–1331CrossRef

32.

Barth C, Foster AS, Henry CR, Shluger AL (2011) Recent trends in surface characterization and chemistry with high-resolution scanning force methods. Adv Mater 23(4):477–501CrossRef

33.

Morita S (2013) Atomically resolved force microscopy. J Vac Sci Technol A 31(5):050802CrossRef

34.

Albrecht TR, Grutter P, Horne D, Rugar D (1991) Frequency-modulation detection using high-q cantilevers for enhanced force microscope sensitivity. J Appl Phys 69(2):668–673CrossRef

35.

Yokoyama K, Ochi T, Yoshimoto A, Sugawara Y, Morita S (2000) Atomic resolution imaging on Si(100)2x1 and Si(100)2x1: H surfaces with noncontact atomic force microscopy. Japanese J Appl Phys Part 2 Lett 39(2A):L113–L115CrossRef

36.

Schwarz A, Allers W, Schwarz UD, Wiesendanger R (2000) Dynamic-mode scanning force microscopy study of n-InAs(110)-(1x1) at low temperatures. Phys Rev B 61(4):2837–2845CrossRef

37.

Kitamura S, Iwatsuki M (1996) Observation of silicon surfaces using ultrahigh-vacuum noncontact, atomic force microscopy. Jpn J Appl Phys Part 2-Lett 35(5B):L668–L671CrossRef

38.

Sugawara Y, Uchihashi T, Abe M, Morita S (1999) True atomic resolution imaging of surface structure and surface charge on the GaAs(110). Appl Surf Sci 140(3–4):371–375CrossRef

39.

Sawada D, Sugimoto Y, Morita K, Abe M, Morita S (2010) Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2x8) surface. J Vac Sci Technol B 28(3):C4D1CrossRef

40.

Yokoyama K, Ochi T, Sugawara Y, Morita S (1999) Atomically resolved silver imaging on the Si(111)-(root 3 x root 3)-Ag surface using a noncontact atomic force microscope. Phys Rev Lett 83(24):5023–5026CrossRef

41.

Sweetman A, Gangopadhyay S, Danza R, Berdunov N, Moriarty P (2009) qPlus atomic force microscopy of the Si(100) surface: buckled, split-off, and added dimers. Appl Phys Lett 95(6):063112CrossRef

42.

Sweetman A, Danza R, Gangopadhyay S, Moriarty P (2012) Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias. J Phys Condens Matter 24(8):084009CrossRef

43.

Sweetman A, Stannard A, Sugimoto Y, Abe M, Morita S, Moriarty P (2013) Simultaneous noncontact AFM and STM of Ag:Si(111)-(root 3 x root 3)R30°. Phys Rev B 87(7):075310CrossRef

44.

Li YJ, Nomura H, Ozaki N, Naitoh Y, Kageshima M, Sugawara Y, Hobbs C, Kantorovich L (2006) Origin of p(2 x 1) phase on Si(001) by noncontact atomic force microscopy at 5 k. Phys Rev Lett 96(10):106104CrossRef

45.

Naitoh Y, Ma ZM, Li YJ, Kageshima M, Sugawara Y (2010) Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy. J Vac Sci Technol B 28(6):1210–1214CrossRef

46.

Minobe T, Uchihashi T, Tsukamoto T, Orisaka S, Sugawara Y, Morita S (1999) Distance dependence of noncontact-AFM image contrast on Si(111)root 3 X root 3-Ag structure. Appl Surf Sci 140(3–4):298–303CrossRef

47.

Orisaka S, Minobe T, Uchihashi T, Sugawara Y, Morita S (1999) The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope. Appl Surf Sci 140(3–4):243–246CrossRef

48.

Loppacher C, Bammerlin M, Guggisberg M, Schar S, Bennewitz R, Baratoff A, Meyer E, Guntherodt HJ (2000) Dynamic force microscopy of copper surfaces: atomic resolution and distance dependence of tip-sample interaction and tunneling current. Phys Rev B 62(24):16944–16949CrossRef

49.

Caciuc V, Holscher H, Weiner D, Fuchs H, Schirmeisen A (2008) Noncontact atomic force microscopy imaging mechanism on Ag(110): experiment and first-principles theory. Phys Rev B 77(4):045411CrossRef

50.

Konig T, Simon GH, Rust HP, Heyde M (2009) Atomic resolution on a metal single crystal with dynamic force microscopy. Appl Phys Lett 95(8):083116CrossRef

51.

Allers W, Schwarz A, Schwarz UD, Wiesendanger R (1999) Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: atomic resolution on the xenon(111) surface. Europhys Lett 48(3):276–279CrossRef

52.

Barth C, Reichling M (2001) Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al₂O₃(0001) surface. Nature 414(6859):54–57CrossRef

53.

Reichling M, Barth C (1999) Scanning force imaging of atomic size defects on the CaF₂(111) surface. Phys Rev Lett 83(4):768–771CrossRef

54.

Barth C, Foster AS, Reichling M, Shluger AL (2001) Contrast formation in atomic resolution scanning force microscopy on CaF(2)(111): experiment and theory. J Phys-Condens Matter 13(10):2061–2079CrossRef

55.

Hoffmann R, Lantz MA, Hug HJ, van Schendel PJA, Kappenberger P, Martin S, Baratoff A, Guntherodt HJ (2003) Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy. Phys Rev B 67(8):085402CrossRef

56.

Ruschmeier K, Schirmeisen A, Hoffmann R (2009) Site-specific force-vector field studies of KBr(001) by atomic force microscopy. Nanotechnology 20(26):264013CrossRef

57.

Gritschneder S, Namai Y, Iwasawa Y, Reichling M (2005) Structural features of CeO₂(111) revealed by dynamic SFM. Nanotechnology 16(3):S41–S48CrossRef

58.

Ostendorf F, Torbrugge S, Reichling M (2008) Atomic scale evidence for faceting stabilization of a polar oxide surface. Phys Rev B 77(4):041405CrossRef

59.

Rasmussen MK, Foster AS, Canova FF, Hinnemann B, Helveg S, Meinander K, Besenbacher F, Lauritsen JV (2011) Noncontact atomic force microscopy imaging of atomic structure and cation defects of the polar MgAl₂O₄(100) surface: experiments and first-principles simulations. Phys Rev B 84(23):235419CrossRef

60.

Hoffmann R, Weiner D, Schirmeisen A, Foster AS (2009) Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface. Phys Rev B 80(11):115426CrossRef

61.

Gross L, Mohn F, Moll N, Liljeroth P, Meyer G (2009) The chemical structure of a molecule resolved by atomic force microscopy. Science 325(5944):1110–1114CrossRef

62.

Gross L, Mohn F, Moll N, Meyer G, Ebel R, Abdel-Mageed WM, Jaspars M (2010) Organic structure determination using atomic-resolution scanning probe microscopy. Nat Chem 2(10):821–825CrossRef

63.

Meyer G, Gross L, Mahn F, Repp J (2012) Scanning probe microscopy of atoms and molecules on insulating films: from imaging to molecular manipulation. Chimia 66(1–2):10–15CrossRef

64.

Mohn F, Schuler B, Gross L, Meyer G (2013) Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules. Appl Phys Lett 102(7):073109CrossRef

65.

Gotsmann B, Anczykowski B, Seidel C, Fuchs H (1999) Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves. Appl Surf Sci 140(3–4):314–319CrossRef

66.

Durig U (1999) Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy. Appl Phys Lett 75(3):433–435CrossRef

67.

Giessibl FJ (2001) A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy. Appl Phys Lett 78(1):123–125CrossRef

68.

Sader JE, Jarvis SP (2004) Accurate formulas for interaction force and energy in frequency modulation force spectroscopy. Appl Phys Lett 84(10):1801–1803CrossRef

69.

Giessibl FJ (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Phys Rev B 56(24):16010–16015CrossRef

70.

Durig U (2000) Extracting interaction forces and complementary observables in dynamic probe microscopy. Appl Phys Lett 76(9):1203–1205CrossRef

71.

Holscher H, Schwarz A, Allers W, Schwarz UD, Wiesendanger R (2000) Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes. Phys Rev B 61(19):12678–12681CrossRef

72.

Gotsmann B, Fuchs H (2001) Dynamic force spectroscopy of conservative and dissipative forces in an Al-Au(111) tip-sample system. Phys Rev Lett 86(12):2597–2600CrossRef

73.

Lantz MA, Hug HJ, Hoffmann R, van Schendel PJA, Kappenberger P, Martin S, Baratoff A, Guntherodt HJ (2001) Quantitative measurement of short-range chemical bonding forces. Science 291(5513):2580–2583CrossRef

74.

Hoffmann R, Kantorovich LN, Baratoff A, Hug HJ, Guntherodt HJ (2004) Sublattice identification in scanning force microscopy on alkali halide surfaces. Phys Rev Lett 92(14):146103CrossRef

75.

Abe M, Sugimoto Y, Custance O, Morita S (2005) Room-temperature reproducible spatial force spectroscopy using atom-tracking technique. Appl Phys Lett 87(17):173503CrossRef

76.

Sugimoto Y, Innami S, Abe M, Custance O, Morita S (2007) Dynamic force spectroscopy using cantilever higher flexural modes. Appl Phys Lett 91(9):093120CrossRef

77.

Sugimoto Y, Pou P, Abe M, Jelinek P, Perez R, Morita S, Custance O (2007) Chemical identification of individual surface atoms by atomic force microscopy. Nature 446(7131):64–67CrossRef

78.

Langkat SM, Holscher H, Schwarz A, Wiesendanger R (2003) Determination of site specific interatomic forces between an iron coated tip and the NiO(001) surface by force field spectroscopy. Surf Sci 527(1–3):12–20CrossRef

79.

Schirmeisen A, Weiner D, Fuchs H (2006) Single-atom contact mechanics: from atomic scale energy barrier to mechanical relaxation hysteresis. Phys Rev Lett 97(13):136101CrossRef

80.

Heyde M, Simon GH, Rust HP, Freund HJ (2006) Probing adsorption sites on thin oxide films by dynamic force microscopy. Appl Phys Lett 89(26):263107CrossRef

81.

Ruschmeier K, Schirmeisen A, Hoffmann R (2008) Atomic-scale force-vector fields. Phys Rev Lett 101(15):156102CrossRef

82.

Sugimoto Y, Namikawa T, Miki K, Abe M, Morita S (2008) Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy. Phys Rev B 77(19):195424CrossRef

83.

Ashino M, Obergfell D, Haluska M, Yang SH, Khlobystov AN, Roth S, Wiesendanger R (2008) Atomically resolved mechanical response of individual metallofullerene molecules confined inside carbon nanotubes. Nat Nanotechnol 3(6):337–341CrossRef

84.

Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD (2009) Three-dimensional imaging of short-range chemical forces with picometre resolution. Nat Nanotechnol 4(5):307–310CrossRef

85.

Baykara MZ, Schwendemann TC, Albers BJ, Pilet N, Monig H, Altman EI, Schwarz UD (2012) Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001). Nanotechnology 23(40):405703CrossRef

86.

Baykara MZ, Todorovic M, Monig H, Schwendemann TC, Unverdi O, Rodrigo L, Altman EI, Perez R, Schwarz UD (2013) Atom-specific forces and defect identification on surface-oxidized Cu(100) with combined 3D-AFM and STM measurements. Phys Rev B 87(15):155414CrossRef

87.

Fremy S, Kawai S, Pawlak R, Glatzel T, Baratoff A, Meyer E (2012) Three-dimensional dynamic force spectroscopy measurements on KBr(001): atomic deformations at small tip-sample separations. Nanotechnology 23(5):055401CrossRef

88.

Baykara MZ, Dagdeviren OE, Schwendemann TC, Monig H, Altman EI, Schwarz UD (2012) Probing three-dimensional surface force fields with atomic resolution: measurement strategies, limitations, and artifact reduction. Beilstein J Nanotechnol 3:637–650CrossRef

89.

Pethica JB (1986) Interatomic forces in scanning tunneling microscopy – giant corrugations of the graphite surface – comment. Phys Rev Lett 57(25):3235CrossRef

90.

Martin Y, Williams CC, Wickramasinghe HK (1987) Atomic force microscope force mapping and profiling on a sub 100-a scale. J Appl Phys 61(10):4723–4729CrossRef

91.

Zhong Q, Inniss D, Kjoller K, Elings VB (1993) Fractured polymer silica fiber surface studied by tapping mode atomic-force microscopy. Surf Sci 290(1–2):L688–L692

92.

Castro García R (2010) Amplitude modulation atomic force microscopy. Wiley-VCH, WeinheimCrossRef

93.

Erlandsson R, Olsson L, Martensson P (1996) Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7x7. Phys Rev B 54(12):R8309–R8312CrossRef

94.

Israelachvili JN (2011) Intermolecular and surface forces. Academic, Burlington

95.

Moll N, Gross L, Mohn F, Curioni A, Meyer G (2010) The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips. New J Phys 12(12):125020CrossRef

96.

Fukui K, Onishi H, Iwasawa Y (1997) Atom-resolved image of the TiO₂(110) surface by noncontact atomic force microscopy. Phys Rev Lett 79(21):4202–4205CrossRef

97.

Allers W, Schwarz A, Schwarz UD, Wiesendanger R (1999) Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001). Appl Surf Sci 140(3–4):247–252CrossRef

98.

Giessibl FJ (2000) Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Appl Phys Lett 76(11):1470–1472CrossRef

99.

Giessibl FJ, Hembacher S, Bielefeldt H, Mannhart J (2000) Subatomic features on the silicon (111)-(7x7) surface observed by atomic force microscopy. Science 289(5478):422–425CrossRef

100.

Giessibl FJ, Hembacher S, Herz M, Schiller C, Mannhart J (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology 15(2):S79–S86CrossRef

101.

Albers BJ, Liebmann M, Schwendemann TC, Baykara MZ, Heyde M, Salmeron M, Altman EI, Schwarz UD (2008) Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. Rev Sci Instrum 79(3):033704CrossRef

102.

Giessibl FJ, Bielefeldt H, Hembacher S, Mannhart J (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Appl Surf Sci 140(3–4):352–357CrossRef

103.

Perez R, Payne MC, Stich I, Terakura K (1997) Role of covalent tip-surface interactions in noncontact atomic force microscopy on reactive surfaces. Phys Rev Lett 78(4):678–681CrossRef

104.

Perez R, Stich I, Payne MC, Terakura K (1998) Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111). Phys Rev B 58(16):10835–10849CrossRef

105.

Bennewitz R, Bammerlin M, Guggisberg M, Loppacher C, Baratoff A, Meyer E, Guntherodt HJ (1999) Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics. Surf Interface Anal 27(5–6):462–466CrossRef

106.

Guggisberg M, Bammerlin M, Loppacher C, Pfeiffer O, Abdurixit A, Barwich V, Bennewitz R, Baratoff A, Meyer E, Guntherodt HJ (2000) Separation of interactions by noncontact force microscopy. Phys Rev B 61(16):11151–11155CrossRef

107.

Kawai S, Glatzel T, Koch S, Baratoff A, Meyer E (2011) Interaction-induced atomic displacements revealed by drift-corrected dynamic force spectroscopy. Phys Rev B 83(3):035421CrossRef

108.

Sugimoto Y, Ueda K, Abe M, Morita S (2012) Three-dimensional scanning force/tunneling spectroscopy at room temperature. J Phys Condens Matter 24(8):084008CrossRef

109.

Braun DA, Weiner D, Such B, Fuchs H, Schirmeisen A (2009) Submolecular features of epitaxially grown PTCDA on Cu(111) analyzed by force field spectroscopy. Nanotechnology 20(26):264004CrossRef

110.

Mohn F, Gross L, Meyer G (2011) Measuring the short-range force field above a single molecule with atomic resolution. Appl Phys Lett 99(5):053106CrossRef

111.

Such B, Glatzel T, Kawai S, Koch S, Meyer E (2010) Three-dimensional force spectroscopy of KBr(001) by tuning fork-based cryogenic noncontact atomic force microscopy. J Vac Sci Technol B 28(3):C4B1CrossRef

112.

Such B, Glatzel T, Kawai S, Meyer E, Turansky R, Brndiar J, Stich I (2012) Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field. Nanotechnology 23(4):045705CrossRef

113.

Abe M, Sugimoto Y, Custance O, Morita S (2005) Atom tracking for reproducible force spectroscopy at room temperature with non-contact atomic force microscopy. Nanotechnology 16(12):3029–3034CrossRef

114.

Abe M, Sugimoto Y, Namikawa T, Morita K, Oyabu N, Morita S (2007) Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy. Appl Phys Lett 90(20):203103CrossRef

115.

Enevoldsen GH, Pinto HP, Foster AS, Jensen MCR, Kuhnle A, Reichling M, Hofer WA, Lauritsen JV, Besenbacher F (2008) Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO(2)(110) surface. Phys Rev B 78(4):045416CrossRef

116.

Oyabu N, Pou P, Sugimoto Y, Jelinek P, Abe M, Morita S, Perez R, Custance O (2006) Single atomic contact adhesion and dissipation in dynamic force microscopy. Phys Rev Lett 96(10):106101CrossRef

117.

Pou P, Ghasemi SA, Jelinek P, Lenosky T, Goedecker S, Perez R (2009) Structure and stability of semiconductor tip apexes for atomic force microscopy. Nanotechnology 20(26):264015CrossRef

118.

Bechstein R, Gonzalez C, Schutte J, Jelinek P, Perez R, Kuhnle A (2009) ‘All-inclusive’ imaging of the rutile TiO₂(110) surface using NC-AFM. Nanotechnology 20(50):505703CrossRef

119.

Arai T, Gritschneder S, Troger L, Reichling M (2010) Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips. J Vac Sci Technol B 28(6):1279–1283CrossRef

120.

Lauritsen JV, Foster AS, Olesen GH, Christensen MC, Kuhnle A, Helveg S, Rostrup-Nielsen JR, Clausen BS, Reichling M, Besenbacher F (2006) Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy. Nanotechnology 17(14):3436–3441CrossRef

121.

Enevoldsen GH, Foster AS, Christensen MC, Lauritsen JV, Besenbacher F (2007) Noncontact atomic force microscopy studies of vacancies and hydroxyls of TiO(2)(110): experiments and atomistic simulations. Phys Rev B 76(20):205415CrossRef

122.

Uluutku B, Baykara MZ (2013) Effect of lateral tip stiffness on atomic-resolution force field spectroscopy. J Vac Sci Technol B 31(4):041801CrossRef

123.

Sun ZX, Boneschanscher MP, Swart I, Vanmaekelbergh D, Liljeroth P (2011) Quantitative atomic force microscopy with carbon monoxide terminated tips. Phys Rev Lett 106(4):046104CrossRef

124.

Schwarz A, Schwarz UD, Langkat S, Holscher H, Allers W, Wiesendanger R (2002) Dynamic force microscopy with atomic resolution at low temperatures. Appl Surf Sci 188(3–4):245–251CrossRef

125.

Rahe P, Schutte J, Schniederberend W, Reichling M, Abe M, Sugimoto Y, Kuhnle A (2011) Flexible drift-compensation system for precise 3D force mapping in severe drift environments. Rev Sci Instrum 82(6):063704CrossRef

126.

Fukuma T, Ichii T, Kobayashi K, Yamada H, Matsushige K (2005) True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments. Appl Phys Lett 86(3):034103CrossRef

127.

Fukuma T, Kobayashi K, Matsushige K, Yamada H (2005) True atomic resolution in liquid by frequency-modulation atomic force microscopy. Appl Phys Lett 87(3):034101CrossRef

128.

Fukuma T, Ueda Y, Yoshioka S, Asakawa H (2010) Atomic-scale distribution of water molecules at the mica-water interface visualized by three-dimensional scanning force microscopy. Phys Rev Lett 104(1):016101CrossRef

129.

Herruzo ET, Asakawa H, Fukuma T, Garcia R (2013) Three-dimensional quantitative force maps in liquid with 10 piconewton, angstrom and sub-minute resolutions. Nanoscale 5(7):2678–2685CrossRef

130.

Asakawa H, Fukuma T (2009) Spurious-free cantilever excitation in liquid by piezoactuator with flexure drive mechanism. Rev Sci Instrum 80(10):103703CrossRef

131.

Asakawa H, Fukuma T (2009) The molecular-scale arrangement and mechanical strength of phospholipid/cholesterol mixed bilayers investigated by frequency modulation atomic force microscopy in liquid. Nanotechnology 20(26):264008CrossRef

132.

Mitani Y, Kubo M, Muramoto K, Fukuma T (2009) Wideband digital frequency detector with subtraction-based phase comparator for frequency modulation atomic force microscopy. Rev Sci Instrum 80(8):083705CrossRef

133.

Fukuma T (2009) Wideband low-noise optical beam deflection sensor with photothermal excitation for liquid-environment atomic force microscopy. Rev Sci Instrum 80(2):023707CrossRef

134.

Guthner P (1996) Simultaneous imaging of Si(111) 7x7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode. J Vac Sci Technol B 14(4):2428–2431CrossRef

135.

Luthi R, Meyer E, Bammerlin M, Baratoff A, Lehmann T, Howald L, Gerber C, Guntherodt HJ (1996) Atomic resolution in dynamic force microscopy across steps on Si(111)7x7. Z Physik B-Condens Matter 100(2):165–167CrossRef

136.

Nakagiri N, Suzuki M, Okiguchi K, Sugimura H (1997) Site discrimination of adatoms in Si(111)-7x7 by noncontact atomic force microscopy. Surf Sci 373(1):L329–L332CrossRef

137.

Sawada D, Sugimoto Y, Abe M, Morita S (2010) Observation of subsurface atoms of the si(111)-(7x7) surface by atomic force microscopy. Appl Phys Express 3(11):116602CrossRef

138.

Sugimoto Y, Nakajima Y, Sawada D, Morita K, Abe M, Morita S (2010) Simultaneous AFM and STM measurements on the Si(111)-(7x7) surface. Phys Rev B 81(24):245322CrossRef

139.

Uozumi T, Tomiyoshi Y, Suehira N, Sugawara Y, Morita S (2002) Observation of Si(100) surface with noncontact atomic force microscope at 5 K. Appl Surf Sci 188(3–4):279–284CrossRef

140.

Sweetman A, Jarvis S, Danza R, Bamidele J, Gangopadhyay S, Shaw GA, Kantorovich L, Moriarty P (2011) Toggling bistable atoms via mechanical switching of bond angle. Phys Rev Lett 106(13):136101CrossRef

141.

Sweetman A, Jarvis S, Danza R, Bamidele J, Kantorovich L, Moriarty P (2011) Manipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: role of defects and dynamics in the mechanical switching of atoms. Phys Rev B 84(8):085426CrossRef

142.

Sweetman A, Jarvis S, Danza R, Moriarty P (2012) Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: probing the probe. Beilstein J Nanotechnol 3:25–32CrossRef

143.

Naitoh Y, Li YJ, Nomura H, Kageshima M, Sugawara Y (2010) Effect of surface stress around the sa step of Si(001) on the dimer structure determined by noncontact atomic force microscopy at 5 K. J Physical Soc Japan 79(1):013601CrossRef

144.

Sugimoto Y, Abe M, Yoshimoto K, Custance O, Yi I, Morita S (2005) Non-contact atomic force microscopy study of the Sn/Si(111) mosaic phase. Appl Surf Sci 241(1–2):23–27CrossRef

145.

Yi I, Sugimoto Y, Nishi R, Morita S (2006) Study on topographic images of Sn/Si(111)-(root 3 x root 3)R30° surface by non-contact AFM. Surf Sci 600(17):3382–3387CrossRef

146.

Yi I, Nishi R, Sugimoto Y, Morita S (2007) Non-contact AFM observation of the (root 3x root 3) to (3x3) phase transition on Sn/Ge(111) and Sn/Si(111) surfaces. Appl Surf Sci 253(6):3072–3076CrossRef

147.

Sugimoto Y, Pou P, Custance O, Jelinek P, Morita S, Perez R, Abe M (2006) Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: the case of the alpha-Sn/Si(111)-(root 3x root 3)R30° surface. Phys Rev B 73(20):205329CrossRef

148.

Abe M, Sugimoto Y, Morita S (2005) Imaging the restatom of the Ge(111)-c(2x8) surface with noncontact atomic force microscopy at room temperature. Nanotechnology 16(3):S68–S72CrossRef

149.

Schwarz A, Allers W, Schwarz UD, Wiesendanger R (2000) Detection of doping atom distributions and individual dopants in InAs(110) by dynamic-mode scanning force microscopy in ultrahigh vacuum. Phys Rev B 62(20):13617–13622CrossRef

150.

Henrich VE, Cox PA (1994) The surface science of metal oxides. Cambridge University Press, Cambridge

151.

Diebold U (2003) The surface science of titanium dioxide. Surf Sci Rep 48(5–8):53–229CrossRef

152.

Freund HJ, Pacchioni G (2008) Oxide ultra-thin films on metals: new materials for the design of supported metal catalysts. Chem Soc Rev 37(10):2224–2242CrossRef

153.

Raza H, Pang CL, Haycock SA, Thornton G (1999) Non-contact atomic force microscopy imaging of TiO₂(100) surfaces. Appl Surf Sci 140(3–4):271–275CrossRef

154.

Enevoldsen GH, Pinto HP, Foster AS, Jensen MCR, Hofer WA, Hammer B, Lauritsen JV, Besenbacher F (2009) Imaging of the hydrogen subsurface site in rutile TiO(2). Phys Rev Lett 102(13):136103CrossRef

155.

Yurtsever A, Sugimoto Y, Abe M, Morita S (2010) NC-AFM imaging of the TiO(2)(110)-(1x1) surface at low temperature. Nanotechnology 21(16):165702CrossRef

156.

Yurtsever A, Fernandez-Torre D, Gonzalez C, Jelinek P, Pou P, Sugimoto Y, Abe M, Perez R, Morita S (2012) Understanding image contrast formation in TiO₂ with force spectroscopy. Phys Rev B 85(12):125416CrossRef

157.

Pang CL, Raza H, Haycock SA, Thornton G (2002) Noncontact atomic force microscopy imaging of ultrathin Al₂O₃ on NiAl(110). Phys Rev B 65(20):201401CrossRef

158.

Wang J, Howard A, Egdell RG, Pethica JB, Foord JS (2002) Arrangement of rotational domains of the (root 31 x root 31) R +/− 9° reconstruction of Al₂O₃(0001) revealed by non-contact AFM. Surf Sci 515(2–3):337–343CrossRef

159.

Simon GH, Konig T, Nilius M, Rust HP, Heyde M, Freund HJ (2008) Atomically resolved force microscopy images of complex surface unit cells: ultrathin alumina film on NiAl(110). Phys Rev B 78(11):113401CrossRef

160.

Simon GH, Konig T, Rust HP, Heyde M, Freund HJ (2009) Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy. New J Phys 11(9):093009CrossRef

161.

Lauritsen JV, Jensen MCR, Venkataramani K, Hinnemann B, Helveg S, Clausen BS, Besenbacher F (2009) Atomic-scale structure and stability of the root 31 x root 31R9° surface of Al₂O₃(0001). Phys Rev Lett 103(7):076103CrossRef

162.

Heyde M, Simon GH, Lichtenstein L (2013) Resolving oxide surfaces – from point and line defects to complex network structures. Phys Status Solidi B-Basic Solid State Phys 250(5):895–921CrossRef

163.

Simon GH, Konig T, Heinke L, Lichtenstein L, Heyde M, Freund HJ (2011) Atomic structure of surface defects in alumina studied by dynamic force microscopy: strain-relief-, translation- and reflection-related boundaries, including their junctions. New J Phys 13(12):123028CrossRef

164.

Fukui K, Namai Y, Iwasawa Y (2002) Imaging of surface oxygen atoms and their defect structures on CeO₂(111) by noncontact atomic force microscopy. Appl Surf Sci 188(3–4):252–256CrossRef

165.

Namai Y, Fukui KI, Iwasawa Y (2003) Atom-resolved noncontact atomic force microscopic and scanning tunneling microscopic observations of the structure and dynamic behavior of CeO₂(111) surfaces. Catal Today 85(2–4):79–91CrossRef

166.

Namai Y, Fukui K, Iwasawa Y (2003) Atom-resolved noncontact atomic force microscopic observations of CeO₂(111) surfaces with different oxidation states: surface structure and behavior of surface oxygen atoms. J Phys Chem B 107(42):11666–11673CrossRef

167.

Gritschneder S, Reichling M (2007) Structural elements of CeO₂(111) surfaces. Nanotechnology 18(4):044024CrossRef

168.

Gritschneder S, Reichling M (2008) Atomic resolution imaging on CeO₂(111) with hydroxylated probes. J Phys Chem C 112(6):2045–2049CrossRef

169.

Pieper HH, Derks C, Zoellner MH, Olbrich R, Troger L, Schroeder T, Neumann M, Reichling M (2012) Morphology and nanostructure of CeO₂(111) surfaces of single crystals and Si(111) supported ceria films. Phys Chem Chem Phys 14(44):15361–15368CrossRef

170.

Hosoi H, Sueoka K, Hayakawa K, Mukasa K (2000) Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM. Appl Surf Sci 157(4):218–221CrossRef

171.

Allers W, Langkat S, Wiesendanger R (2001) Dynamic low-temperature scanning force microscopy on nickel oxide (001). Appl Phys Mater Sci Process 72:S27–S30CrossRef

172.

Kaiser U, Schwarz A, Wiesendanger R (2007) Magnetic exchange force microscopy with atomic resolution. Nature 446(7135):522–525CrossRef

173.

Schmid M, Mannhart J, Giessibl FJ (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy. Phys Rev B 77(4):045402CrossRef

174.

Kaiser U, Schwarz A, Wiesendanger R (2008) Evaluating local properties of magnetic tips utilizing an antiferromagnetic surface. Phys Rev B 78(10):104418CrossRef

175.

Barth C, Henry CR (2003) Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopy. Phys Rev Lett 91(19):196102CrossRef

176.

Heyde M, Sterrer M, Rust HP, Freund HJ (2005) Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum. Appl Phys Lett 87(8):083104CrossRef

177.

Heyde M, Sterrer M, Rust HP, Freund HJ (2006) Frequency modulated atomic force microscopy on MgO(001) thin films: interpretation of atomic image resolution and distance dependence of tip-sample interaction. Nanotechnology 17(7):S101–S106CrossRef

178.

Torbrugge S, Ostendorf F, Reichling M (2009) Stabilization of zinc-terminated ZnO(0001) by a modified surface stoichiometry. J Phys Chem C 113(12):4909–4914CrossRef

179.

Suzuki S, Ohminami Y, Tsutsumi T, Shoaib MM, Ichikawa M, Asakura K (2003) The first observation of an atomic scale noncontact AFM image of MoO₃(010). Chem Lett 32(12):1098–1099CrossRef

180.

Rasmussen MK, Foster AS, Hinnemann B, Canova FF, Helveg S, Meinander K, Martin NM, Knudsen J, Vlad A, Lundgren E, Stierle A, Besenbacher F, Lauritsen JV (2011) Stable cation inversion at the MgAl₂O₄(100) surface. Phys Rev Lett 107(3):036102CrossRef

181.

Rasmussen MK, Meinander K, Besenbacher F, Lauritsen JV (2012) Noncontact atomic force microscopy study of the spinel MgAl₂O₄(111) surface. Beilstein J Nanotechnol 3:192–197CrossRef

182.

Kishimoto S, Kageshima M, Naitoh Y, Li YJ, Sugawara Y (2008) Study of oxidized Cu(110) surface using noncontact atomic force microscopy. Surf Sci 602(13):2175–2182CrossRef

183.

Lauritsen JV, Reichling M (2010) Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces. J Phys Condens Matter 22(26):263001CrossRef

184.

Irie H, Sunada K, Hashimoto K (2004) Recent developments in TiO₂ photocatalysis: novel applications to interior ecology materials and energy saving systems. Electrochemistry 72(12):807–812

185.

Onishi H, Iwasawa Y (1994) Reconstruction of TiO₂(110) surface – STM study with atomic-scale resolution. Surf Sci 313(1–2):L783–L789CrossRef

186.

Wendt S, Matthiesen J, Schaub R, Vestergaard EK, Laegsgaard E, Besenbacher F, Hammer B (2006) Formation and splitting of paired hydroxyl groups on reduced TiO₂(110). Phys Rev Lett 96(6):066107CrossRef

187.

Schaub R, Thostrup P, Lopez N, Laegsgaard E, Stensgaard I, Norskov JK, Besenbacher F (2001) Oxygen vacancies as active sites for water dissociation on rutile TiO(2)(110). Phys Rev Lett 87(26):266104CrossRef

188.

Wendt S, Schaub R, Matthiesen J, Vestergaard EK, Wahlstrom E, Rasmussen MD, Thostrup P, Molina LM, Laegsgaard E, Stensgaard I, Hammer B, Besenbacher F (2005) Oxygen vacancies on TiO₂(110) and their interaction with H₂O and O-2: a combined high-resolution STM and DFT study. Surf Sci 598(1–3):226–245CrossRef

189.

Foster AS, Pakarinen OH, Airaksinen JM, Gale JD, Nieminen RM (2003) Simulating atomic force microscopy imaging of the ideal and defected TiO₂(110) surface. Phys Rev B 68(19):195410CrossRef

190.

Pinto HP, Enevoldsen GH, Besenbacher F, Lauritsen JV, Foster AS (2009) The role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO(2)(110) surface. Nanotechnology 20(26):264020CrossRef

191.

Bammerlin M, Lüthi R, Meyer E, Baratoff A, Lü J, Guggisberg M, Gerber C, Howald L, Güntherodt HJ (1997) True atomic resolution on the surface of an insulator via ultrahigh vacuum dynamic force microscopy. Probe Microsc 1:3

192.

Foster AS, Barth C, Shluger AL, Reichling M (2001) Unambiguous interpretation of atomically resolved force microscopy images of an insulator. Phys Rev Lett 86(11):2373–2376CrossRef

193.

Foster AS, Barth C, Shluger AL, Nieminen RM, Reichling M (2002) Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy: CaF₂(111) as a reference surface. Phys Rev B 66(23):235417CrossRef

194.

Barth C, Reichling M (2000) Resolving ions and vacancies at step edges on insulating surfaces. Surf Sci 470(1–2):L99–L103CrossRef

195.

Bennewitz R, Schar S, Barwich V, Pfeiffer O, Meyer E, Krok F, Such B, Kolodzej J, Szymonski M (2001) Atomic-resolution images of radiation damage in KBr. Surf Sci 474(1–3):L197–L202CrossRef

196.

Bennewitz R, Pfeiffer O, Schar S, Barwich V, Meyer E, Kantorovich LN (2002) Atomic corrugation in nc-AFM of alkali halides. Appl Surf Sci 188(3–4):232–237CrossRef

197.

Fujii S, Fujihira M (2007) Atomic contrast on a point defect on CaF₂(111) imaged by non-contact atomic force microscopy. Nanotechnology 18(8):084011CrossRef

198.

Giessibl FJ, Reichling M (2005) Investigating atomic details of the CaF₂(111) surface with a qPlus sensor. Nanotechnology 16(3):S118–S124CrossRef

199.

Hirth S, Ostendorf F, Reichling M (2006) Lateral manipulation of atomic size defects on the CaF₂(111) surface. Nanotechnology 17(7):S148–S154CrossRef

200.

Hoffmann R, Lantz MA, Hug HJ, van Schendel PJA, Kappenberger P, Martin S, Baratoff A, Guntherodt HJ (2002) Atomic resolution imaging and force versus distance measurements on KBr(001) using low temperature scanning force microscopy. Appl Surf Sci 188(3–4):238–244CrossRef

201.

Bammerlin M, Luthi R, Meyer E, Baratoff A, Lu J, Guggisberg M, Loppacher C, Gerber C, Guntherodt HJ (1998) Dynamic SFM with true atomic resolution on alkali halide surfaces. Appl Phys Mater Sci Process 66:S293–S294CrossRef

202.

Barth C, Henry CR (2008) Imaging Suzuki precipitates on NaCl: Mg(2+)(001) by scanning force microscopy. Phys Rev Lett 100(9):096101CrossRef

203.

Barth C, Henry CR (2009) NaCl(001) surfaces nanostructured by Suzuki precipitates: a scanning force microscopy study. New J Phys 11(4):043003CrossRef

204.

Foster AS, Barth C, Henry CR (2009) Chemical identification of ions in doped NaCl by scanning force microscopy. Phys Rev Lett 102(25):256103CrossRef

205.

Bennewitz R, Foster AS, Kantorovich LN, Bammerlin M, Loppacher C, Schar S, Guggisberg M, Meyer E, Shluger AL (2000) Atomically resolved edges and kinks of NaCl islands on Cu(111): experiment and theory. Phys Rev B 62(3):2074–2084CrossRef

206.

Klust A, Ohta T, Bostwick AA, Yu QM, Ohuchi FS, Olmstead MA (2004) Atomically resolved imaging of a CaF bilayer on Si(111): subsurface atoms and the image contrast in scanning force microscopy. Phys Rev B 69(3):035405CrossRef

207.

Filleter T, Paul W, Bennewitz R (2008) Atomic structure and friction of ultrathin films of KBr on Cu(100). Phys Rev B 77(3):035430CrossRef

208.

Holscher H, Allers W, Schwarz UD, Schwarz A, Wiesendanger R (2000) Interpretation of “true atomic resolution” images of graphite (0001) in noncontact atomic force microscopy. Phys Rev B 62(11):6967–6970CrossRef

209.

Hembacher S, Giessibl FJ, Mannhart J, Quate CF (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proc Natl Acad Sci U S A 100(22):12539–12542CrossRef

210.

Kawai S, Kawakatsu H (2009) Surface-relaxation-induced giant corrugation on graphite (0001). Phys Rev B 79(11):115440CrossRef

211.

Ashino M, Schwarz A, Behnke T, Wiesendanger R (2004) Atomic-resolution dynamic force microscopy and spectroscopy of a single-walled carbon nanotube: characterization of interatomic van der Waals forces. Phys Rev Lett 93(13):136101CrossRef

212.

Loffler D, Uhlrich JJ, Baron M, Yang B, Yu X, Lichtenstein L, Heinke L, Buchner C, Heyde M, Shaikhutdinov S, Freund HJ, Wlodarczyk R, Sierka M, Sauer J (2010) Growth and structure of crystalline silica sheet on Ru(0001). Phys Rev Lett 105(14):146104CrossRef

213.

Lichtenstein L, Heyde M, Freund HJ (2012) Atomic arrangement in two-dimensional silica: from crystalline to vitreous structures. J Phys Chem C 116(38):20426–20432CrossRef

214.

Majzik Z, Tchalala MR, Svec M, Hapala P, Enriquez H, Kara A, Mayne AJ, Dujardin G, Jelinek P, Oughaddou H (2013) Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface. J Phys Condens Matter 25(22):225301CrossRef

215.

Sun ZX, Hamalainen SK, Sainio J, Lahtinen J, Vanmaekelbergh D, Liljeroth P (2011) Topographic and electronic contrast of the graphene moire on Ir(111) probed by scanning tunneling microscopy and noncontact atomic force microscopy. Phys Rev B 83(8):081415CrossRef

216.

Boneschanscher MP, van der Lit J, Sun ZX, Swart I, Liljeroth P, Vanmaekelbergh D (2012) Quantitative atomic resolution force imaging on epitaxial graphene with reactive and nonreactive AFM probes. ACS Nano 6(11):10216–10221CrossRef

217.

Hamalainen SK, Boneschanscher MP, Jacobse PH, Swart I, Pussi K, Moritz W, Lahtinen J, Liljeroth P, Sainio J (2013) Structure and local variations of the graphene moire on Ir(111). Phys Rev B 88(20):6CrossRef

218.

Dedkov Y, Voloshina E (2014) Multichannel scanning probe microscopy and spectroscopy of graphene moire structures. Phys Chem Chem Phys 16(9):3894–3908CrossRef

219.

Fukui K, Onishi H, Iwasawa Y (1997) Imaging of individual formate ions adsorbed on TiO₂(110) surface by non-contact atomic force microscopy. Chem Phys Lett 280(3–4):296–301CrossRef

220.

Rahe P, Nimmrich M, Nefedov A, Naboka M, Woll C, Kuhnle A (2009) Transition of molecule orientation during adsorption of terephthalic acid on rutile TiO₂(110). J Phys Chem C 113(40):17471–17478CrossRef

221.

Schutte J, Bechstein R, Rahe P, Rohlfing M, Kuhnle A, Langhals H (2009) Imaging perylene derivatives on rutile TiO₂(110) by noncontact atomic force microscopy. Phys Rev B 79(4):045428CrossRef

222.

Loske F, Bechstein R, Schutte J, Ostendorf F, Reichling M, Kuhnle A (2009) Growth of ordered C₆₀ islands on TiO₂(110). Nanotechnology 20(6):065606CrossRef

223.

Fremy S, Schwarz A, Lammle K, Prosenc M, Wiesendanger R (2009) The monomer-to-dimer transition and bimodal growth of Co-salen on NaCl(001): a high resolution atomic force microscopy study. Nanotechnology 20(40):405608CrossRef

224.

Lammle K, Trevethan T, Schwarz A, Watkins M, Shluger A, Wiesendanger R (2010) Unambiguous determination of the adsorption geometry of a metal-organic complex on a bulk insulator. Nano Lett 10(8):2965–2971CrossRef

225.

Pawlak R, Kawai S, Fremy S, Glatzel T, Meyer E (2011) Atomic-scale mechanical properties of orientated C(60) molecules revealed by noncontact atomic force microscopy. ACS Nano 5(8):6349–6354CrossRef

226.

Pawlak R, Kawai S, Fremy S, Glatzel T, Meyer E (2012) High-resolution imaging of C₆₀ molecules using tuning-fork-based non-contact atomic force microscopy. J Phys Condens Matter 24(8):084005CrossRef

227.

Such B, Trevethan T, Glatzel T, Kawai S, Zimmerli L, Meyer E, Shluger AL, Amijs CHM, de Mendoza P, Echavarren AM (2010) Functionalized truxenes: adsorption and diffusion of single molecules on the KBr(001) surface. ACS Nano 4(6):3429–3439CrossRef

228.

Pawlak R, Fremy S, Kawai S, Glatzel T, Fang HJ, Fendt LA, Diederich F, Meyer E (2012) Directed rotations of single porphyrin molecules controlled by localized force spectroscopy. ACS Nano 6(7):6318–6324CrossRef

229.

Sasahara A, Uetsuka H, Onishi H (2001) NC-AFM topography of HCOO and CH(3)COO molecules co-adsorbed on TiO(2)(110). Appl Phys Mater Sci Process 72:S101–S103CrossRef

230.

Gritschneder S, Iwasawa Y, Reichling M (2007) Strong adhesion of water to CeO₂(111). Nanotechnology 18(4):044025CrossRef

231.

Burke SA, Mativetsky JM, Fostner S, Grutter P (2007) C₆₀ on alkali halides: epitaxy and morphology studied by noncontact AFM. Phys Rev B 76(3):035419CrossRef

232.

Burke SA, Ledue JM, Topple JM, Fostner S, Grutter P (2009) Relating the functional properties of an organic semiconductor to molecular structure by nc-AFM. Adv Mater 21(20):2029–2033CrossRef

233.

Gotsmann B, Seidel C, Anczykowski B, Fuchs H (1999) Conservative and dissipative tip-sample interaction forces probed with dynamic AFM. Phys Rev B 60(15):11051–11061CrossRef

234.

Lantz MA, Hoffmann R, Foster AS, Baratoff A, Hug HJ, Hidber HR, Guntherodt HJ (2006) Site-specific force-distance characteristics on NaCl(001): measurements versus atomistic simulations. Phys Rev B 74(24):245426CrossRef

235.

Hoffmann R, Barth C, Foster AS, Shluger AL, Hug HJ, Guntherodt HJ, Nieminen RM, Reichling M (2005) Measuring site-specific cluster-surface bond formation. J Am Chem Soc 127(50):17863–17866CrossRef

236.

Hembacher S, Giessibl FJ, Mannhart J, Quate CF (2005) Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite. Phys Rev Lett 94(5):056101CrossRef

237.

Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD (2009) Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions. Nanotechnology 20(26):264002CrossRef

238.

Holscher H, Langkat SM, Schwarz A, Wiesendanger R (2002) Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy. Appl Phys Lett 81(23):4428–4430CrossRef

239.

Ashino M, Schwarz A, Holscher H, Schwarz UD, Wiesendanger R (2005) Interpretation of the atomic scale contrast obtained on graphite and single-walled carbon nanotubes in the dynamic mode of atomic force microscopy. Nanotechnology 16(3):S134–S137CrossRef

240.

Schwarz A, Holscher H, Langkat SM, Wiesendanger R (2003) Three-dimensional force field spectroscopy. AIP Conf Proc 696:68–78CrossRef

241.

Bhushan B (2002) Introduction to tribology. Wiley, New York

242.

Bhushan B (2005) Nanotribology and nanomechanics: an introduction. Springer, BerlinCrossRef

243.

Giessibl FJ, Herz M, Mannhart J (2002) Friction traced to the single atom. Proc Natl Acad Sci U S A 99(19):12006–12010CrossRef

244.

Atabak M, Unverdi O, Ozer HO, Oral A (2009) Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement. Appl Surf Sci 256(5):1299–1303CrossRef

245.

Weymouth AJ, Meuer D, Mutombo P, Wutscher T, Ondracek M, Jelinek P, Giessibl FJ (2013) Atomic structure affects the directional dependence of friction. Phys Rev Lett 111(12):126103CrossRef

246.

Kawai S, Glatzel T, Koch S, Such B, Baratoff A, Meyer E (2010) Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements. Phys Rev B 81(8):085420CrossRef

247.

Ternes M, Lutz CP, Hirjibehedin CF, Giessibl FJ, Heinrich AJ (2008) The force needed to move an atom on a surface. Science 319(5866):1066–1069CrossRef

248.

Weymouth AJ, Hofmann T, Giessibl FJ (2013) Quantifying molecular stiffness and interaction with lateral force microscopy. Science 343:1120–1122CrossRef

249.

Welker J, Giessibl FJ (2012) Revealing the angular symmetry of chemical bonds by atomic force microscopy. Science 336(6080):444–449CrossRef

250.

Kimura K, Ido S, Oyabu N, Kobayashi K, Hirata Y, Imai T, Yamada H (2010) Visualizing water molecule distribution by atomic force microscopy. J Chem Phys 132(19):194705CrossRef

251.

Asakawa H, Yoshioka S, Nishimura K, Fukuma T (2012) Spatial distribution of lipid headgroups and water molecules at membrane/water interfaces visualized by three-dimensional scanning force microscopy. ACS Nano 6(10):9013–9020CrossRef

252.

Sugimoto Y, Jelinek P, Pou P, Abe M, Morita S, Perez R, Custance O (2007) Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy. Phys Rev Lett 98(10):106104CrossRef

253.

Sugimoto Y, Pou P, Custance O, Jelinek P, Abe M, Perez R, Morita S (2008) Complex patterning by vertical interchange atom manipulation using atomic force microscopy. Science 322(5900):413–417CrossRef

Titel: Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
verfasst von: Mehmet Z. Baykara
Verlag: Springer Berlin Heidelberg
Buch: Surface Science Tools for Nanomaterials Characterization
Print ISBN: 978-3-662-44550-1

Electronic ISBN: 978-3-662-44551-8

Copyright-Jahr: 2015
DOI: https://doi.org/10.1007/978-3-662-44551-8_8

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