2009 | OriginalPaper | Buchkapitel
Numerical Simulation of Charge Transport in Semiconductor Devices Using Mixed Finite Elements
verfasst von : Riccardo Sacco
Erschienen in: Mixed Finite Element Technologies
Verlag: Springer Vienna
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by (Link öffnet in neuem Fenster)
In this lecture, we present the basic mathematical and numerical tools for semiconductor device simulation using the Drift-Diffusion model. The Gummel’s decoupled fixed point map is first reviewed, and then the dual-mixed Formulation of the diffusion-advection-reaction (DAR) differential problems resulting from decoupling is considered. The Galerkin finite element discretization of the weak mixed form is discussed, with a proper treatment of the flux mass matrix that leads to a mixed finite volume approximation of the DAR equation. Several numerical examples are included to validate the proposed procedure.