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2012 | OriginalPaper | Buchkapitel

40. Numerical Simulation of New Radiator in Electronic Device

verfasst von : Shu Xu

Erschienen in: Electrical, Information Engineering and Mechatronics 2011

Verlag: Springer London

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Abstract

An experimental apparatus is set up to test the heat transfer performance of the new radiator, which mainly includes vacuum-pumping and Central Processing Unit tunnel system, heating system and measurement system. The heat dissipation of the Central Processing Unit chip is imitated by the copper bar which is heated by thermal resistance wire. The experimental results showed that the temperature of the Central Processing Unit chip decreased with growth of cooling air velocity, but the temperature drop tendency became gentle when it continued to increase. Higher heat dissipation power resulted in higher CPU chip temperature, but oversized heat flux density made the phase changing process worse.

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Metadaten
Titel
Numerical Simulation of New Radiator in Electronic Device
verfasst von
Shu Xu
Copyright-Jahr
2012
Verlag
Springer London
DOI
https://doi.org/10.1007/978-1-4471-2467-2_40

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