Ausgabe 12/2003
Inhalt (8 Artikel)
Improved SPR technique for determination of the thickness and optical constants of thin metal films
Y. Ding, Z.Q. Cao, Q.S. Shen
Micro-electroluminescence spectroscopy investigation of mounting-induced strain and defects on high power GaAs/AlGaAs laser diodes
R. Xia, A.V. Andrianov, S. Bull, I. Harrison, J.P. Landesman, E.C. Larkins
1.55 μm AlGaInAs/InP polarization-insensitive optical amplifier with tensile strained wells grown by MOCVD
Hong Ma, Xinjian Yi, Sihai Chen
Reduced back reflection design for an etched diffraction grating based planar demultiplexer
Zhongyan Sheng, Jianjun He, Sailing He
Study of the relationship between porous ratio and effective index in nanoporous film
Zhenyu Yang, Daqing Zhu, Dongsheng Lu, Ming Zhao, Na Ning, Yongjun Liu
Instructions for Authors