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Optical and Quantum Electronics
Erschienen in: Optical and Quantum Electronics 1/2015

01.01.2015

Optical properties of an opal with a planar defect fabricated by inverse Schaefer and Langmuir–Blodgett techniques

verfasst von: P. N. Hong, P. Bénalloul, Z. Guennouni-Assimi, R. Farha, C. Bourdillon, M.-C. Fauré, M. Goldmann, W. Marcillac, L. Coolen, A. Maître, C. Schwob

Erschienen in: Optical and Quantum Electronics | Ausgabe 1/2015

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Abstract

A silica monolayer has been introduced between tow artificial silica opals using Langmuir Blodgett and inverse Schaefer transfer techniques. The structure and optical properties of the sandwich structure have been characterized by atomic force microscopy, scanning electron microscopy and specular reflection and transmission spectra. The quality of the defect mode inside the stopband made by inverse Schaefer technique is as good as the one obtained by the most commonly used Langmuir–Blodgett technique. Finite difference time domain simulations have been performed and show very good agreement with experimental result.
Vorheriger Artikel Capillary waveguide biosensor
Nächster Artikel Enhancement of two photon fluorescence collection by using effectively single mode double clad hollow core fiber with low dispersion at 800 nm

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Metadaten
Titel
Optical properties of an opal with a planar defect fabricated by inverse Schaefer and Langmuir–Blodgett techniques
verfasst von
P. N. Hong
P. Bénalloul
Z. Guennouni-Assimi
R. Farha
C. Bourdillon
M.-C. Fauré
M. Goldmann
W. Marcillac
L. Coolen
A. Maître
C. Schwob
Publikationsdatum
01.01.2015
Verlag
Springer US
Erschienen in
Optical and Quantum Electronics / Ausgabe 1/2015
Print ISSN: 0306-8919
Elektronische ISSN: 1572-817X
DOI
https://doi.org/10.1007/s11082-014-9939-6

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