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Journal of Computational Electronics
Erschienen in: Journal of Computational Electronics 3/2019

22.04.2019

Optimization of anti-reflective coatings using a graded index based on silicon oxynitride

verfasst von: A. M. Kaddouri, A. Kouzou, A. Hafaifa, A. Khadir

Erschienen in: Journal of Computational Electronics | Ausgabe 3/2019

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Abstract

The present work deals with a comparative study of three anti-reflective coatings (ARCs) based on oxynitride using a gradient refractive index (graded index) following three proposed profiles such as the linear, sub-linear and super-linear profiles. This comparison is based on the quality of the obtained photocurrent density improvement and the normalized photocurrent. At the same time, the conventional single-layer ARC SiO3 and Si3O4 are presented as reference in this comparison. Two parameters are taken into account as the main variables which have the main impact and a degree of sensitivity to the quality of the ARC, the thickness of the layer and the irradiation incidence angle. This study has led to the determination that the super-linear profile is the optimal profile, and that it can be used in multilayer ARCs to ensure optimal energy conversion versus the layers’ thickness and reduced light loss under oblique incidence with improved efficiency.
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Metadaten
Titel
Optimization of anti-reflective coatings using a graded index based on silicon oxynitride
verfasst von
A. M. Kaddouri
A. Kouzou
A. Hafaifa
A. Khadir
Publikationsdatum
22.04.2019
Verlag
Springer US
Erschienen in
Journal of Computational Electronics / Ausgabe 3/2019
Print ISSN: 1569-8025
Elektronische ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-019-01334-2

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