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Erschienen in:
1992 | OriginalPaper | Buchkapitel
Ordered Binary Decision Diagrams
verfasst von : Kenneth M. Butler, M. Ray Mercer
Erschienen in: Assessing Fault Model and Test Quality
Verlag: Springer US
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In order to facilitate a detailed study of the perturbations of various fault models on the normal functioning of a given circuit, it is helpful to have the capacity to find all the tests for each fault in a fault set. One procedure to gather this information would be to inject each fault in the fault set, one at a time, and simulate all possible input patterns, noting when departures from the good machine outputs occur for each fault. An exhaustive method similar to the one just described was proposed in [BEH82]. Obviously, the time required for exhaustive approaches can become prohibitive quickly as circuit sizes grow.