In order to facilitate a detailed study of the perturbations of various fault models on the normal functioning of a given circuit, it is helpful to have the capacity to find all the tests for each fault in a fault set. One procedure to gather this information would be to inject each fault in the fault set, one at a time, and simulate all possible input patterns, noting when departures from the good machine outputs occur for each fault. An exhaustive method similar to the one just described was proposed in [BEH82]. Obviously, the time required for exhaustive approaches can become prohibitive quickly as circuit sizes grow.
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- Ordered Binary Decision Diagrams
Kenneth M. Butler
M. Ray Mercer
- Springer US
- Chapter 3
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