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Erschienen in:
07.01.2019
Raman spectroscopic, infrared spectra and microwave dielectric properties in the (ZrTi)1−x(Al1/2Nb1/2)2xO4 ceramics
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 4/2019
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Abstract
A series of (ZrTi)1−x(Al1/2Nb1/2)2xO4 (0.12 ≤ x ≤ 0.30) ceramics with suitable sintering aids of 0.5 wt% CuO were successfully synthesized by the conventional solid-state processing. The XRD analysis suggested that the main crystalline phase of the well-densified ceramics belonged to α-PbO2-type structure. The SEM demonstrated that the appropriate sintering aids and the proper sintering temperature led to a densification of the ceramics by observing the microstructure. Raman spectroscopic and Far Infrared reflectivity spectra were applied to explore the relation between microwave dielectric properties and microstructure by learning the phonon vibrational modes. An excellent microwave dielectric properties (εr ~ 36.5, Qf ~ 36200 GHz, τf ~ 0 ppm/°C) was achieved in (ZrTi)1−x(Al1/2Nb1/2)2xO4 ceramics sintered at 1350 °C for 4 h when x = 0.18. The results revealed this ceramic system is a very promising candidate for microwave dielectric applications requiring extremely near zero τf.