Skip to main content

2019 | OriginalPaper | Buchkapitel

29. Refractive Index of Optical Materials

verfasst von : Jean-Louis Meyzonnette, Jacques Mangin, Michel Cathelinaud

Erschienen in: Springer Handbook of Glass

Verlag: Springer International Publishing

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

This chapter deals with the use of methods for measuring the refractive index of optical materials. It contains five sections:
The first section recalls some bases of the electromagnetic theory of light leading to the main characteristics of the index of refraction, and their consequences in geometrical optics (Snell–Descartes laws), in the spectral transmission and absorption of optical media, or the polarization of light beams at interfaces between optical media.
The second section describes the more or less classical panel of methods that have been devised to measure refractive indices of bulk materials: these are essentially based upon either the refraction or reflection of light inside prisms (minimum deviation angle, Littrow methods,…) polarizing properties of optical boundaries (ellipsometric, Brewster configurations).
While the previous section consists of refractive index characterization at a given temperature, the third section is dedicated to the dependence of the refractive index upon the temperature: the normalized thermo-optic coefficient (NTOC) is defined here and an experimental set-up specially designed for this purpose by one of the authors is described in detail.
The last section is concerned with the fact that most optical components are thin film coated in order to improve their performance in transmission, reflection or absorption. Since spectrophotometry is extensively used to characterize these coatings, the operating principle of spectrophotometers is recalled, as well as the main parameters of these deposited films that one can expect to extract by using this technology from spectrophotometric measurements. Various spectrophotometric procedures are described to determine the optical constants of optical ‘‘systems'' (bulk and thin film compounds) in the case of homogeneous or inhomogeneous films, slightly absorbing or not.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literatur
Zurück zum Zitat N.G. Van Kampen, F. Lurçat: Causalité et relations de Kramers-Kronig, J. Phys. Radium 22, 179–191 (1961)CrossRef N.G. Van Kampen, F. Lurçat: Causalité et relations de Kramers-Kronig, J. Phys. Radium 22, 179–191 (1961)CrossRef
Zurück zum Zitat V. Lucarini, J.J. Saarinen, K.-E. Peiponen, M.E. Vartiainen: Kramers-Kronig Relations in Optical Materials (Springer, Berlin, Heidelberg 2005) V. Lucarini, J.J. Saarinen, K.-E. Peiponen, M.E. Vartiainen: Kramers-Kronig Relations in Optical Materials (Springer, Berlin, Heidelberg 2005)
Zurück zum Zitat J.F. Ogilvie, G.J. Fee: Equivalence of Kramers-Kronig and Fourier transforms to convert between optical dispersion and optical spectra, MATCH Commun. Math. Comput. Chem. 69, 249–262 (2013) J.F. Ogilvie, G.J. Fee: Equivalence of Kramers-Kronig and Fourier transforms to convert between optical dispersion and optical spectra, MATCH Commun. Math. Comput. Chem. 69, 249–262 (2013)
Zurück zum Zitat M. Born, E. Wolf: Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge Univ. Press, Cambridge 1999)CrossRef M. Born, E. Wolf: Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge Univ. Press, Cambridge 1999)CrossRef
Zurück zum Zitat A. Hadni: Essentials of Modern Physics Applied to the Study of the Infrared (Pergamon, Oxford 1967) A. Hadni: Essentials of Modern Physics Applied to the Study of the Infrared (Pergamon, Oxford 1967)
Zurück zum Zitat H.A. Macleod: Thin-Film Optical Filters, 4th edn. (CRC, Boca Raton 2010)CrossRef H.A. Macleod: Thin-Film Optical Filters, 4th edn. (CRC, Boca Raton 2010)CrossRef
Zurück zum Zitat F.S. Forman, A.V. Tikhonravov: Basics of Optics of Multilayer Systems (Edition Frontieres, Gif-sur-Yvette 1992) F.S. Forman, A.V. Tikhonravov: Basics of Optics of Multilayer Systems (Edition Frontieres, Gif-sur-Yvette 1992)
Zurück zum Zitat D. Tentori, J.R. Lerma: Refractometry by minimum deviation accuracy analysis, Opt. Eng. 29(2), 160–168 (1990)CrossRef D. Tentori, J.R. Lerma: Refractometry by minimum deviation accuracy analysis, Opt. Eng. 29(2), 160–168 (1990)CrossRef
Zurück zum Zitat D.B. Leviton, B.J. Frey, T.K. Kvamme: High accuracy, absolute, cryogenic refractive index measurements of infrared lens materials for JWST NIRcam using CHARMS, Proc. SPIE 5904, 222–233 (2005) D.B. Leviton, B.J. Frey, T.K. Kvamme: High accuracy, absolute, cryogenic refractive index measurements of infrared lens materials for JWST NIRcam using CHARMS, Proc. SPIE 5904, 222–233 (2005)
Zurück zum Zitat B.J. Frey, D.B. Leviton: Cryogenic High Accuracy Refraction Measuring System (CHARMS): A new facility for cryogenic infrared through farultraviolet refractive index measurements, Proc. SPIE 5494, 492–504 (2004)CrossRef B.J. Frey, D.B. Leviton: Cryogenic High Accuracy Refraction Measuring System (CHARMS): A new facility for cryogenic infrared through farultraviolet refractive index measurements, Proc. SPIE 5494, 492–504 (2004)CrossRef
Zurück zum Zitat C. Véret: Réfractométrie, Tech. Ing. R 6300, 1–12 (1995) C. Véret: Réfractométrie, Tech. Ing. R 6300, 1–12 (1995)
Zurück zum Zitat R.M.A. Azzam, N.M. Bashara: Ellipsometry and Polarized Light (Elsevier, Amsterdam 1987)CrossRef R.M.A. Azzam, N.M. Bashara: Ellipsometry and Polarized Light (Elsevier, Amsterdam 1987)CrossRef
Zurück zum Zitat G. Tompkins, W.A. McGahan: Spectroscopic Ellipsometry and Reflectometry: A User's Guide (Wiley, New York 1999) G. Tompkins, W.A. McGahan: Spectroscopic Ellipsometry and Reflectometry: A User's Guide (Wiley, New York 1999)
Zurück zum Zitat H.G. Tompkins, E.A. Irene (Eds.): Handbook of Ellipsometry (William Andrew, Norwich, New York 2005) H.G. Tompkins, E.A. Irene (Eds.): Handbook of Ellipsometry (William Andrew, Norwich, New York 2005)
Zurück zum Zitat A. Rothen: The ellipsometer, an apparatus to measure thicknesses of thin surface films, Rev. Sci. Instrum. 16, 26–30 (1945)CrossRef A. Rothen: The ellipsometer, an apparatus to measure thicknesses of thin surface films, Rev. Sci. Instrum. 16, 26–30 (1945)CrossRef
Zurück zum Zitat F. Abeles: Surface electromagnetic waves ellipsometry, Surf. Sci. 56, 237–251 (1976)CrossRef F. Abeles: Surface electromagnetic waves ellipsometry, Surf. Sci. 56, 237–251 (1976)CrossRef
Zurück zum Zitat D.E. Aspnes, J.B. Theeten, F. Hottier: Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry, Phys. Rev. B 20(8), 3292 (1979)CrossRef D.E. Aspnes, J.B. Theeten, F. Hottier: Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry, Phys. Rev. B 20(8), 3292 (1979)CrossRef
Zurück zum Zitat E.D. Palik: Handbook of Optical Constants of Solids (Academic, New York 1985) E.D. Palik: Handbook of Optical Constants of Solids (Academic, New York 1985)
Zurück zum Zitat J.A. Faucher, G.M. McManus, H.J. Trurnit: Simplified Treatment of Ellipsometry, J. Opt. Soc. Am. 48(1), 51–54 (1958)CrossRef J.A. Faucher, G.M. McManus, H.J. Trurnit: Simplified Treatment of Ellipsometry, J. Opt. Soc. Am. 48(1), 51–54 (1958)CrossRef
Zurück zum Zitat S. Huard: Polarisation de la lumière (Ed Masson, Paris 1994) S. Huard: Polarisation de la lumière (Ed Masson, Paris 1994)
Zurück zum Zitat R.C. Jones: A new calculus for the treatment of optical systems Part I, J. Opt. Soc. Am. 31, 486–493 (1941) R.C. Jones: A new calculus for the treatment of optical systems Part I, J. Opt. Soc. Am. 31, 486–493 (1941)
Zurück zum Zitat R.C. Jones: A new calculus for the treatment of optical systems Part III, J. Opt. Soc. Am. 31, 500–503 (1941)CrossRef R.C. Jones: A new calculus for the treatment of optical systems Part III, J. Opt. Soc. Am. 31, 500–503 (1941)CrossRef
Zurück zum Zitat R.C. Jones: A new calculus for the treatment of optical systems Part IV, J. Opt. Soc. Am. 32, 488–493 (1942)CrossRef R.C. Jones: A new calculus for the treatment of optical systems Part IV, J. Opt. Soc. Am. 32, 488–493 (1942)CrossRef
Zurück zum Zitat D.E. Aspnes: Spectroscopic ellipsometry — Past, present, and future, Thin Solid Films 571, 334–344 (2014)CrossRef D.E. Aspnes: Spectroscopic ellipsometry — Past, present, and future, Thin Solid Films 571, 334–344 (2014)CrossRef
Zurück zum Zitat F. Bernoux, J.P. Piel, B. Castellon, C. Defranoux, J.H. Lecat, P. Boher, J.L. Stehle: Ellipsométrie – Théorie, Tech. Ing. R 6490, 1–13 (2003) F. Bernoux, J.P. Piel, B. Castellon, C. Defranoux, J.H. Lecat, P. Boher, J.L. Stehle: Ellipsométrie – Théorie, Tech. Ing. R 6490, 1–13 (2003)
Zurück zum Zitat L. Prod'homme: A new approach to the thermal change in the refractive index with temperature, Phys. Chem. Glasses 1, 145–153 (1960) L. Prod'homme: A new approach to the thermal change in the refractive index with temperature, Phys. Chem. Glasses 1, 145–153 (1960)
Zurück zum Zitat A.J. Bosman, E.E. Havinga: Temperature dependence of dielectric constants of cubic ionic compounds, Phys. Rev. 129, 1593–1600 (1963)CrossRef A.J. Bosman, E.E. Havinga: Temperature dependence of dielectric constants of cubic ionic compounds, Phys. Rev. 129, 1593–1600 (1963)CrossRef
Zurück zum Zitat E.E. Havinga, A.J. Bosman: Temperature dependence of dielectric constant of crystals with NaCl and CsCl structure, Phys. Rev. 140, A292–A303 (1965)CrossRef E.E. Havinga, A.J. Bosman: Temperature dependence of dielectric constant of crystals with NaCl and CsCl structure, Phys. Rev. 140, A292–A303 (1965)CrossRef
Zurück zum Zitat J.M. Jewell: Model for the thermo-optic behavior of sodium borate and aluminosilicate, J. Non-Cryst. Solids 146, 145–153 (1992)CrossRef J.M. Jewell: Model for the thermo-optic behavior of sodium borate and aluminosilicate, J. Non-Cryst. Solids 146, 145–153 (1992)CrossRef
Zurück zum Zitat G. Gosh: Sellmeier coefficients and dispersion of thermo-optic coefficients for some optical glasses, Appl. Opt. 36, 1540–1546 (1997)CrossRef G. Gosh: Sellmeier coefficients and dispersion of thermo-optic coefficients for some optical glasses, Appl. Opt. 36, 1540–1546 (1997)CrossRef
Zurück zum Zitat T. Zhang, M.-Q. Wu, S.-R. Zhang, J. Xiong, J.-M. Wang, D.-H. Zhang, F.-M. He, Z.-P. Li: Permittivity and its temperature dependence in hexagonal structure BN dominated by the local electric field, Chin. Phys. B 21, 077701-1–077701-8 (2012) T. Zhang, M.-Q. Wu, S.-R. Zhang, J. Xiong, J.-M. Wang, D.-H. Zhang, F.-M. He, Z.-P. Li: Permittivity and its temperature dependence in hexagonal structure BN dominated by the local electric field, Chin. Phys. B 21, 077701-1–077701-8 (2012)
Zurück zum Zitat G.N. Ramachandran: Thermo-optic of solids, Proc. Indian Acad. Sci. 25A, 498–515 (1947)CrossRef G.N. Ramachandran: Thermo-optic of solids, Proc. Indian Acad. Sci. 25A, 498–515 (1947)CrossRef
Zurück zum Zitat K.F. Trost: Die thermische Ausdehnung der Alkalihalogenide vom NaCl-Typ bei hohen und tiefen Temperaturen, Z. Naturforsch. 18b, 662–664 (1963)CrossRef K.F. Trost: Die thermische Ausdehnung der Alkalihalogenide vom NaCl-Typ bei hohen und tiefen Temperaturen, Z. Naturforsch. 18b, 662–664 (1963)CrossRef
Zurück zum Zitat H.H. Li: Refractive index of alkali halides and its temperature derivatives, J. Phys. Chem. Ref. Data 5, 329–528 (1976)CrossRef H.H. Li: Refractive index of alkali halides and its temperature derivatives, J. Phys. Chem. Ref. Data 5, 329–528 (1976)CrossRef
Zurück zum Zitat S. Kumar: Thermal expansion of simple ionic crystals, Proc. Natl. Inst. Sci. India A25, 364–372 (1959) S. Kumar: Thermal expansion of simple ionic crystals, Proc. Natl. Inst. Sci. India A25, 364–372 (1959)
Zurück zum Zitat J.E. Rapp, H.D. Merchant: Thermal expansion of alkali halides from 70 to 570 K, J. Appl. Phys. 44, 3919–3923 (1973)CrossRef J.E. Rapp, H.D. Merchant: Thermal expansion of alkali halides from 70 to 570 K, J. Appl. Phys. 44, 3919–3923 (1973)CrossRef
Zurück zum Zitat M. Lallemand, J. Martinet: Influence de la température sur le coefficient thermo-optique des fluorures alcalino-terreux, Rev. Phys. Appl. 17, 111–117 (1982)CrossRef M. Lallemand, J. Martinet: Influence de la température sur le coefficient thermo-optique des fluorures alcalino-terreux, Rev. Phys. Appl. 17, 111–117 (1982)CrossRef
Zurück zum Zitat D.B. Sirdeshmukh, L. Sirdeshmukh, K.G. Subhadra: Alkali Halides: A Handbok of Physical Properties (Springer, Berlin 2001)CrossRef D.B. Sirdeshmukh, L. Sirdeshmukh, K.G. Subhadra: Alkali Halides: A Handbok of Physical Properties (Springer, Berlin 2001)CrossRef
Zurück zum Zitat D.B. Leviton, B.J. Frey: Temperature dependent absolute refractive index measurements of fused silica, Proc. SPIE 6273, 6273K (2006) D.B. Leviton, B.J. Frey: Temperature dependent absolute refractive index measurements of fused silica, Proc. SPIE 6273, 6273K (2006)
Zurück zum Zitat B.D. Frey, D.B. Leviton: Automation, operation and data analysis in the cryogenic, high accuracy, refraction measuring system (CHARMS), Proc. SPIE 5904, 212–221 (2005) B.D. Frey, D.B. Leviton: Automation, operation and data analysis in the cryogenic, high accuracy, refraction measuring system (CHARMS), Proc. SPIE 5904, 212–221 (2005)
Zurück zum Zitat J.F. Nye: Physical Properties of Crystals (Clarendon, Oxford 1976) J.F. Nye: Physical Properties of Crystals (Clarendon, Oxford 1976)
Zurück zum Zitat S. Fossier, S. Salaün, J. Mangin, O. Bidault, I. Thénot, J.-J. Zondy, W. Chen, F. Rotermund, V. Petrov, J. Heningsen, A. Yelisseiev, L. Isaenko, S. Lobanov, O. Balachninaite, G. Slekys, V. Sirutkaitis: Optical, vibrational, thermal, electrical, damage and phase-matching properties of lithium thioindate, J. Opt. Soc. Am. B 21, 1981–2007 (2004)CrossRef S. Fossier, S. Salaün, J. Mangin, O. Bidault, I. Thénot, J.-J. Zondy, W. Chen, F. Rotermund, V. Petrov, J. Heningsen, A. Yelisseiev, L. Isaenko, S. Lobanov, O. Balachninaite, G. Slekys, V. Sirutkaitis: Optical, vibrational, thermal, electrical, damage and phase-matching properties of lithium thioindate, J. Opt. Soc. Am. B 21, 1981–2007 (2004)CrossRef
Zurück zum Zitat J. Mangin, G. Mennerat, G. Gadret, V. Badikov, J.-C. de Miscault: Comprehensive formulation of the temperature dependence dispersion of optical materials; illustration with case of temperature tuning of a mid-IR HgGa2S4 OPO, J. Opt. Soc. Am. B 26, 1702–1709 (2009)CrossRef J. Mangin, G. Mennerat, G. Gadret, V. Badikov, J.-C. de Miscault: Comprehensive formulation of the temperature dependence dispersion of optical materials; illustration with case of temperature tuning of a mid-IR HgGa2S4 OPO, J. Opt. Soc. Am. B 26, 1702–1709 (2009)CrossRef
Zurück zum Zitat J. Mangin, P. Strimer, L. Lahlou-Kassi: An interferometric dilatometer for the determination of thermo-optic coefficients of NLO materials, Meas. Sci. Technol. 4, 826–834 (1993)CrossRef J. Mangin, P. Strimer, L. Lahlou-Kassi: An interferometric dilatometer for the determination of thermo-optic coefficients of NLO materials, Meas. Sci. Technol. 4, 826–834 (1993)CrossRef
Zurück zum Zitat G.E. Merritt: The interference method of measuring thermal expansion, J. Res. Natl. Bur. Stand. (US) 10, 59–76 (1932)CrossRef G.E. Merritt: The interference method of measuring thermal expansion, J. Res. Natl. Bur. Stand. (US) 10, 59–76 (1932)CrossRef
Zurück zum Zitat R.M. Walker, G.W. Cleek, I.H. Malitson, M.J. Dodge, T.A. Hahn: Optical and mechanical properties of some neodymium-doped glasses, J. Res. Natl. Bur. Stand. (US) 75A, 163–174 (1971)CrossRef R.M. Walker, G.W. Cleek, I.H. Malitson, M.J. Dodge, T.A. Hahn: Optical and mechanical properties of some neodymium-doped glasses, J. Res. Natl. Bur. Stand. (US) 75A, 163–174 (1971)CrossRef
Zurück zum Zitat R.M. Walker, G.W. Cleek: Refractive index of fused silica at low temperatures, J. Res. Natl. Bur. Stand. (US) 75A, 279–281 (1971)CrossRef R.M. Walker, G.W. Cleek: Refractive index of fused silica at low temperatures, J. Res. Natl. Bur. Stand. (US) 75A, 279–281 (1971)CrossRef
Zurück zum Zitat R.M. Walker, G.W. Cleek: The effect of temperature and pressure on the refractive index of some oxide glasses, J. Res. Natl. Bur. Stand. (US) 77A, 755–763 (1973)CrossRef R.M. Walker, G.W. Cleek: The effect of temperature and pressure on the refractive index of some oxide glasses, J. Res. Natl. Bur. Stand. (US) 77A, 755–763 (1973)CrossRef
Zurück zum Zitat M. Okaji, H. Imai: A practical measurement system for accurate determination of linear thermal expansion coefficients, J. Phys. E Sci. Instrum. 17, 669–673 (1984)CrossRef M. Okaji, H. Imai: A practical measurement system for accurate determination of linear thermal expansion coefficients, J. Phys. E Sci. Instrum. 17, 669–673 (1984)CrossRef
Zurück zum Zitat P. Hariharan, D. Sen: Double-passed two-beam interferometers. II. Effect of specimen absorption and finite path difference, J. Opt. Soc. Am. 51, 1212–1218 (1961)CrossRef P. Hariharan, D. Sen: Double-passed two-beam interferometers. II. Effect of specimen absorption and finite path difference, J. Opt. Soc. Am. 51, 1212–1218 (1961)CrossRef
Zurück zum Zitat A.P. Müller, A. Cezairlaiyan: Interferometric technique for the subsecond measurement of thermal expansion at high temperatures: application to refractory metals, Int. J. Thermophys. 12, 643–656 (1991)CrossRef A.P. Müller, A. Cezairlaiyan: Interferometric technique for the subsecond measurement of thermal expansion at high temperatures: application to refractory metals, Int. J. Thermophys. 12, 643–656 (1991)CrossRef
Zurück zum Zitat G. Gosh: Model for the thermo-optic coefficients of some standard optical glasses, J. Non-Cryst. Solids 189, 191–196 (1995)CrossRef G. Gosh: Model for the thermo-optic coefficients of some standard optical glasses, J. Non-Cryst. Solids 189, 191–196 (1995)CrossRef
Zurück zum Zitat W.J. Tropf, M.E. Thomas, T.J. Harris: Optical and physical properties of crystals and glasses. In: Handbook of Optics, Vol. II, ed. by M. Bass (McGraw-Hill, New York 1995) W.J. Tropf, M.E. Thomas, T.J. Harris: Optical and physical properties of crystals and glasses. In: Handbook of Optics, Vol. II, ed. by M. Bass (McGraw-Hill, New York 1995)
Zurück zum Zitat M.V. Hobden, J. Warner: The temperature dependence of the refractive indices of pure lithium niobate, Phys. Lett. 22, 243–244 (1966)CrossRef M.V. Hobden, J. Warner: The temperature dependence of the refractive indices of pure lithium niobate, Phys. Lett. 22, 243–244 (1966)CrossRef
Zurück zum Zitat D.H. Jundt: Temperature-dependent Sellmeier equation for the index of refraction, ne, in congruent lithium niobate, Opt. Lett. 22, 1553–1555 (1997)CrossRef D.H. Jundt: Temperature-dependent Sellmeier equation for the index of refraction, ne, in congruent lithium niobate, Opt. Lett. 22, 1553–1555 (1997)CrossRef
Zurück zum Zitat I. Dolev, A. Ganany-Padowicz, O. Gayer, A. Arie, J. Mangin, G. Gadret: Linear and nonlinear optical properties of MgO:LiTaO3, Appl. Phys. B 96, 423–432 (2009)CrossRef I. Dolev, A. Ganany-Padowicz, O. Gayer, A. Arie, J. Mangin, G. Gadret: Linear and nonlinear optical properties of MgO:LiTaO3, Appl. Phys. B 96, 423–432 (2009)CrossRef
Zurück zum Zitat J. Mangin, G. Mennerat, P. Villeval: Thermal expansion, normalized thermo-optic-coefficients, and condition for second harmonic generation of a Nd:YAG laser with wide temperature bandwidth in RbTiOPO4, J. Opt. Soc. Am. B 28, 873–881 (2011)CrossRef J. Mangin, G. Mennerat, P. Villeval: Thermal expansion, normalized thermo-optic-coefficients, and condition for second harmonic generation of a Nd:YAG laser with wide temperature bandwidth in RbTiOPO4, J. Opt. Soc. Am. B 28, 873–881 (2011)CrossRef
Zurück zum Zitat W. Tropf, M.E. Thomas: Infrared refractive index and thermo-optic coefficient measurement at APL, Johns Hopkins APL Tech. Dig. 19, 293–298 (1998) W. Tropf, M.E. Thomas: Infrared refractive index and thermo-optic coefficient measurement at APL, Johns Hopkins APL Tech. Dig. 19, 293–298 (1998)
Zurück zum Zitat O.S. Heavens: Measurement of optical constants of thin films. In: Physics of Thin Films (Academic, New York 1964) O.S. Heavens: Measurement of optical constants of thin films. In: Physics of Thin Films (Academic, New York 1964)
Zurück zum Zitat P. Bousquet, F. Flory, P. Roche: Scattering from multilayer thin films: theory and experiment, J. Opt. Soc. Am. 71(9), 1115–1123 (1981)CrossRef P. Bousquet, F. Flory, P. Roche: Scattering from multilayer thin films: theory and experiment, J. Opt. Soc. Am. 71(9), 1115–1123 (1981)CrossRef
Zurück zum Zitat A. Piegari, F. Flory: Optical Thin Films and Coatings: From Materials to Applications (Woodhead, Oxford 2013) A. Piegari, F. Flory: Optical Thin Films and Coatings: From Materials to Applications (Woodhead, Oxford 2013)
Zurück zum Zitat C. Amra: Light scattering from multilayer optics. I. Tools of investigation, J. Opt. Soc. Am. A 11, 197–210 (1994)CrossRef C. Amra: Light scattering from multilayer optics. I. Tools of investigation, J. Opt. Soc. Am. A 11, 197–210 (1994)CrossRef
Zurück zum Zitat S. Adachi: Model dielectric constants of GaP, GaAs, Gasb, InP, InAs, and InSb, Phys. Rev. B 35(14), 7454–7463 (1987)CrossRef S. Adachi: Model dielectric constants of GaP, GaAs, Gasb, InP, InAs, and InSb, Phys. Rev. B 35(14), 7454–7463 (1987)CrossRef
Zurück zum Zitat V. Kumar, S.K. Sharma, T.P. Sharma, V. Singh: Band gap determination in thick films from reflectance measurements, Opt. Mater. 12, 115–119 (1999)CrossRef V. Kumar, S.K. Sharma, T.P. Sharma, V. Singh: Band gap determination in thick films from reflectance measurements, Opt. Mater. 12, 115–119 (1999)CrossRef
Zurück zum Zitat P.S. Hauge: Polycrystalline silicon film thickness measurement from analysis of visible reflectance spectra, J. Opt. Soc. Am. 69(8), 1143–1152 (1979)CrossRef P.S. Hauge: Polycrystalline silicon film thickness measurement from analysis of visible reflectance spectra, J. Opt. Soc. Am. 69(8), 1143–1152 (1979)CrossRef
Zurück zum Zitat J.C. Manifacier, J. Gassiot, J.P. Fillard: A simple method for the determination of the optical constants, n, k and the thickness of a weakly absorbing thin film, J. Phys. E Sci. Instrum. 9, 1002–1004 (1976)CrossRef J.C. Manifacier, J. Gassiot, J.P. Fillard: A simple method for the determination of the optical constants, n, k and the thickness of a weakly absorbing thin film, J. Phys. E Sci. Instrum. 9, 1002–1004 (1976)CrossRef
Zurück zum Zitat I. Ohlidal, K. Navrfitil, E. Schmidt: Simple method for the complete optical analysis of very thick and weakly absorbing films, Appl. Phys. A 29, 157–162 (1982)CrossRef I. Ohlidal, K. Navrfitil, E. Schmidt: Simple method for the complete optical analysis of very thick and weakly absorbing films, Appl. Phys. A 29, 157–162 (1982)CrossRef
Zurück zum Zitat R. Jacobsson: Inhomogeneous and coevaporated homogeneous films for optical applications, Phys. Thin Films 8, 51–98 (1975) R. Jacobsson: Inhomogeneous and coevaporated homogeneous films for optical applications, Phys. Thin Films 8, 51–98 (1975)
Zurück zum Zitat J.P. Borgogno, B. Lazarides, E. Pelletier: Automatic determination of the optical constants of inhomogeneous thin films, Appl. Opt. 21, 4020–4029 (1982)CrossRef J.P. Borgogno, B. Lazarides, E. Pelletier: Automatic determination of the optical constants of inhomogeneous thin films, Appl. Opt. 21, 4020–4029 (1982)CrossRef
Zurück zum Zitat J.A. Dobrowolski, F.C. Ho, A. Waldorf: Determination of optical constants of thin film coating materials based on inverse synthesis, Appl. Opt. 22(20), 3191–3200 (1983)CrossRef J.A. Dobrowolski, F.C. Ho, A. Waldorf: Determination of optical constants of thin film coating materials based on inverse synthesis, Appl. Opt. 22(20), 3191–3200 (1983)CrossRef
Zurück zum Zitat F. Abeles: Methods for determining optical parameters of thin films. In: Progress in Optics, Vol. 2, ed. by E. Wolf (Elsevier, Amsterdam 1963) F. Abeles: Methods for determining optical parameters of thin films. In: Progress in Optics, Vol. 2, ed. by E. Wolf (Elsevier, Amsterdam 1963)
Zurück zum Zitat S.G. Tomlin: Optical reflection and transmission formulae for thin films, J. Phys. D 1, 1667–1671 (1968)CrossRef S.G. Tomlin: Optical reflection and transmission formulae for thin films, J. Phys. D 1, 1667–1671 (1968)CrossRef
Zurück zum Zitat H. Wolter: Zur Optik dünner Metallfilme, Z. Phys. 105(5), 269–308 (1937)CrossRef H. Wolter: Zur Optik dünner Metallfilme, Z. Phys. 105(5), 269–308 (1937)CrossRef
Zurück zum Zitat M. Cathelinaud, F. Lemarquis, J. Loesel, B. Cousin: Metal-dielectric light absorbers manufactured by ion plating, Proc. SPIE 5250, 5250–5250–8 (2004) M. Cathelinaud, F. Lemarquis, J. Loesel, B. Cousin: Metal-dielectric light absorbers manufactured by ion plating, Proc. SPIE 5250, 5250–5250–8 (2004)
Zurück zum Zitat G. Hass, L. Hadley: Optical Constants of metals. In: American Institute of Physics Handbook, ed. by D.E. Gray (McGraw-Hill, New York 1972) G. Hass, L. Hadley: Optical Constants of metals. In: American Institute of Physics Handbook, ed. by D.E. Gray (McGraw-Hill, New York 1972)
Zurück zum Zitat M. Cathelinaud, F. Lemarquis, C. Amra: Index determination of opaque and semitransparent metallic films: Application to light absorbers, Appl. Opt. 41, 2546–2554 (2002)CrossRef M. Cathelinaud, F. Lemarquis, C. Amra: Index determination of opaque and semitransparent metallic films: Application to light absorbers, Appl. Opt. 41, 2546–2554 (2002)CrossRef
Zurück zum Zitat W.H. Press, S.A. Teukolsky, W.T. Vetterling, B.P. Flannery: Numerical Recipes in FORTRAN: The Art of Scientific Computing (Cambridge University Press, Cambridge 1992) W.H. Press, S.A. Teukolsky, W.T. Vetterling, B.P. Flannery: Numerical Recipes in FORTRAN: The Art of Scientific Computing (Cambridge University Press, Cambridge 1992)
Zurück zum Zitat R.E. Denton, R.D. Campbell, S.G. Tomlin: The determination of the optical constants of thin films from measurements of reflectance and transmittance at normal incidence, J. Phys. D 5(4), 852–863 (1972)CrossRef R.E. Denton, R.D. Campbell, S.G. Tomlin: The determination of the optical constants of thin films from measurements of reflectance and transmittance at normal incidence, J. Phys. D 5(4), 852–863 (1972)CrossRef
Zurück zum Zitat D.P. Arndt, R.M.A. Azzam, J.M. Bennett, J.P. Borgogno, C.K. Carniglia, W.E. Case, J.A. Dobrowolski, U.J. Gibson, T. Tuttle Hart, F.C. Ho, V.A. Hodgkin, W.P. Klapp, H.A. Macleod, E. Pelletier, M.K. Purvis, D.M. Quinn, D.H. Strome, R. Swenson, P.A. Temple, T.F. Thonn: Multiple determination of the optical constants of thin-film coating materials, Appl. Opt. 23(20), 3571–3596 (1984)CrossRef D.P. Arndt, R.M.A. Azzam, J.M. Bennett, J.P. Borgogno, C.K. Carniglia, W.E. Case, J.A. Dobrowolski, U.J. Gibson, T. Tuttle Hart, F.C. Ho, V.A. Hodgkin, W.P. Klapp, H.A. Macleod, E. Pelletier, M.K. Purvis, D.M. Quinn, D.H. Strome, R. Swenson, P.A. Temple, T.F. Thonn: Multiple determination of the optical constants of thin-film coating materials, Appl. Opt. 23(20), 3571–3596 (1984)CrossRef
Zurück zum Zitat A. Duparré, D. Ristau: Optical interference coatings, Meas. Probl. Appl. Opt. 47(13), C179–C184 (2007)CrossRef A. Duparré, D. Ristau: Optical interference coatings, Meas. Probl. Appl. Opt. 47(13), C179–C184 (2007)CrossRef
Zurück zum Zitat A. Duparré, D. Ristau: Optical interference coatings measurement problem, Appl. Opt. 53(4), A281–A286 (2013)CrossRef A. Duparré, D. Ristau: Optical interference coatings measurement problem, Appl. Opt. 53(4), A281–A286 (2013)CrossRef
Zurück zum Zitat F. Lemarchand, C. Deumié, M. Zerrad, L. Abel-Tiberini, B. Bertussi, G. Georges, B. Lazaridès, M. Cathelinaud, M. Lequime, C. Amra: Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem, Appl. Opt. 45(7), 1312–1318 (2006)CrossRef F. Lemarchand, C. Deumié, M. Zerrad, L. Abel-Tiberini, B. Bertussi, G. Georges, B. Lazaridès, M. Cathelinaud, M. Lequime, C. Amra: Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem, Appl. Opt. 45(7), 1312–1318 (2006)CrossRef
Metadaten
Titel
Refractive Index of Optical Materials
verfasst von
Jean-Louis Meyzonnette
Jacques Mangin
Michel Cathelinaud
Copyright-Jahr
2019
Verlag
Springer International Publishing
DOI
https://doi.org/10.1007/978-3-319-93728-1_29

    Marktübersichten

    Die im Laufe eines Jahres in der „adhäsion“ veröffentlichten Marktübersichten helfen Anwendern verschiedenster Branchen, sich einen gezielten Überblick über Lieferantenangebote zu verschaffen.