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Erschienen in:
Power Semiconductor Devices—Key Components for Efficient Electrical Energy Conversion Systems Kapitel lesen Erstes Kapitel lesen

2018 | OriginalPaper | Buchkapitel

12. Reliability and Reliability Testing

verfasst von : Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker

Erschienen in: Semiconductor Power Devices

Verlag: Springer International Publishing

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The reliability of power electronic devices and components has been mentioned several times in the previous chapters. It is so important, because it is a prerequisite for the performance in applications: Reliability is the ability of a system or component to perform its required functions under stated conditions for a specified period of time [SAE08]. The requested lifetime of power electronics systems is seldom below 10 years and can reach up to 30 years. …

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Vorheriges Kapitel Packaging of Power Devices
Nächstes Kapitel Destructive Mechanisms in Power Devices
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Metadaten
Titel
Reliability and Reliability Testing
verfasst von
Josef Lutz
Heinrich Schlangenotto
Uwe Scheuermann
Rik De Doncker
Copyright-Jahr
2018
Buch
Semiconductor Power Devices

Print ISBN: 978-3-319-70916-1

Electronic ISBN: 978-3-319-70917-8

Copyright-Jahr: 2018

DOI
https://doi.org/10.1007/978-3-319-70917-8_12

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