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Erschienen in:
Overview of Reliability Design Kapitel lesen Erstes Kapitel lesen

2015 | OriginalPaper | Buchkapitel

6. Reliability Evaluation of Equipment

verfasst von : Dhanasekharan Natarajan

Erschienen in: Reliable Design of Electronic Equipment

Verlag: Springer International Publishing

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Abstract

The proto-models of electronic equipment are subjected to electrical and environmental tests as per the contractual specification of the equipment. The tests are not adequate for providing high level of confidence in the reliability of equipment. An integrated test program is designed for evaluating electrical and environmental performance and the reliability of equipment. Reliability improvement tests are superimposed with the electrical and environmental tests to the extent feasible in the integrated test program. Subjecting proto-models to the integrated test program is defined as the reliability evaluation of equipment. Performance trend analysis, random vibration, thermal shock, and accelerated burn-in are the reliability improvement tests that are explained with examples. The pre-requisites that should be satisfied for ensuring the effectiveness of reliability evaluation program are listed.

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Vorheriges Kapitel Overstress Analysis
Nächstes Kapitel Failure Data Management
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Literatur
1.
Dishman, J.C.: COST saves dollars critical operating stress testing methods for early design analysis. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 186–190 (1989)
2.
Caruso, H.: An overview of environmental reliability testing. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 102–109 (1996)
3.
Zunzanyika, X.K., Yang, J.J.: Simultaneous development and qualification in the fast changing 3.5” hard-disk-drive technology. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 27–32 (1995)
4.
Perera, U.D.: Reliability of mobile phones. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 33–38 (1995)
5.
Conner, S.A., Watts, P.E.: Transformation of thermal ink-jet product reliability strategy. IEEE Proceedings of Annual Reliability and Maintainability Symposium (2012) 978-1-4577-1851-9/12
6.
Specification of LED Lighting Products, Guidelines Produced Under the Umbrella of the Lighting Industry Liaison Group and Endorsed by its Member Organisations, June 2011
7.
LED Luminaire Lifetime Recommendations for Testing and Reporting, Solid-State Lighting Product Initiative from the US Department of Energy and Next Generation Lighting Industry Alliance, Second Edition, June 2011
8.
Crawford, J.L., Wienstock, R.: The NASA trend analysis program. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 25–30 (1990)
9.
Natarajan, D.: A Practical Design of Lumped Semi-lumped and Microwave Cavity Filters. Springer, Berlin (2013)
10.
IPC 9701:2002, Performance Test Methods and Qualification Requirements for surface Mount Solder Attachments
11.
Caruso, H.: The ESS muddle: physics versus relics. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 233–241 (1995)
12.
Kallis, J.M., Hammond, W.K., Curry, E.B.: Stress screening of electronic modules: investigation of effects of temperature rate of change. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 59–66 (1990)
13.
IPC-SM-785:1992, Guidelines for Accelerated Reliability Testing of Surface Mount Solder Attachments
14.
MIL-STD-202G:2002, Test Method Standard Electronic and Electrical Component Parts
15.
Hu, J.M., Barker, D., Dasgupta, A., Arora, A.: Role of failure-mechanisms identification in accelerated testing. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 181–188 (1992)
16.
Martinez, E.C., Miller, J.: RF power transistor reliability. IEEE Proceedings of Annual Reliability and Maintainability Symposium, pp. 83–87 (1994)
17.
Watson, J., Castro, G.: High-temperature electronics pose design and reliability challenges, Analog Dialogue, vol. 46. Analog Devices, USA (2012)
18.
Reinhard, S.: Reliability and Testing, Section-4, ABB Semiconductors AG
Metadaten
Titel
Reliability Evaluation of Equipment
verfasst von
Dhanasekharan Natarajan
Copyright-Jahr
2015
Buch
Reliable Design of Electronic Equipment

Print ISBN: 978-3-319-09110-5

Electronic ISBN: 978-3-319-09111-2

Copyright-Jahr: 2015

DOI
https://doi.org/10.1007/978-3-319-09111-2_6

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