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Journal of Electronic Testing
Erschienen in: Journal of Electronic Testing 1/2022

09.03.2022

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies

verfasst von: Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa

Erschienen in: Journal of Electronic Testing | Ausgabe 1/2022

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Abstract

This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data.
Vorheriger Artikel Hardware Obfuscation for IP Protection of DSP Applications
Nächster Artikel Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams

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Metadaten
Titel
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies
verfasst von
Yujie Zhao
Kentaroh Katoh
Anna Kuwana
Shogo Katayama
Jianglin Wei
Haruo Kobayashi
Takayuki Nakatani
Kazumi Hatayama
Keno Sato
Takashi Ishida
Toshiyuki Okamoto
Tamotsu Ichikawa
Publikationsdatum
09.03.2022
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 1/2022
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-022-05988-y

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