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Erschienen in:
2004 | OriginalPaper | Buchkapitel
Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Polarization
verfasst von : Y. Cho
Erschienen in: Nanoscale Characterisation of Ferroelectric Materials
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
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Recently, ferroelectric materials, especially in thin film form, have attracted the attention of many researchers. Their large dielectric constants make them suitable as dielectric layers of microcapacitors in microelectronics. They are also investigated for application in nonvolatile memory using the switchable dielectric polarization of ferroelectric material. To characterize such ferroelectric materials, a highresolution tool is required for observing the microscopic distribution of remanent (or spontaneous) polarization of ferroelectric materials.