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2019 | OriginalPaper | Buchkapitel

25. Scanning Probe Microscopy in Materials Science

verfasst von : Bryan D. Huey, Justin Luria, Dawn A. Bonnell

Erschienen in: Springer Handbook of Microscopy

Verlag: Springer International Publishing

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Abstract

The advent of scanning probe microscopy () revolutionized surface science in the 1980s and facilitated the nanotechnology revolution in the ensuing decades. First scanning tunneling microscopy, then atomic force microscopy () and near-field optical methods, were developed and employed for fundamental and applied research in many disciplines including physics, biology, chemistry, and a wide range of engineering fields. But SPM, especially AFM, has in particular contributed to materials science due to the fact that atomic to nanoscale resolution of materials properties can be achieved. Routine and specialized SPM approaches now provide measurements and maps not just of the topography, but also of local mechanical, electronic, magnetic, optical, thermal, chemical, and coupled properties. Important recent developments include increases in imaging speed, in situ and in operando studies, advanced probes, and even tomographic AFM. This chapter describes the concepts and implementation of these various SPM methods focused on new discoveries in materials science.

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Vorheriges Kapitel Microcomputed Tomography

Nächstes Kapitel Electron Tomography in Materials Science

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Titel: Scanning Probe Microscopy in Materials Science
verfasst von: Bryan D. Huey
Justin Luria
Dawn A. Bonnell
Verlag: Springer International Publishing
Buch: Springer Handbook of Microscopy
Print ISBN: 978-3-030-00068-4

Electronic ISBN: 978-3-030-00069-1

Copyright-Jahr: 2019
DOI: https://doi.org/10.1007/978-3-030-00069-1_25

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