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Erschienen in: Journal of Cryptographic Engineering 3/2015

01.09.2015 | Regular Paper

Security analysis of concurrent error detection against differential fault analysis

verfasst von: Xiaofei Guo, Debdeep Mukhopadhyay, Chenglu Jin, Ramesh Karri

Erschienen in: Journal of Cryptographic Engineering | Ausgabe 3/2015

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Abstract

Differential fault analysis (DFA) poses a significant threat to advanced encryption standard (AES). Only a single faulty ciphertext is required to extract the secret key. Concurrent error detection (CED) is widely used to protect AES against DFA. Traditionally, these CEDs are evaluated with uniformly distributed faults, the resulting fault coverage indicates the security of CEDs against DFA. However, DFA-exploitable faults, which are a small subspace of the entire fault space, are not uniformly distributed. Therefore, fault coverage does not accurately measure the security of the CEDs against DFA. We provide a systematic study of DFA of AES and show that an attacker can inject biased faults to improve the success rate of the attacks. We propose fault entropy (FE) and fault differential entropy (FDE) to evaluate CEDs. We show that most CEDs with high fault coverage are not secure when evaluated with FE and FDE. This work challenges the traditional use of fault coverage for uniformly distributed faults as a metric for evaluating the security of CEDs against DFA.

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Fußnoten
1
Appendix A describes the AES encryption algorithm.
 
2
Classic fault model, such as permanent single bit stuck-at faults, is not relevant for DFA.
 
3
Single, stuck-at fault model. The assumption of random fault in DFA is not relevant.
 
4
The number of faults is calculated with an assumption that the faults are injected at the input to the round. If the faults can be injected anywhere in the AES round, all these numbers can be proportionally scaled.
 
5
In practice, it may be subjected to clock, power, laser, or EM injection attack, but it is relatively feasible and affordable to use multiple countermeasures on the checker. To defend against clock glitch attack, one can use dual rail logic style [50]. To defend against power or EM pulse attack, one can use a power supply noise detector for the checker [40]. To defend against laser, one can use shielding [16].
 
6
This is demonstrated using clock glitch in Dutertre et al. [21].
 
7
This is demonstrated using laser in Canivet et al. [13].
 
8
For more details, we refer to [19].
 
9
The evaluation is similar to the attack presented in Lashermes et al. [34].
 
10
\(i\) and \(j\) are the row and column indices of the state matrix, respectively. Appendix 7.1 contains the detail of the AES algorithm.
 
11
The details of SubBytes are in Appendix A.
 
12
This means eight bit binary value in hex.
 
13
We compute the difference between the fault-free and the faulty 10th round input.
 
Literatur
1.
Zurück zum Zitat Agoyan, M., Dutertre, J.M., Mirbaha, A.P., Naccache, D., Ribotta, A.L., Tria, A.: How to Flip a Bit? IOLTS pp. 235–239 (2010) Agoyan, M., Dutertre, J.M., Mirbaha, A.P., Naccache, D., Ribotta, A.L., Tria, A.: How to Flip a Bit? IOLTS pp. 235–239 (2010)
2.
Zurück zum Zitat Agoyan, M., Dutertre, J.M., Naccache, D., Robisson, B., Tria, A.: When clocks fail: on critical paths and clock faults. In: Proc. CARDIS, pp. 182–193 (2010) Agoyan, M., Dutertre, J.M., Naccache, D., Robisson, B., Tria, A.: When clocks fail: on critical paths and clock faults. In: Proc. CARDIS, pp. 182–193 (2010)
3.
Zurück zum Zitat Ali, S.S., Mukhopadhyay, D.: A differential fault analysis on AES key schedule using single fault. In: 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2011, Tokyo, Japan, September 29, 2011, pp. 35–42 (2011) Ali, S.S., Mukhopadhyay, D.: A differential fault analysis on AES key schedule using single fault. In: 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2011, Tokyo, Japan, September 29, 2011, pp. 35–42 (2011)
4.
Zurück zum Zitat Ali, S.S., Mukhopadhyay, D.: Differential fault analysis of AES-128 key schedule using a single multi-byte fault. In: Smart Card Research and Advanced Applications - 10th IFIP WG 8.8/11.2 International Conference, CARDIS 2011, Leuven, Belgium, September 14–16, 2011, Revised Selected Papers, pp. 50–64 (2011) Ali, S.S., Mukhopadhyay, D.: Differential fault analysis of AES-128 key schedule using a single multi-byte fault. In: Smart Card Research and Advanced Applications - 10th IFIP WG 8.8/11.2 International Conference, CARDIS 2011, Leuven, Belgium, September 14–16, 2011, Revised Selected Papers, pp. 50–64 (2011)
5.
Zurück zum Zitat Ali, S.S., Mukhopadhyay, D.: An improved differential fault analysis on AES-256. In: Progress in Cryptology - AFRICACRYPT 2011: 4th International Conference on Cryptology in Africa, Dakar, Senegal, July 5–7, 2011, Proceedings, pp. 332–347 (2011) Ali, S.S., Mukhopadhyay, D.: An improved differential fault analysis on AES-256. In: Progress in Cryptology - AFRICACRYPT 2011: 4th International Conference on Cryptology in Africa, Dakar, Senegal, July 5–7, 2011, Proceedings, pp. 332–347 (2011)
6.
Zurück zum Zitat Ali, S.S., Mukhopadhyay, D., Tunstall, M.: Differential fault analysis of AES: towards reaching its limits. J. Cryptogr. Eng. 3, 73–97 (2013) Ali, S.S., Mukhopadhyay, D., Tunstall, M.: Differential fault analysis of AES: towards reaching its limits. J. Cryptogr. Eng. 3, 73–97 (2013)
7.
Zurück zum Zitat Amiel, F., Clavier, C., Tunstall, M.: Fault analysis of dpa-resistant algorithms. FDTC, pp. 223–236 (2006) Amiel, F., Clavier, C., Tunstall, M.: Fault analysis of dpa-resistant algorithms. FDTC, pp. 223–236 (2006)
8.
Zurück zum Zitat Barenghi, A., Breveglieri, L., Koren, I., Naccache, D.: Fault injection attacks on cryptographic devices: theory, practice, and countermeasures. Proc. IEEE 100(11), 3056–3076 (2012)CrossRef Barenghi, A., Breveglieri, L., Koren, I., Naccache, D.: Fault injection attacks on cryptographic devices: theory, practice, and countermeasures. Proc. IEEE 100(11), 3056–3076 (2012)CrossRef
9.
Zurück zum Zitat Barenghi, A., Hocquet, C., Bol, D., Standaert, F.X., Regazzoni, F., Koren, I.: Exploring the Feasibility of low cost fault injection attacks on sub-threshold devices through an example of a 65 nm AES implementation, pp. 48–60 (2011) Barenghi, A., Hocquet, C., Bol, D., Standaert, F.X., Regazzoni, F., Koren, I.: Exploring the Feasibility of low cost fault injection attacks on sub-threshold devices through an example of a 65 nm AES implementation, pp. 48–60 (2011)
10.
Zurück zum Zitat Battistello, A., Giraud, C.: Fault analysis of infective AES computations. FDTC, pp. 101–107 (2013) Battistello, A., Giraud, C.: Fault analysis of infective AES computations. FDTC, pp. 101–107 (2013)
11.
Zurück zum Zitat Bertoni, G., Breveglieri, L., Koren, I., Maistri, P., Piuri, V.: Error analysis and detection procedures for a hardware implementation of the advanced encryption standard. IEEE Trans. Comput. 52(4), 492–505 (2003)CrossRef Bertoni, G., Breveglieri, L., Koren, I., Maistri, P., Piuri, V.: Error analysis and detection procedures for a hardware implementation of the advanced encryption standard. IEEE Trans. Comput. 52(4), 492–505 (2003)CrossRef
12.
Zurück zum Zitat Blömer, J., Seifert, J.P.: Fault Based cryptanalysis of the advanced encryption standard. FC, pp. 162–181 (2003) Blömer, J., Seifert, J.P.: Fault Based cryptanalysis of the advanced encryption standard. FC, pp. 162–181 (2003)
14.
Zurück zum Zitat Breveglieri, L., Koren, I., Maistri, P.: An Operation-centered approach to fault detection in symmetric cryptography ciphers. IEEE Trans. Comput. 56, 635–649 (2007)MathSciNetCrossRef Breveglieri, L., Koren, I., Maistri, P.: An Operation-centered approach to fault detection in symmetric cryptography ciphers. IEEE Trans. Comput. 56, 635–649 (2007)MathSciNetCrossRef
15.
Zurück zum Zitat Briais, S., Cioranesco, J.M., Danger, J.L., Guilley, S., Naccache, D., Porteboeuf, T.: Random active shield. FDTC, pp. 103–113 (2012) Briais, S., Cioranesco, J.M., Danger, J.L., Guilley, S., Naccache, D., Porteboeuf, T.: Random active shield. FDTC, pp. 103–113 (2012)
16.
Zurück zum Zitat Canivet, G., Clediere, J., Ferron, J., Valette, F., Renaudin, M., Leveugle, R.: Detailed analyses of single laser shot effects in the configuration of a Virtex-II FPGA. IOLTS, pp. 289–294 (2008) Canivet, G., Clediere, J., Ferron, J., Valette, F., Renaudin, M., Leveugle, R.: Detailed analyses of single laser shot effects in the configuration of a Virtex-II FPGA. IOLTS, pp. 289–294 (2008)
17.
Zurück zum Zitat Canivet, G., Maistri, P., Leveugle, R., Clédière, J., Valette, F., Renaudin, M.: Glitch and laser fault attacks onto a secure aes implementation on a sram-based fpga. J. Cryptol. 24 (2011) Canivet, G., Maistri, P., Leveugle, R., Clédière, J., Valette, F., Renaudin, M.: Glitch and laser fault attacks onto a secure aes implementation on a sram-based fpga. J. Cryptol. 24 (2011)
18.
Zurück zum Zitat Chih-Hsu, Y., Bing-Fei, W.: Simple error detection methods for hardware implementation of advanced encryption standard. IEEE Trans. Comput. 55(6), 730–731 (2006) Chih-Hsu, Y., Bing-Fei, W.: Simple error detection methods for hardware implementation of advanced encryption standard. IEEE Trans. Comput. 55(6), 730–731 (2006)
19.
Zurück zum Zitat Cover, T.M., Thomas, J.A.: Elements of information theory. Wiley (1991) Cover, T.M., Thomas, J.A.: Elements of information theory. Wiley (1991)
20.
Zurück zum Zitat Dehbaoui, A., Dutertre, J., Robisson, B., Tria, A.: Electromagnetic transient faults injection on a hardware and a software implementations of AES. In: Proc. IEEE FDTC, pp. 7–15 (2012) Dehbaoui, A., Dutertre, J., Robisson, B., Tria, A.: Electromagnetic transient faults injection on a hardware and a software implementations of AES. In: Proc. IEEE FDTC, pp. 7–15 (2012)
21.
Zurück zum Zitat Dutertre, J.M., Fournier, J., Mirbaha, A.P., Naccache, D., Rigaud, J.B., Robisson, B., Tria, A.: Review of fault injection mechanisms and consequences on countermeasures design. DTIS, pp. 1–6 (2011) Dutertre, J.M., Fournier, J., Mirbaha, A.P., Naccache, D., Rigaud, J.B., Robisson, B., Tria, A.: Review of fault injection mechanisms and consequences on countermeasures design. DTIS, pp. 1–6 (2011)
22.
Zurück zum Zitat Giraud, C.: DFA on AES. AES, pp. 27–41 (2005) Giraud, C.: DFA on AES. AES, pp. 27–41 (2005)
23.
Zurück zum Zitat Guo, X., Karri, R.: Invariance-based concurrent error detection for advanced encryption standard. In: Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE, 3–7 June 2012, San Francisco, CA, 573–578 (2012) Guo, X., Karri, R.: Invariance-based concurrent error detection for advanced encryption standard. In: Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE, 3–7 June 2012, San Francisco, CA, 573–578 (2012)
24.
Zurück zum Zitat Guo, X., Karri, R.: Recomputing with permuted operands: a concurrent error detection approach. IEEE Trans. CAD 32(10), 1595–1608 (2013)CrossRef Guo, X., Karri, R.: Recomputing with permuted operands: a concurrent error detection approach. IEEE Trans. CAD 32(10), 1595–1608 (2013)CrossRef
25.
Zurück zum Zitat Guo, X., Mukhopadhyay, D., Jin, C., Karri, R.: NREPO: normal basis recomputing with permuted operands. In: IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2014, pp. 118–123 (2014) Guo, X., Mukhopadhyay, D., Jin, C., Karri, R.: NREPO: normal basis recomputing with permuted operands. In: IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2014, pp. 118–123 (2014)
26.
Zurück zum Zitat Jarvinen, K., Blondeau, C., Page, D., Tunstall, M.: Harnessing biased faults in attacks on ECC-based signature schemes. FDTC, pp. 72–82 (2012) Jarvinen, K., Blondeau, C., Page, D., Tunstall, M.: Harnessing biased faults in attacks on ECC-based signature schemes. FDTC, pp. 72–82 (2012)
27.
Zurück zum Zitat Joye, M., Manet, P., Rigaud, J.: Strengthening hardware AES implementations against fault attack. IET Inf. Sec. 1, 106–110 (2007)CrossRef Joye, M., Manet, P., Rigaud, J.: Strengthening hardware AES implementations against fault attack. IET Inf. Sec. 1, 106–110 (2007)CrossRef
28.
Zurück zum Zitat Kaminsky, A., Kurdziel, M., Radziszowski, S.: An overview of cryptanalysis research for the advanced encryption standard. MILCOM, pp. 1310–1316 (2010) Kaminsky, A., Kurdziel, M., Radziszowski, S.: An overview of cryptanalysis research for the advanced encryption standard. MILCOM, pp. 1310–1316 (2010)
29.
Zurück zum Zitat Karaklajić, D., Schmidt, J.M., Verbauwhede, I.: Hardware designer’s guide to fault attacks. IEEE Trans. VLSI 21(12), 2295–2306 (2013)CrossRef Karaklajić, D., Schmidt, J.M., Verbauwhede, I.: Hardware designer’s guide to fault attacks. IEEE Trans. VLSI 21(12), 2295–2306 (2013)CrossRef
30.
Zurück zum Zitat Karpovsky, M., Kulikowski, K.J., Taubin, A.: Robust protection against fault-injection attacks of smart cards implementing the advanced encryption standard. DNS, pp. 93–101 (2004) Karpovsky, M., Kulikowski, K.J., Taubin, A.: Robust protection against fault-injection attacks of smart cards implementing the advanced encryption standard. DNS, pp. 93–101 (2004)
31.
Zurück zum Zitat Karri, R., Wu, K., Mishra, P., Kim, Y.: Concurrent error detection schemes of fault based side-channel cryptanalysis of symmetric block ciphers. IEEE Trans. CAD 21(12), 1509–1517 (2002)CrossRef Karri, R., Wu, K., Mishra, P., Kim, Y.: Concurrent error detection schemes of fault based side-channel cryptanalysis of symmetric block ciphers. IEEE Trans. CAD 21(12), 1509–1517 (2002)CrossRef
32.
Zurück zum Zitat Khelil, F., Hamdi, M., Guilley, S., Danger, J.L., Selmane, N.: Fault analysis attack on an aes fpga implementation. In: Proc. New Technologies, Mobility and Security, pp. 1–5 (2008) Khelil, F., Hamdi, M., Guilley, S., Danger, J.L., Selmane, N.: Fault analysis attack on an aes fpga implementation. In: Proc. New Technologies, Mobility and Security, pp. 1–5 (2008)
33.
Zurück zum Zitat Kim, C.H.: Differential fault analysis against AES-192 and AES-256 with minimal faults. FDTC, pp. 3–9 (2010) Kim, C.H.: Differential fault analysis against AES-192 and AES-256 with minimal faults. FDTC, pp. 3–9 (2010)
34.
Zurück zum Zitat Lashermes, R., Reymond, G., Dutertre, J., Fournier, J., Robisson, B., Tria, A.: A DFA on AES based on the entropy of error distributions. FDTC, pp. 34–43 (2012) Lashermes, R., Reymond, G., Dutertre, J., Fournier, J., Robisson, B., Tria, A.: A DFA on AES based on the entropy of error distributions. FDTC, pp. 34–43 (2012)
35.
Zurück zum Zitat Li, Y., Sakiyama, K., Gomisawa, S., Fukunaga, T., Takahashi, J., Ohta, K.: Fault sensitivity analysis. In: Proc. CHES, pp. 320–334 (2010) Li, Y., Sakiyama, K., Gomisawa, S., Fukunaga, T., Takahashi, J., Ohta, K.: Fault sensitivity analysis. In: Proc. CHES, pp. 320–334 (2010)
36.
Zurück zum Zitat Mozaffari-Kermani, M., Reyhani-Masoleh, A.: Concurrent structure-independent fault detection schemes for the advanced encryption standard. IEEE Trans. Comput. 59(5), 608–622 (2010) Mozaffari-Kermani, M., Reyhani-Masoleh, A.: Concurrent structure-independent fault detection schemes for the advanced encryption standard. IEEE Trans. Comput. 59(5), 608–622 (2010)
37.
Zurück zum Zitat Maistri, P.: Countermeasures against fault attacks: the good, the bad, and the ugly. IOLTS, pp. 134–137 (2011) Maistri, P.: Countermeasures against fault attacks: the good, the bad, and the ugly. IOLTS, pp. 134–137 (2011)
38.
Zurück zum Zitat Maistri, P., Leveugle, R.: Double-data-rate computation as a countermeasure against fault analysis. IEEE Trans. Comput. 57(11), 1528–1539 (2008)MathSciNetCrossRef Maistri, P., Leveugle, R.: Double-data-rate computation as a countermeasure against fault analysis. IEEE Trans. Comput. 57(11), 1528–1539 (2008)MathSciNetCrossRef
39.
Zurück zum Zitat Malkin, T., Standaert, F.X., Yung, M.: A comparative cost/security analysis of fault attack countermeasures. FDTC, pp. 109–123 (2005) Malkin, T., Standaert, F.X., Yung, M.: A comparative cost/security analysis of fault attack countermeasures. FDTC, pp. 109–123 (2005)
40.
Zurück zum Zitat Metra, C., Schiano, L., Favalli, M.: Concurrent detection of power supply noise. IEEE Trans. Reliab. 52(4), 469–475 (2003)CrossRef Metra, C., Schiano, L., Favalli, M.: Concurrent detection of power supply noise. IEEE Trans. Reliab. 52(4), 469–475 (2003)CrossRef
41.
Zurück zum Zitat Moradi, A., Shalmani, M.T.M., Salmasizadeh, M.: A generalized method of differential fault attack against AES cryptosystem. In: Proc. CHES, pp. 91–100 (2006) Moradi, A., Shalmani, M.T.M., Salmasizadeh, M.: A generalized method of differential fault attack against AES cryptosystem. In: Proc. CHES, pp. 91–100 (2006)
42.
Zurück zum Zitat Mozaffari-Kermani, M., Reyhani-Masoleh, A.: A lightweight high-performance fault detection scheme for the advanced encryption standard using composite field. IEEE Trans. VLSI 19(1), 85–91 (2011)CrossRef Mozaffari-Kermani, M., Reyhani-Masoleh, A.: A lightweight high-performance fault detection scheme for the advanced encryption standard using composite field. IEEE Trans. VLSI 19(1), 85–91 (2011)CrossRef
43.
Zurück zum Zitat Mukhopadhyay, D.: An improved fault based attack of the advanced encryption standard. AFRICACRYPT, pp. 421–434 (2009) Mukhopadhyay, D.: An improved fault based attack of the advanced encryption standard. AFRICACRYPT, pp. 421–434 (2009)
45.
Zurück zum Zitat Dusart, P., L, G., Vivolo, O.: Differential fault analysis on AES. Cryptology ePrint Archive (2003) Dusart, P., L, G., Vivolo, O.: Differential fault analysis on AES. Cryptology ePrint Archive (2003)
46.
Zurück zum Zitat Piret, G., Quisquater, J.: A differential fault attack technique against spn structures, with application to the AES and Khazad. In: Proc. CHES, pp. 77–88 (2003) Piret, G., Quisquater, J.: A differential fault attack technique against spn structures, with application to the AES and Khazad. In: Proc. CHES, pp. 77–88 (2003)
47.
Zurück zum Zitat Saha, D., Mukhopadhyay, D., Chowdhury, D.R.: A diagonal fault attack on the advanced encryption standard. IACR Cryptology ePrint Archive, p. 581 (2009) Saha, D., Mukhopadhyay, D., Chowdhury, D.R.: A diagonal fault attack on the advanced encryption standard. IACR Cryptology ePrint Archive, p. 581 (2009)
48.
Zurück zum Zitat Sakiyama, K., Li, Y., Ohta, K., Iwamoto, M.: Information-theoretic approach to optimal differential fault analysis. IEEE Trans. Inf. Forensics Secur. 7(1), 109–120 (2012)CrossRef Sakiyama, K., Li, Y., Ohta, K., Iwamoto, M.: Information-theoretic approach to optimal differential fault analysis. IEEE Trans. Inf. Forensics Secur. 7(1), 109–120 (2012)CrossRef
49.
Zurück zum Zitat Satoh, A., Sugawara, T., Homma, N., Aoki, T.: High-performance concurrent error detection scheme for AES hardware. In: Proc. CHES, pp. 100–112 (2008) Satoh, A., Sugawara, T., Homma, N., Aoki, T.: High-performance concurrent error detection scheme for AES hardware. In: Proc. CHES, pp. 100–112 (2008)
50.
Zurück zum Zitat Selmane, N., Bhasin, S., Guilley, S., Graba, T., Danger, J.L.: WDDL is protected against setup time violation attacks. FDTC, pp. 73–83 (2009) Selmane, N., Bhasin, S., Guilley, S., Graba, T., Danger, J.L.: WDDL is protected against setup time violation attacks. FDTC, pp. 73–83 (2009)
51.
Zurück zum Zitat Selmane, N., Guilley, S., Danger, J.L.: Practical setup time violation attacks on aes. EDCC, pp. 91–96 (2008) Selmane, N., Guilley, S., Danger, J.L.: Practical setup time violation attacks on aes. EDCC, pp. 91–96 (2008)
52.
Zurück zum Zitat Takahashi, J., Fukunaga, T., Yamakoshi, K.: DFA mechanism on the AES key schedule. FDTC, pp. 62–74 (2007) Takahashi, J., Fukunaga, T., Yamakoshi, K.: DFA mechanism on the AES key schedule. FDTC, pp. 62–74 (2007)
53.
Zurück zum Zitat Tunstall, M., Mukhopadhyay, D., Ali, S.: Differential fault analysis of the advanced encryption standard using a single fault. WISTP, pp. 224–233 (2011) Tunstall, M., Mukhopadhyay, D., Ali, S.: Differential fault analysis of the advanced encryption standard using a single fault. WISTP, pp. 224–233 (2011)
54.
Zurück zum Zitat Wu, K., Karri, R., Kuznetsov, G., Goessel, M.: Low cost concurrent error detection for the advanced encryption standard. ITC, pp. 1242–1248 (2004) Wu, K., Karri, R., Kuznetsov, G., Goessel, M.: Low cost concurrent error detection for the advanced encryption standard. ITC, pp. 1242–1248 (2004)
56.
Zurück zum Zitat Yumbul, K., Erdem, S., Savas, E.: On selection of modulus of quadratic codes for the protection of cryptographic operations against fault attacks. IEEE Trans. Comput. (99), 1 (PP) (2012) Yumbul, K., Erdem, S., Savas, E.: On selection of modulus of quadratic codes for the protection of cryptographic operations against fault attacks. IEEE Trans. Comput. (99), 1 (PP) (2012)
Metadaten
Titel
Security analysis of concurrent error detection against differential fault analysis
verfasst von
Xiaofei Guo
Debdeep Mukhopadhyay
Chenglu Jin
Ramesh Karri
Publikationsdatum
01.09.2015
Verlag
Springer Berlin Heidelberg
Erschienen in
Journal of Cryptographic Engineering / Ausgabe 3/2015
Print ISSN: 2190-8508
Elektronische ISSN: 2190-8516
DOI
https://doi.org/10.1007/s13389-014-0092-8

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