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Erschienen in: Journal of Computational Electronics 4/2016

30.08.2016

Self-consistent quantum drift-diffusion model for multiple quantum well IMPATT diodes

verfasst von: Monisha Ghosh, Somrita Ghosh, Aritra Acharyya

Erschienen in: Journal of Computational Electronics | Ausgabe 4/2016

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Abstract

In this paper, the authors have presented a self-consistent quantum drift-diffusion model for multiple quantum well (MQW) impact avalanche transit time (IMPATT) diodes. The bound states in MQWs have been taken into account by self-consistent solutions of the coupled classical drift-diffusion (CLDD) equations and time-independent Schrödinger equations associated with both the conduction and valence bands. The static and high-frequency properties of MQW DDR IMPATTs based on Si\(\sim \)3C-SiC material system designed to operate near 94-GHz atmospheric window have been studied by means of the above-mentioned self-consistent solutions of coupled CLDD equations and Schrödinger equations followed by a well-established double-iterative field maximum computational technique. A symmetric and two complementary asymmetric doping profiles for the proposed structures have been taken into account for the present study. The RF power outputs of Si\(\sim \)3C-SiC MQW DDR IMPATTs near 94 GHz obtained from the simulation are compared with the experimentally obtained power outputs of flat DDR IMPATT diodes based on Si, GaAs, and InP at the same frequency band. It is observed that Si\(\sim \)3C-SiC MQW DDR IMPATTs are capable of delivering significantly higher RF power compared with IMPATTs based on the above-mentioned materials especially when the doping concentrations of 3C-SiC layers are kept higher than those of the Si layers.

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Metadaten
Titel
Self-consistent quantum drift-diffusion model for multiple quantum well IMPATT diodes
verfasst von
Monisha Ghosh
Somrita Ghosh
Aritra Acharyya
Publikationsdatum
30.08.2016
Verlag
Springer US
Erschienen in
Journal of Computational Electronics / Ausgabe 4/2016
Print ISSN: 1569-8025
Elektronische ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-016-0894-2

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