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Semiconductors

Ausgabe 13/2016

Inhalt (13 Artikel)

Materials for Electronic Engineering

Interaction of electromagnetic radiation with magnetically functionalized CNT nanocomposite in the subterahertz frequency range

A. Atdaev, A. L. Danilyuk, V. A. Labunov, S. L. Prischepa, A. A. Pavlov, A. S. Basaev, Yu. P. Shaman

Materials for Electronic Engineering

Method of investigation of galvanomagnetic properties of Cd x Hg1 − x Te and Cd x Hg1 − x Te/Cd1 − y Zn y Te

V. A. Golubyatnikov, A. P. Lysenko, A. G. Belov, V. E. Kanevskii

Microelectronic and Nanoelectronic Technology

Effect of ionic Ag+ transfer on localization of metal-assisted etching of silicon surface

O. V. Pyatilova, A. V. Sysa, S. A. Gavrilov, L. V. Yakimova, A. A. Pavlov, A. N. Belov, A. A. Raskin

Microelectronic and Nanoelectronic Technology

Formation of field-emission emitters by microwave plasma-chemical synthesis of nanocarbon structures

R. K. Yafarov, E. S. Gornev, S. N. Orlov, S. P. Timoshenkov, V. P. Timoshenkov, A. S. Timoshenkov

Microelectronic Devices and Systems

Methods for suppressing optical crosstalk between the cells of a silicon photomultiplier array

A. A. Zhukov, E. V. Popova, N. N. Gerasimenko

Nanotechnology

Surface functionalization of single-layer and multilayer graphene upon ultraviolet irradiation

D. D. Levin, I. I. Bobrinetskiy, A. V. Emelianov, V. K. Nevolin, A. V. Romashkin, V. A. Petuhov

Nanotechnology

Nanostructured current sources based on carbon nanotubes excited by β radiation

A. N. Saurov, S. V. Bulyarskiy, V. D. Risovaniy, A. A. Pavlov, I. E. Abanin, E. P. Kitsyuk, A. A. Shamanaev, E. A. Lebedev

Nanotechnology

Formation of carbon nanotubes on an amorphous Ni25Ta58N17 alloy film by chemical vapor deposition

D. G. Gromov, S. V. Dubkov, A. A. Pavlov, S. N. Skorik, A. Yu. Trifonov, E. P. Kirilenko, A. S. Shulyat’ev, Yu. P. Shaman, B. N. Rygalin

Methods and Technique of Measurements

Study of the structure and composition of the strained epitaxial layer in the InAlAs/GaAs(100) heterostructure by transmission electron microscopy

M. V. Lovygin, N. I. Borgardt, A. S. Bugaev, R. L. Volkov, M. Seibt

Methods and Technique of Measurements

Measurements of electrophysical characteristics of semiconductor structures with the use of microwave photonic crystals

D. A. Usanov, S. A. Nikitov, A. V. Skripal, D. V. Ponomarev, E. V. Latysheva

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