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Semiconductors

Ausgabe 2/2019

Inhalt (25 Artikel)

REVIEW

Indium Arsenide-Based Spontaneous Emission Sources (Review: a Decade Later)

S. A. Karandashev, B. A. Matveev, M. A. Remennyi

ELECTRONIC PROPERTIES OF SEMICONDUCTORS

Features of the Properties of Rare-Earth Semiconductors

V. V. Kaminski, N. V. Sharenkova

ELECTRONIC PROPERTIES OF SEMICONDUCTORS

Influence of Annealing Temperature on Electrically Active Centers in Silicon Implanted with Germanium Ions

N. A. Sobolev, O. V. Aleksandrov, V. I. Sakharov, I. T. Serenkov, E. I. Shek, A. E. Kalyadin, E. O. Parshin, N. S. Melesov

SPECTROSCOPY, INTERACTION WITH RADIATION

Dislocation-Related Photoluminescence in Silicon Implanted with Germanium Ions

N. A. Sobolev, A. E. Kalyadin, V. I. Sakharov, I. T. Serenkov, E. I. Shek, E. O. Parshin, N. S. Melesov, C. G. Simakin

SURFACES, INTERFACES, AND THIN FILMS

Laser Annealing of Thin ITO Films on Flexible Organic Substrates

L. S. Parshina, O. A. Novodvorsky, O. D. Khramova, A. A. Lotin, M. D. Khomenko, P. A. Shchur

SURFACES, INTERFACES, AND THIN FILMS

Structural, Optical, and Photosensitive Properties of PbS Films Deposited in the Presence of CaCl2

L. N. Maskaeva, E. V. Mostovshchikova, V. F. Markov, V. I. Voronin

SURFACES, INTERFACES, AND THIN FILMS

Technique for the Formation of Antireflection Coatings Based on ITO Films

L. K. Markov, A. S. Pavluchenko, I. P. Smirnova

SURFACES, INTERFACES, AND THIN FILMS

Photoelectric Properties of GaN Layers Grown by Plasma-Assisted Molecular-Beam Epitaxy on Si(111) Substrates and SiC/Si(111) Epitaxial Layers

S. A. Kukushkin, A. M. Mizerov, A. S. Grashchenko, A. V. Osipov, E. V. Nikitina, S. N. Timoshnev, A. D. Bouravlev, M. S. Sobolev

SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA

Electronic Excitation Energy Transfer in an Array of CdS Quantum Dots on a Quasi-Two-Dimensional Surface

N. V. Bondar, M. S. Brodyn, N. A. Matveevskaya, T. G. Beynik

SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA

Plasmon Enhancement of the Electric Field in Mid-Infrared Ge/Si Quantum-Dot Photodetectors with Different Thicknesses of the Active Region

A. A. Bloshkin, A. I. Yakimov, A. V. Dvurechenskii

SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA

Lateral Mode Discrimination in Edge-Emitting Lasers with Spatially Modulated Facet Reflectance

N. Yu. Gordeev, A. S. Payusov, I. S. Mukhin, A. A. Serin, M. M. Kulagina, Yu. A. Guseva, Yu. M. Shernyakov, Yu. M. Zadiranov, M. V. Maximov

SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA

Silicon Nanopillar Microarrays: Formation and Resonance Reflection of Light

L. S. Basalaeva, Yu. V. Nastaushev, F. N. Dultsev, N. V. Kryzhanovskaya, E. I. Moiseev

MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS

Influence of Electric Field on the Activation Energy of Local Levels in Semiconductors with Layered (GaSe) and Cubic (Ga2Se3) Structures

A. M. Pashayev, B. H. Tagiyev, O. B. Tagiyev, V. T. Majidova, I. Z. Sadikhov

MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS

Effect of Praseodymium and Lanthanum Substitution for Bismuth on the Thermoelectric Properties of BiCuSeO Oxyselenides

A. P. Novitskii, I. A. Serhiienko, S. V. Novikov, K. V. Kuskov, D. V. Leybo, D. S. Pankratova, A. T. Burkov, V. V. Khovaylo

MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS

Thermoresistive Semiconductor SiC/Si Composite Material

S. K. Brantov, E. B. Yakimov

MICROCRYSTALLINE, NANOCRYSTALLINE, POROUS, AND COMPOSITE SEMICONDUCTORS

Optical Properties of Polyethylene Filled with Bi2Te3 Nanocrystallites

A. Yu. Gamzayeva, E. G. Alizade, N. T. Mamedov, N. A. Abdullayev, I. R. Amiraslanov, Y. N. Aliyeva, Kh. N. Akhmedova, G. H. Azhdarov, K. Sh. Kahramanov, S. A. Nemov

PHYSICS OF SEMICONDUCTOR DEVICES

Features of MIS Structures with Samarium Fluoride on Silicon and Germanium Substrates

M. B. Shalimova, N. V. Sachuk

PHYSICS OF SEMICONDUCTOR DEVICES

Effect of the Hydrogen Concentration on the Pd/n-InP Schottky Diode Photocurrent

E. A. Grebenshchikova, V. G. Sidorov, V. A. Shutaev, Yu. P. Yakovlev

FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES

Low-Temperature Ta/Al-Based Ohmic Contacts to AlGaN/GaN Heteroepitaxial Structures on Silicon Wafers

E. V. Erofeev, I. V. Fedin, V. V. Fedina, A. P. Fazleev

FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES

Anodic Oxidation of Hydrogen-Transferred Silicon-on-Insulator Layers

I. E. Tyschenko, I. V. Popov, E. V. Spesivtsev

FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES

Electrical and Photoluminescence Studies of {LT-GaAs/GaAs:Si} Superlattices Grown by MBE on (100)- and (111)A-Oriented GaAs Substrates

G. B. Galiev, E. A. Klimov, A. N. Klochkov, V. B. Kopylov, S. S. Pushkarev

FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES

Effect of the Temperature of Photonic Annealing on the Structural and Optical Properties of ZnO Films Synthesized by Dual Magnetron-Assisted Sputtering

S. V. Zaitsev, V. S. Vaschilin, V. V. Kolesnik, M. V. Limarenko, D. S. Prokhorenkov, E. I. Evtushenko

FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES

On the Possibility of Manufacturing Strained InAs/GaSb Superlattices by the MOCVD Method

R. V. Levin, V. N. Nevedomskyi, N. L. Bazhenov, G. G. Zegrya, B. V. Pushnyi, M. N. Mizerov

FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES

Oxide Removal from the InSb Plate Surface to Produce Lateral Spin Valves

N. A. Viglin, I. V. Gribov, V. M. Tsvelikhovskaya, E. I. Patrakov

FABRICATION, TREATMENT, AND TESTING OF MATERIALS AND STRUCTURES

Technique for the Electrochemical Capacitance–Voltage Profiling of Heavily Doped Structures with a Sharp Doping Profile

D. S. Frolov, G. E. Yakovlev, V. I. Zubkov

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