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Semiconductors

Ausgabe 4/2007

Inhalt (26 Artikel)

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

In-depth resolution for LBIC technique by two-photon absorption

D. Wan, V. Pouget, A. Douin, P. Jaulent, D. Lewis, P. Fouillat

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Structural peculiarities of 4H-SiC irradiated by Bi ions

E. V. Kalinina, V. A. Skuratov, A. A. Sitnikova, E. V. Kolesnikova, A. S. Tregubova, M. P. Shcheglov

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Si and Ge nanocluster formation in silica matrix

Roushdey Salh, L. Fitting, E. V. Kolesnikova, A. A. Sitnikova, M. V. Zamoryanskaya, B. Schmidt, H. -J. Fitting

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Cathodoluminescence and TEM studies of HVPE GaN layers grown on porous SiC substrates

E. Kolesnikova, M. Mynbaeva, A. Sitnikova

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Cathodoluminescence investigation of silicon nanowires fabricated by thermal evaporation of SiO

G. Jia, T. Arguirov, M. Kittler, Z. Su, D. Yang, J. Sha

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

IBIC characterization of charge transport in CdTe:Cl

P. J. Sellin, A. W. Davies, F. Boroumand, A. Lohstroh, M. E. Özsan, J. Parkin, M. Veale

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

EBIC characterization of strained Si/SiGe heterostructures

E. B. Yakimov, R. H. Zhang, G. A. Rozgonyi, M. Seacrist

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Simulation and measurements of EBIC images of photoconductive elements based on HgCdTe

V. V. Krapukhin, P. S. Vergeles, E. B. Yakimov

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

EBIC measurements of small diffusion length in semiconductor structures

E. B. Yakimov, S. S. Borisov, S. I. Zaitsev

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Photoinduced transient spectroscopy of defect centers in GaN and SiC

P. Kamiński, R. Kozłowski, M. Kozubal, J. Żelazko, M. Miczuga, M. Pawłowski

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Micro-and nano-structures in silicon studied by DLTS and scanning probe methods

D. Cavalcoli, A. Cavallini, M. Rossi, S. Pizzini

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

The use of cathodoluminescence for the development of durable self-glowing crystals based on solid solutions YPO4-EuPO4

B. E. Burakov, V. M. Garbuzov, A. A. Kitsay, V. A. Zirlin, M. A. Petrova, Ya. V. Domracheva, M. V. Zamoryanskaya, E. V. Kolesnikova, M. A. Yagovkina, M. P. Orlova

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

STM and LEED studies of atomically ordered terraced Si(557) surfaces

A. N. Chaika, S. I. Bozhko, A. M. Ionov, A. N. Myagkov, N. V. Abrosimov

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Photoluminescence study on defects in multicrystalline silicon

T. Arguirov, W. Seifer, G. Jia, M. Kittler

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Material-induced shunts in multicrystalline silicon solar cells

O. Breitenstein, J. Bauer, J. P. Rakotoniaina

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Mathematical simulation of the distribution of minority charge carriers generated in a multilayer semiconducting structure by a wide electron beam

I. V. Burylova, V. I. Petrov, M. G. Snopova, M. A. Stepovich

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Initial stages of gold adsorption on silicon stepped surface at elevated temperatures

S. S. Kosolobov, Se Ahn Song, E. E. Rodyakina, A. V. Latyshev

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Multimodal luminescence spectra of ion-implanted silica

H. -J. Fitting, Roushdey Salh, B. Schmidt

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bonding

X. Yu, O. Vyvenko, M. Kittler, W. Seifert, T. Mtchedlidze, T. Arguirov, M. Reiche

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Cathodoluminescence study of silicon oxide-silicon interface

M. V. Zamoryanskaya, V. I. Sokolov

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

AFM investigation of thin post-baked photoresistive films for microsystem technology application

S. E. Alexandrov, A. B. Speshilova, Y. V. Soloviev, O. I. Ermeychik

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Cathodoluminescence characteristics of pseudomorphic modulation-doped quantum well AlGaAs/InGaAs/AlGaAs heterostructures at high carrier densities and their radiation damaging

V. S. Khrustalev, A. V. Bobyl, S. G. Konnikov, N. A. Maleev, M. V. Zamoryanskaya

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Cathodoluminescence of laser AIIBVI heterostructures

A. S. Ivanov, V. I. Vasilev, I. V. Sedova, S. V. Sorokin, A. A. Sitnikova, S. G. Konnikov, T. B. Popova, M. V. Zamoryanskaya

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Evolution of luminescence properties of natural oxide on silicon and porous silicon

R. V. Sokolov, M. V. Zamoryanskaya, E. V. Kolesnikova, V. I. Sokolov

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

Diagnostics of films and layers of nanometer thickness using middle energy ion scattering technique

V. V. Afrosimov, R. N. Il’in, V. I. Sakharov, I. T. Serenkov

The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, June 11–14, 2006, St. Petersburg, Russia

EBIC characterization of light-emitting structures based on GaN

N. M. Shmidt, P. S. Vergeles, E. B. Yakimov

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