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Semiconductors

Ausgabe 8/2009

Inhalt (25 Artikel)

Atomic Structure and Nonelectronic Propertties of Semiconductors

Optimum composition of a Bi2Te3 − x Se x alloy for the n-type leg of a thermoelectric generator

L. V. Prokofieva, D. A. Pshenay-Severin, P. P. Konstantinov, A. A. Shabaldin

Atomic Structure and Nonelectronic Propertties of Semiconductors

Thermoelectric figure of merit of Ag2Se with Ag and Se excess

F. F. Aliev, M. B. Jafarov, V. I. Eminova

Electrical and Optical Properties of Semiconductors

Specific features of recombination processes in CdTe films produced in different temperature conditions of growth and subsequent annealing

I. B. Ermolovich, V. V. Milenin, R. A. Red’ko, S. M. Red’ko

Electrical and Optical Properties of Semiconductors

Spin-lattice relaxation of 113Cd and 19F nuclear spins in the crystal lattice of CdF2 semiconductor crystals with DX centers

S. A. Kazanskii, W. W. Warren Jr., A. I. Ryskin

Semiconductor Structures, Interfaces, and Surfaces

Photoelectric properties of a sandwich structure composed of films synthesized under highly nonequilibrium conditions

A. P. Belyaev, V. P. Rubets, Kh. A. Toshkhodzhaev

Low-Dimensional Systems

Lateral photoconductivity of multilayer Ge/Si structures with Ge quantum dots

A. B. Talochkin, I. B. Chistokhin, V. A. Markov

Low-Dimensional Systems

Luminescence in quantum-confined cadmium selenide nanocrystals and nanorods in external electric fields

L. I. Gurinovich, A. A. Lutich, A. P. Stupak, S. Ya. Prislopsky, E. K. Rusakov, M. V. Artemyev, S. V. Gaponenko, H. V. Demir

Amorphous, Vitreous, Porous, Organic, and Microcrystalline Semiconductors; Semiconductor Composites

Photoluminescence of ZnO infiltrated into a three-dimensional photonic crystal

A. N. Gruzintsev, G. A. Emelchenko, V. M. Masalov

Physics of Semiconductor Devices

Dependence of the efficiency of a CdS/CdTe solar cell on the absorbing layer’s thickness

L. A. Kosyachenko, A. I. Savchuk, E. V. Grushko

Physics of Semiconductor Devices

Cooperative effects in the case of pulsed self-heating of a p-i-n diode

A. V. Gorbatyuk, F. B. Serkov

Physics of Semiconductor Devices

Dielectric waveguide for middle and far infrared radiation

N. S. Averkiev, S. O. Slipchenko, Z. N. Sokolova, I. S. Tarasov

Physics of Semiconductor Devices

Non-volatile memory based on silicon nanoclusters

Yu. N. Novikov

Physics of Semiconductor Devices

Flexible solar cells based on cadmium sulfide and telluride

G. S. Khrypunov, E. P. Chernykh, N. A. Kovtun, E. K. Belonogov

Physics of Semiconductor Devices

Charge transport in 4H-SiC detector structures under conditions of a high electric field

A. M. Ivanov, M. G. Mynbaeva, A. V. Sadokhin, N. B. Strokan, A. A. Lebedev

Physics of Semiconductor Devices

Fast pulsed gallium arsenide heterostructure diodes

V. G. Danil’chenko, V. I. Korol’kov, F. Yu. Soldatenkov

Fabrication, Treatment, and Testing of Materials and Structures

Features of molecular beam epitaxy of the GaN (0001) and GaN (000) layers with the use of different methods of activation of nitrogen

A. M. Mizerov, V. N. Jmerik, V. K. Kaibyshev, T. A. Komissarova, S. A. Masalov, S. V. Ivanov

Fabrication, Treatment, and Testing of Materials and Structures

Effect of parameters of narrow-gap inclusions on the type and intensity of secondary-ion photoeffect in heterophase photosensitive semiconductors

S. V. Stetsyura, I. V. Malyar, A. A. Serdobintsev, S. A. Klimova

Fabrication, Treatment, and Testing of Materials and Structures

Fractal geometry of the surface potential in electrochemically deposited platinum and palladium films

N. A. Torkhov, V. A. Novikov

Fabrication, Treatment, and Testing of Materials and Structures

High-resolution X-ray diffraction studies of the GaAs structures grown at a low temperature and periodically δ-doped with antimony and phosphorus

V. V. Chaldyshev, M. A. Yagovkina, M. V. Baidakova, V. V. Preobrazhenskii, M. A. Putyato, B. R. Semyagin

Fabrication, Treatment, and Testing of Materials and Structures

Properties of GaN(SiC)-(Ti, Zr)B x contacts subjected to rapid thermal annealing

A. E. Belyaev, N. S. Boltovets, V. N. Ivanov, R. V. Konakova, V. P. Kladko, Ya. Ya. Kudryk, A. A. Lebedev, V. V. Milenin, V. N. Sheremet

Fabrication, Treatment, and Testing of Materials and Structures

Possibility of obtaining the (GaSb)1 − x (Si2) x films on silicon substrates by the method of liquid-phase epitaxy

Sh. N. Usmonov, A. S. Saidov, A. Yu. Leyderman, D. Saparov, K. T. Kholikov

Fabrication, Treatment, and Testing of Materials and Structures

The effects of the porous buffer layer and doping with dysprosium on internal stresses in the GaInP:Dy/por-GaAs/GaAs(100) heterostructures

P. V. Seredin, N. N. Gordienko, A. V. Glotov, I. A. Zhurbina, E. P. Domashevskaya, I. N. Arsent’ev, M. V. Shishkov

Fabrication, Treatment, and Testing of Materials and Structures

Specific features of the epitaxial growth of narrow-gap InSb quantum dots on an InAs substrate

K. D. Moiseev, Ya. A. Parkhomenko, E. V. Gushchina, A. V. Ankudinov, V. P. Mikhailova, N. A. Bert, Yu. P. Yakovlev

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