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Semiconductors

Ausgabe 8/2014

Inhalt (23 Artikel)

Electronic Properties of Semiconductors

Effect of light on the mobility of free carriers in indium-monoselenide crystals

A. Sh. Abdinov, R. F. Babayeva, S. I. Amirova, N. A. Ragimova, R. M. Rzayev

Electronic Properties of Semiconductors

Specific features of magnetoresistance in overcompensated manganese-doped silicon

M. K. Bakhadirkhanov, G. H. Mavlonov, X. M. Iliev, K. S. Ayupov, O. E. Sattarov, C. A. Tachilin

Electronic Properties of Semiconductors

Deformation paramagnetic defects in Fz-29Si:P crystals

O. V. Koplak, A. I. Dmitriev, S. G. Vasiliev, E. A. Shteinmann, S. I. Alekseev, R. B. Morgunov

Electronic Properties of Semiconductors

Study of a deep donor level in n-GaAs by electron transport data obtained under hydrostatic pressure

M. I. Daunov, U. Z. Zalibekov, I. K. Kamilov, A. Yu. Mollaev

Electronic Properties of Semiconductors

Effect of interband scattering on transport phenomena in p-PbSb2Te4

S. A. Nemov, N. M. Blagikh, M. B. Dzhafarov

Electronic Properties of Semiconductors

Conductivity compensation in n-4H-SiC (CVD) under irradiation with 0.9-MeV electrons

V. V. Kozlovski, A. A. Lebedev, V. N. Lomasov, E. V. Bogdanova, N. V. Seredova

Electronic Properties of Semiconductors

DFT modeling of Mn charged states in Ga1 − x Mn x As diluted ferromagnetic semiconductors: The cluster approach

I. V. Krauklis, O. Yu. Podkopaeva, Yu. V. Chizhov

Electronic Properties of Semiconductors

On the phonon-assisted relaxation of excited bismuth donor states in uniaxially stressed silicon

V. V. Tsyplenkov, R. Kh. Zhukavin, V. N. Shastin

Spectroscopy, Interaction with Radiation

Properties of nanostructured Al doped ZnO thin films grown by spray pyrolysis technique

N. Sadananda Kumar, Kasturi V. Bangera, G. K. Shivakumar

Spectroscopy, Interaction with Radiation

Characterization of porous silicon carbide according to absorption and photoluminescence spectra

N. I. Berezovska, Yu. Yu. Bacherikov, R. V. Konakova, O. B. Okhrimenko, O. S. Lytvyn, L. G. Linets, A. M. Svetlichnyi

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Influence of GaAs spacer-layer thickness on quantum coupling and optical polarization in a ten-layer system of vertically correlated InAs/GaAs quantum dots

M. M. Sobolev, I. M. Gadzhiyev, M. S. Buyalo, V. N. Nevedomskiy, Yu. M. Zadiranov, R. V. Zolotareva, A. P. Vasil’ev, V. M. Ustinov

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

On the process of hole trapping in Ge/Si heterostructures with Ge quantum dots

A. A. Bloshkin, A. I. Yakimov, V. A. Timofeev, A. V. Dvurechenskii

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Variations in the electrical properties of silicon MOS structures with a nanodimensional silicon oxide under the effect of water vapors

P. P. Fastykovsky, M. A. Glauberman

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Electrical properties of thin-film semiconductor heterojunctions n-TiO2/p-CuInS2

V. V. Brus, I. G. Orletsky, M. I. Ilashchuk, P. D. Maryanchuk

Amorphous, Vitreous, and Organic Semiconductors

On the detection of U − centers in g-As2Se3 films by thermal cycling measurements of electrical conductivity

K. N. Egarmin, E. M. Eganova, E. N. Voronkov

Physics of Semiconductor Devices

On the picosecond switching of a high-density current (60 kA/cm2) via a Si closing switch based on a superfast ionization front

A. I. Gusev, S. K. Lyubutin, S. N. Rukin, B. G. Slovikovsky, S. N. Tsyranov

Fabrication, Treatment, and Testing of Materials and Structures

On the nature of cracks using single-crystalline silicon subjected to anodic etching as an example

N. N. Gerasimenko, K. B. Tynyshtykbaev, V. V. Starkov, N. A. Medetov, S. Zh. Tokmoldin, E. A. Gosteva

Fabrication, Treatment, and Testing of Materials and Structures

Structural and optical properties of heavily doped Al x Ga1 − x As1 − y P y :Mg alloys produced by metal-organic chemical vapor deposition

P. V. Seredin, A. S. Lenshin, A. V. Glotov, I. N. Arsentyev, D. A. Vinokurov, I. S. Tarasov, T. Prutskij, H. Leiste, M. Rinke

Fabrication, Treatment, and Testing of Materials and Structures

Study of postgrowth processing in the fabrication of quantum-cascade lasers

V. V. Mamutin, N. D. Ilyinskaya, D. A. Bedarev, R. V. Levin, B. V. Pushnyi

Fabrication, Treatment, and Testing of Materials and Structures

Quantitative calibration and germanium SIMS depth profiling in Ge x Si1 − x /Si heterostructures

M. N. Drozdov, Yu. N. Drozdov, A. V. Novikov, P. A. Yunin, D. V. Yurasov

Fabrication, Treatment, and Testing of Materials and Structures

Synthesis of compositionally different multicomponent metal-oxide films (SnO2) x (ZnO)1 − x (x = 1–0.5)

S. I. Rembeza, N. N. Kosheleva, E. S. Rembeza, T. V. Svistova, E. Yu. Plotnikova, E. Suvaci, E. Özel, G. Tuncolu, C. Açiksari

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