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1996 | OriginalPaper | Buchkapitel

Sequential Circuit Test Generation

verfasst von : Xinghao Chen, Michael L. Bushnell

Erschienen in: Efficient Branch and Bound Search with Application to Computer-Aided Design

Verlag: Springer US

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In general, digital circuits with storage capability, or “memory”, are called sequential circuits, while digital circuits without storage capability are called combinational circuits. The outputs of a sequential circuit not only depend on the current inputs, but also depend on the past conditions, or “history”, of the inputs. Sequential circuits are also called finite state machines (FSM’s).

Metadaten
Titel
Sequential Circuit Test Generation
verfasst von
Xinghao Chen
Michael L. Bushnell
Copyright-Jahr
1996
Verlag
Springer US
DOI
https://doi.org/10.1007/978-1-4613-1329-8_4

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