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Erschienen in:
Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends Kapitel lesen Erstes Kapitel lesen

2011 | OriginalPaper | Buchkapitel

2. Single Event Effects: Mechanisms and Classification

verfasst von : Rémi Gaillard

Erschienen in: Soft Errors in Modern Electronic Systems

Verlag: Springer US

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Abstract

Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become an increasing limitation of the reliability of electronic components, circuits, and systems, and have stimulated abundant past and undergoing work for improving our understanding and developing mitigation techniques. Therefore, compiling the knowledge cumulated in an abundant literature, and reporting the open issues and ongoing efforts, is a challenging task. Such a tentative should start by discussing the fundamental aspects of SEEs before reviewing the different steps that are necessary for creating comprehensive prediction models and developing efficient mitigation techniques.

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Vorheriges Kapitel Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends
Nächstes Kapitel JEDEC Standards on Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Errors
Fußnoten
1
The state where the quantity of a radioactive isotope remains constant because its production rate (due, e.g., to decay of a parent isotope) is equal to its decay rate.
 
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Metadaten
Titel
Single Event Effects: Mechanisms and Classification
verfasst von
Rémi Gaillard
Copyright-Jahr
2011
Verlag
Springer US
Buch
Soft Errors in Modern Electronic Systems

Print ISBN: 978-1-4419-6992-7

Electronic ISBN: 978-1-4419-6993-4

Copyright-Jahr: 2011

DOI
https://doi.org/10.1007/978-1-4419-6993-4_2

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