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Journal of Computational Electronics

Ausgabe 1/2014

Special Issue on Process Modeling

Inhalt (35 Artikel)

Introduction

Lourdes Pelaz

Challenges and opportunities for process modeling in the nanotechnology era

J. K. Lorenz, E. Baer, A. Burenkov, A. Erdmann, P. Evanschitzky, P. Pichler

Process modeling for advanced device technologies

S. M. Cea, S. Botelho, A. Chaudhry, P. Fleischmann, M. D. Giles, A. Grigoriev, A. Kaushik, P. H. Keys, H. W. Kennel, A. D. Lilak, R. Mehandru, M. Stettler, B. Voinov, N. Voynich, C. Weber, N. Zhavoronok

Modeling of junction formation in scaled Si devices

Taiji Noda, Christa Vrancken, Wilfried Vandervorst

Modeling of defects, dopant diffusion and clustering in silicon

Maria Aboy, I. Santos, L. Pelaz, L. A. Marqués, P. López

Modeling of laser annealing

G. Fisicaro, A. La Magna

Process modeling for doped regions formation on high efficiency crystalline silicon solar cells

Antonios Florakis, Tom Janssens, Jef Poortmans, Wilfried Vandervorst

Carrier scattering and impact ionization in bilayer graphene

M. Saeidmanesh, M. H. Ghadiry, M. Khaledian, M. J. Kiani, Razali Ismail

Transport study of gate and channel engineering on the surrounding-gate CNTFETs based on NEGF quantum theory

Wei Wang, Xiao Yang, Na Li, Guangran Xiao, Sitao Jiang, Chunping Xia, Yan Wang

Dual material gate junctionless tunnel field effect transistor

Punyasloka Bal, Bahniman Ghosh, Partha Mondal, M. W. Akram, Ball Mukund Mani Tripathi

A conservative finite difference scheme for Poisson–Nernst–Planck equations

Allen Flavell, Michael Machen, Bob Eisenberg, Julienne Kabre, Chun Liu, Xiaofan Li

Monte Carlo simulation of diffusive-to-ballistic transition in phonon transport

Kentaro Kukita, Indra Nur Adisusilo, Yoshinari Kamakura

A theoretical study of all optical clocked D flip flop using single micro-ring resonator

Jayanta Kumar Rakshit, Jitendra Nath Roy, Tanay Chattopadhyay

Discrete geometric approach for modelling quantization effects in nanoscale electron devices

Alan Paussa, Ruben Specogna, David Esseni, Francesco Trevisan

Signal integrity and propagation delay analysis using FDTD technique for VLSI interconnects

Devendra Kumar Sharma, Brajesh Kumar Kaushik, R. K. Sharma

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