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Journal of Electronic Testing

Ausgabe 1/2018

Inhalt (10 Artikel)

Editorial

Vishwani D. Agrawal

Vulnerability Analysis of Adder Architectures Considering Design and Synthesis Constraints

Mostafa Salehi, Ali Azarpeyvand, Armin Hajaboutalebi Aboutalebi

Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC

Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini

Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design

Toral Shah, Anzhela Matrosova, Masahiro Fujita, Virendra Singh

Exploring System Availability During Software-Based Self-Testing of Multi-core CPUs

Michael A. Skitsas, Chrysostomos A. Nicopoulos, Maria K. Michael

Automation of Test Program Synthesis for Processor Post-silicon Validation

Vasudevan Madampu Suryasarman, Santosh Biswas, Aryabartta Sahu

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