Ausgabe 2/2022
Inhalt (9 Artikel)
Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp Model
İshak Parlar, M. Nuri Almali
FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications
Dev Narayan Yadav, Phrangboklang Lyngton Thangkhiew, Kamalika Datta, Sandip Chakraborty, Rolf Drechsler, Indranil Sengupta
An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation
Shuo Cai, Binyong He, Sicheng Wu, Jin Wang, Weizheng Wang, Fei Yu
Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application
N. Siva Balan, B. S. Murugan
Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test Process
Huajie Huang, Junjie Dai, Long Dou, Junfu Liu, Yunpeng Liu, Taotao Chen, Tianxiang Wu, Junhui Li
Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive Optimization Algorithms
Bahman Arasteh, Seyed Mohamad Javad Hosseini
Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications
Shravani Chandaka, Balaji Narayanam