Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

Test Flow Selection for Stacked Integrated Circuits

Breeta SenGupta, Dimitar Nikolov, Assmitra Dash, Erik Larsson

Test Generation for Bridging Faults in Reversible Circuits Using Path-Level Expressions

Mousum Handique, Santosh Biswas, Jantindra Kumar Deka

Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements

Chung-Huang Yeh, Jwu E. Chen

An Efficient Wavelet Based Transient Current Test towards Detection of Data Retention Faults in SRAM

Princy P, N.M. Sivamangai

Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM

Shyue-Kung Lu, Hung-Kai Huang, Chun-Lung Hsu, Chi-Tien Sun, Kohei Miyase

16- Layer PCB Channel Design with Minimum Crosstalk and Optimization of VIA and TDR Analysis

A. Kavitha, Ch. Sekhararao Kaitepalli, J. N. Swaminathan, Shaik Ahemedali

Security Analysis and Improvement of the Pseudo-random Number Generator Based on Piecewise Logistic Map

Dragan Lambić

Hardware Trojan Detection Leveraging a Novel Golden Layout Model Towards Practical Applications

Yanjiang Liu, Jiaji He, Haocheng Ma, Yiqiang Zhao

Enhanced Authentication Using Hybrid PUF with FSM for Protecting IPs of SoC FPGAs

J. Kokila, N. Ramasubramanian

Connectivity Test for System in Package Interconnects

JungHo Kang, Kyungsoo Chae, Jaeyoun Jeong

Electromagnetic Parameters Measurement of Sheet Using Separate Microstrip Line

Yunpeng Zhang, En Li, Hu Zheng