Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, and Tiago Balen, “Evaluation of Single Event Upset Susceptibility of FinFET‑based SRAMs with Weak Resistive Defects,” Journal of Electronic Testing: Theory and Applications, Volume 37, Number 3, pp. 383–394, June 2021
