Ausgabe 6/2018
Inhalt (14 Artikel)
Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT
Xu Bai, Hui Hu, Wanjun Li, Fulu Liu
Generation Methodology for Good-Enough Approximate Modules of ATMR
Abdus Sami Hassan, Tooba Arifeen, Hossein Moradian, Jeong-A Lee
Path Representation in Circuit Netlists Using Linear-Sized ZDDs with Optimal Variable Ordering
Stelios N. Neophytou, Maria K. Michael
LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs
Haiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang
New Lightweight Architectures for Secure FSM Design to Thwart Fault Injection and Trojan Attacks
Vijaypal Singh Rathor, Bharat Garg, G. K. Sharma
Security Analysis of the Efficient Chaos Pseudo-random Number Generator Applied to Video Encryption
Dragan Lambić, Aleksandar Janković, Musheer Ahmad
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error
Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library
Pablo Ilha Vaz, Thiago Hanna Both, Fábio Fedrizzi Vidor, Raphael Martins Brum, Gilson Inácio Wirth
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis
Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard