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Journal of Materials Science: Materials in Electronics

Ausgabe 4/2010

Inhalt (18 Artikel)

Effect of Mn doping on the dielectric properties of BaZr0.2Ti0.8O3 ceramics

Wei Cai, Chunlin Fu, Jiacheng Gao, Xiaoling Deng

Identification and control of SiC polytypes in PVT method

Shenghuang Lin, Zhiming Chen, Bo Liu, Lianbi Li, Xianfeng Feng

Structural stability of In2O3 films as sensor materials

V. Smatko, V. Golovanov, C. C. Liu, A. Kiv, D. Fuks, I. Donchev, M. Ivanovskaya

Electrochemical deposition of CuInTe2 layers for applications in thin film solar cells

G. E. A. Muftah, A. P. Samantilleke, P. D. Warren, S. N. Heavens, I. M. Dharmadasa

Substrate temperature dependent physical properties of sprayed Zn0.76Mg0.24O films

P. Prathap, A. Suryanarayana Reddy, N. Revathi, Y. P. Venkata Subbaiah, K. T. Ramakrishna Reddy

A study on CSC-derived Ba2Ti9O20 phase formation and its dielectric property

Xiao Lou, Wenjian Weng, Kui Cheng, Chenlu Song, Piyi Du, Ge Shen, Gaorong Han

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