2004 | OriginalPaper | Buchkapitel
Stop Minding Your P’s and Q’s: Implementing a Fast and Simple DFS-Based Planarity Testing and Embedding Algorithm
verfasst von : John M. Boyer, Pier Francesco Cortese, Maurizio Patrignani, Giuseppe Di Battista
Erschienen in: Graph Drawing
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
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In this paper we give a new description of the planarity testing and embedding algorithm presented by Boyer and Myrvold [2], providing, in our opinion, new insights on the combinatorial foundations of the algorithm. Especially, we give a detailed illustration of a fundamental phase of the algorithm, called walk-up, which was only succinctly illustrated in [2]. Also, we present an implementation of the algorithm and extensively test its efficiency against the most popular implementations of planarity testing algorithms. Further, as a side effect of the test activity, we propose a general overview of the state of the art (restricted to efficiency issues) of the planarity testing and embedding field.