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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 9/2020

02.04.2020

Structural and optical properties of CdTe + CdTeO3 nanocomposite films with broad blueish photoluminescence

verfasst von: A. Guillén-Cervantes, M. Becerril-Silva, H. E. Silva-López, J. S. Arias-Cerón, E. Campos-González, M. Pérez-González, O. Zelaya-Ángel

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 9/2020

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Abstract

Cadmium telluride plus cadmium tellurite (CdTe + CdTeO3) nanocomposite films were grown by radio frequency magnetron sputtering at room temperature. The CdTe + CdTeO3 samples were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), Raman spectroscopy, UV–Vis absorption, and room temperature photoluminescence (RTPL). XRD and TEM results indicate that films are composed of CdTe and CdTeO3 nanoparticles (NP’s) with 6.7 ± 0.8 nm and 6 ± 1 nm in size, respectively. CdTe NPs grew in hexagonal wurtzite and cubic zinc blende crystalline phases. CdTeO3 NPs are crystalized in cubic phase. Direct bandgap (Eg) (first discrete electronic transition) calculation indicates Eg = 2.6 ± 0.2 eV for CdTe and 3.3 ± 0.2 eV for CdTeO3. RTPL spectrum evidences a wide signal in the 2.0 to 3.25 eV interval. Results reveal that the emission band maximum, which is centered in the blue region of the visible light, is related with band-to-band transitions in CdTe NPs.
Vorheriger Artikel Photovoltaic parameters and stability study of HTM-free mixed-cation perovskite solar cells by incorporating additives to absorbing layers
Nächster Artikel Role of Cr-coating by electroplating method on fabrication and transport properties of Fe/Cr/MgB2 wires

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Metadaten
Titel
Structural and optical properties of CdTe + CdTeO3 nanocomposite films with broad blueish photoluminescence
verfasst von
A. Guillén-Cervantes
M. Becerril-Silva
H. E. Silva-López
J. S. Arias-Cerón
E. Campos-González
M. Pérez-González
O. Zelaya-Ángel
Publikationsdatum
02.04.2020
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 9/2020
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-03284-z

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