2014 | OriginalPaper | Buchkapitel
Studies on Structural Parameters of ZrO2–SnO2 Binary System
verfasst von : Saruchi Surbhi, Sushil Kumar
Erschienen in: Physics of Semiconductor Devices
Verlag: Springer International Publishing
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Nanocrystalline powders of ZrO
2
–SnO
2
system with molar ratio 0.75/0.25 were prepared at room temperature by sol–gel wet chemical route. The as-prepared samples were annealed at 500, 700 and 850 °C for 3 h. Structural parameters of annealed powdered samples were determined by X-ray diffraction (XRD). The crystallite size was calculated using Debye–Scherrer formula as well as Williamson-Hall relation and then compared. Other structural parameters such as lattice parameters, micro-strain, dislocation density and activation energy were also estimated. The functional groups present in the samples were confirmed by Fourier transform infrared spectroscopy (FTIR).