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Erschienen in: Automatic Control and Computer Sciences 6/2019

01.11.2019

Synthesis of Built-in Self-Test Control Circuits Based on the Method of Boolean Complement to Constant-Weight 1-out-of-n Codes

verfasst von: D. V. Efanov, V. V. Sapozhnikov, Vl. V. Sapozhnikov, D. V. Pivovarov

Erschienen in: Automatic Control and Computer Sciences | Ausgabe 6/2019

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Abstract

We consider the problem of designing a built-in control circuit with full self-testability of control equipment based on the method of Boolean complement to constant-weight 1-out-of-n codes. A method is proposed for determining complementary functions considering the formation of the necessary set of test combinations for a complete check of each element of modulo-2 addition in the structure of the Boolean complement block. Due to the introduction of uncertainties in the selection of values, it is possible to minimize the complexity of control functions, which makes it possible to simplify the control logic block. An algorithm for the synthesis of a built-in self-test control circuit based on the method of Boolean complement to a preselected constant-weight 1-out-of-n code is given.
Literatur
1.
Zurück zum Zitat Goessel, M. and Graf, S., Error Detection Circuits, London: McGraw-Hill, 1994. Goessel, M. and Graf, S., Error Detection Circuits, London: McGraw-Hill, 1994.
2.
Zurück zum Zitat Pradhan, D.K., Fault-Tolerant Computer System Design, New York: Prentice Hall, 1996. Pradhan, D.K., Fault-Tolerant Computer System Design, New York: Prentice Hall, 1996.
3.
Zurück zum Zitat Wang, L.-T., Stroud, C.E., and Touba, N.A., System-On-Chip Test Architectures: Nanometer Design for Testability, Morgan Kaufmann Publishers, 2008. Wang, L.-T., Stroud, C.E., and Touba, N.A., System-On-Chip Test Architectures: Nanometer Design for Testability, Morgan Kaufmann Publishers, 2008.
4.
Zurück zum Zitat Ubar, R., Raik, J., and Vierhaus, H.-T., Design and Test Technology for Dependable Systems-On-Chip, New York: IGI Global, 2011.CrossRef Ubar, R., Raik, J., and Vierhaus, H.-T., Design and Test Technology for Dependable Systems-On-Chip, New York: IGI Global, 2011.CrossRef
7.
Zurück zum Zitat Piestrak, S.J., Design of Self-Testing Checkers for Unidirectional Error Detecting Codes, Wroclaw: Oficyna Wydawnicza Politechniki Wroclavskiej, 1995. Piestrak, S.J., Design of Self-Testing Checkers for Unidirectional Error Detecting Codes, Wroclaw: Oficyna Wydawnicza Politechniki Wroclavskiej, 1995.
9.
Zurück zum Zitat Das, D. and Touba, N.A., Weight-based codes and their application to concurrent error detection of multilevel circuits, Proceedings of the 17th IEEE VLSI Test Symposium, USA, CA, Dana Point, April 25–29,1999, pp. 370–376. Das, D. and Touba, N.A., Weight-based codes and their application to concurrent error detection of multilevel circuits, Proceedings of the 17th IEEE VLSI Test Symposium, USA, CA, Dana Point, April 25–29,1999, pp. 370–376.
12.
Zurück zum Zitat Ghosh, S., Basu, S., and Touba, N.A., Synthesis of low power CED circuits based on parity codes, Proceedings of 23rd IEEE VLSI Test Symposium (VTS’05), 2005, pp. 315–320. Ghosh, S., Basu, S., and Touba, N.A., Synthesis of low power CED circuits based on parity codes, Proceedings of 23rd IEEE VLSI Test Symposium (VTS’05), 2005, pp. 315–320.
16.
Zurück zum Zitat Sogomonyan, E.S. and Slabakov, E.V., Samoproveryaemye ustroistva i otkazoustoichivye sistemy (Self-Checking Devices and Fail-Safe Systems), Moscow: Radio i svyaz’, 1989. Sogomonyan, E.S. and Slabakov, E.V., Samoproveryaemye ustroistva i otkazoustoichivye sistemy (Self-Checking Devices and Fail-Safe Systems), Moscow: Radio i svyaz’, 1989.
17.
Zurück zum Zitat Reynolds, D.A. and Metze, G., Fault detection capabilities of alternating logic, IEEE Trans. Comput., 1978, vol. C-27, no. 12, pp. 1093–1098.MathSciNetCrossRef Reynolds, D.A. and Metze, G., Fault detection capabilities of alternating logic, IEEE Trans. Comput., 1978, vol. C-27, no. 12, pp. 1093–1098.MathSciNetCrossRef
19.
Zurück zum Zitat Gessel’, M., Dmitriev, A.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., A self-testing structure for functional failure detection in combinational circuits, Avtom. Telemekh., 1999, no. 11, pp. 162–174. Gessel’, M., Dmitriev, A.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., A self-testing structure for functional failure detection in combinational circuits, Avtom. Telemekh., 1999, no. 11, pp. 162–174.
21.
Zurück zum Zitat Gessel’, M., Dmitriev, A.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Fault detection in combinational circuits using self-dual control, Avtom. Telemekh., 2000, no. 7, pp. 140–149. Gessel’, M., Dmitriev, A.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Fault detection in combinational circuits using self-dual control, Avtom. Telemekh., 2000, no. 7, pp. 140–149.
22.
Zurück zum Zitat Göessel, M., Ocheretny, V., Sogomonyan, E., and Marienfeld, D., New Methods of Concurrent Checking, Dordrecht: Springer Science+Business Media B.V., 2008. Göessel, M., Ocheretny, V., Sogomonyan, E., and Marienfeld, D., New Methods of Concurrent Checking, Dordrecht: Springer Science+Business Media B.V., 2008.
23.
Zurück zum Zitat Goessel, M., Saposhnikov, Vl., Saposhnikov, V., and Dmitriev, A., A new method for concurrent checking by use of a 1-out-of-4 code, Proceedings of the 6th IEEE International On-line Testing Workshop, Palma de Mallorca, 2000, pp. 147–152. https://doi.org/10.1109/OLT.2000.856627 Goessel, M., Saposhnikov, Vl., Saposhnikov, V., and Dmitriev, A., A new method for concurrent checking by use of a 1-out-of-4 code, Proceedings of the 6th IEEE International On-line Testing Workshop, Palma de Mallorca, 2000, pp. 147–152. https://​doi.​org/​10.​1109/​OLT.​2000.​856627
24.
Zurück zum Zitat Saposhnikov, V.V., Morozov, A., Saposhnikov, Vl.V., and Goessel, M., Concurrent checking by use of complementary circuits for 1-out-of-3 codes, 5th International Workshop IEEE DDECS 2002, Brno, 2002. Saposhnikov, V.V., Morozov, A., Saposhnikov, Vl.V., and Goessel, M., Concurrent checking by use of complementary circuits for 1-out-of-3 codes, 5th International Workshop IEEE DDECS 2002, Brno, 2002.
25.
Zurück zum Zitat Sapozhnikov, V.V., Sapozhnikov, Vl.V., Dmitriev, A.V., Morozov, A.V., and Gessel’, M., Organization of the functional control of combinational circuits by the method of logical complement, Elektron. Model., 2002, vol. 24, no. 6, pp. 52–66. Sapozhnikov, V.V., Sapozhnikov, Vl.V., Dmitriev, A.V., Morozov, A.V., and Gessel’, M., Organization of the functional control of combinational circuits by the method of logical complement, Elektron. Model., 2002, vol. 24, no. 6, pp. 52–66.
26.
Zurück zum Zitat Gessel, M., Morozov, A.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Logic complement, a new method of checking the combinational circuits, Autom. Remote Control, 2003, vol. 64, no. 1, pp. 153–161.MathSciNetCrossRef Gessel, M., Morozov, A.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Logic complement, a new method of checking the combinational circuits, Autom. Remote Control, 2003, vol. 64, no. 1, pp. 153–161.MathSciNetCrossRef
27.
Zurück zum Zitat Goessel, M., Morozov, A.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Checking combinational circuits by the method of logic complement, Autom. Remote Control, 2005, vol. 66, no. 8, pp. 1336–1346.CrossRef Goessel, M., Morozov, A.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Checking combinational circuits by the method of logic complement, Autom. Remote Control, 2005, vol. 66, no. 8, pp. 1336–1346.CrossRef
28.
Zurück zum Zitat Sen, S.K. and Roy, S.S., An optimized concurrent self-checker using constraint-don’t cares and 1-out-of-4 code, National Conference (AECDISC-2008) in Asansol Engineering College, 2008. Sen, S.K. and Roy, S.S., An optimized concurrent self-checker using constraint-don’t cares and 1-out-of-4 code, National Conference (AECDISC-2008) in Asansol Engineering College, 2008.
29.
Zurück zum Zitat Sen, S.K., A self-checking circuit for concurrent checking by 1-out-of-4 code with design optimization using constraint don’t cares, National Conference on Emerging Trends and Advances in Electrical Engineering and Renewable Energy (NCEEERE 2010), 2010. Sen, S.K., A self-checking circuit for concurrent checking by 1-out-of-4 code with design optimization using constraint don’t cares, National Conference on Emerging Trends and Advances in Electrical Engineering and Renewable Energy (NCEEERE 2010), 2010.
30.
Zurück zum Zitat Das, D.K., Roy, S.S., Dmitiriev, A., Morozov, A., and Gössel, M., Constraint don’t cares for optimizing designs for concurrent checking by 1-out-of-3 codes, Proceedings of the 10th International Workshops on Boolean Problems, Freiberg, September, 2012, pp. 33–40. Das, D.K., Roy, S.S., Dmitiriev, A., Morozov, A., and Gössel, M., Constraint don’t cares for optimizing designs for concurrent checking by 1-out-of-3 codes, Proceedings of the 10th International Workshops on Boolean Problems, Freiberg, September, 2012, pp. 33–40.
31.
Zurück zum Zitat Efanov, D., Sapozhnikov, V., and Sapozhnikov, Vl., Methods of organization of totally self-checking concurrent error detection system on the basis of constant-weight “1-out-of-3” code, Proceedings of 14th IEEE East-West Design & Test Symposium (EWDTS`2016), Yerevan, 2016, pp. 117–125. https://doi.org/10.1109/EWDTS.2016.7807622 Efanov, D., Sapozhnikov, V., and Sapozhnikov, Vl., Methods of organization of totally self-checking concurrent error detection system on the basis of constant-weight “1-out-of-3” code, Proceedings of 14th IEEE East-West Design & Test Symposium (EWDTS`2016), Yerevan, 2016, pp. 117–125. https://​doi.​org/​10.​1109/​EWDTS.​2016.​7807622
32.
Zurück zum Zitat Sapozhnikov, V.V., Sapozhnikov, Vl.V., and Efanov, D.V., The construction of fully self-checking structures of functional control systems using the constant-weight “1-out-of-3”-code, Elektron. Model., 2016, vol. 38, no. 6, pp. 25–43.CrossRef Sapozhnikov, V.V., Sapozhnikov, Vl.V., and Efanov, D.V., The construction of fully self-checking structures of functional control systems using the constant-weight “1-out-of-3”-code, Elektron. Model., 2016, vol. 38, no. 6, pp. 25–43.CrossRef
33.
Zurück zum Zitat Sapozhnikov, V.V., Sapozhnikov, Vl.V., Efanov, D.V., and Pivovarov, D.V., The logical complement method based on the constant-weight “1-out-of-3”-code for constructing fully self-checking structures of functional control systems, Elektron. Model., 2017, vol. 39, no. 2, pp. 15–34.CrossRef Sapozhnikov, V.V., Sapozhnikov, Vl.V., Efanov, D.V., and Pivovarov, D.V., The logical complement method based on the constant-weight “1-out-of-3”-code for constructing fully self-checking structures of functional control systems, Elektron. Model., 2017, vol. 39, no. 2, pp. 15–34.CrossRef
35.
Zurück zum Zitat Sapozhnikov, V.V., Sapozhnikov, Vl.V., and Efanov, D.V., The construction of self-checking structures of functional control systems based on the constant-weight “1-out-of-3”-code, Probl. Upr., 2017, no. 1, pp. 57–64. Sapozhnikov, V.V., Sapozhnikov, Vl.V., and Efanov, D.V., The construction of self-checking structures of functional control systems based on the constant-weight “1-out-of-3”-code, Probl. Upr., 2017, no. 1, pp. 57–64.
36.
38.
Zurück zum Zitat Sapozhnikov, V.V., Sapozhnikov, Vl.V., Efanov, D.V., and Pivovarov, D.V., A method of constructing a functional control system based on logical complement using the constant-weight “1-out-of-5”-code, Radioelektron. Inf., 2017, no. 3, pp. 15–22. Sapozhnikov, V.V., Sapozhnikov, Vl.V., Efanov, D.V., and Pivovarov, D.V., A method of constructing a functional control system based on logical complement using the constant-weight “1-out-of-5”-code, Radioelektron. Inf., 2017, no. 3, pp. 15–22.
39.
Zurück zum Zitat Pivovarov, D.V., Construction of functional control systems for multi-output combinational circuits by the method of logical complement using constant-weight codes, Avtom. Transp., 2018, vol. 4, no. 1, pp. 130–148. Pivovarov, D.V., Construction of functional control systems for multi-output combinational circuits by the method of logical complement using constant-weight codes, Avtom. Transp., 2018, vol. 4, no. 1, pp. 130–148.
40.
Zurück zum Zitat Carter, W.C., Duke, K.A., and Schneider, P.R., US Patent 747533, 1968. Carter, W.C., Duke, K.A., and Schneider, P.R., US Patent 747533, 1968.
41.
Zurück zum Zitat Sapozhnikov, V.V. and Sapozhnikov, Vl.V., Samoproveryaemye diskretnye ustroistva (Self-Checking Discrete Devices), St. Petersburg: Energoatomizdat, 1992. Sapozhnikov, V.V. and Sapozhnikov, Vl.V., Samoproveryaemye diskretnye ustroistva (Self-Checking Discrete Devices), St. Petersburg: Energoatomizdat, 1992.
42.
Zurück zum Zitat Aksenova, G.P., Necessary and sufficient conditions for constructing fully verifiable convolution schemes modulo 2, Avtom. Telemekh., 1979, no. 9, pp. 126–135. Aksenova, G.P., Necessary and sufficient conditions for constructing fully verifiable convolution schemes modulo 2, Avtom. Telemekh., 1979, no. 9, pp. 126–135.
Metadaten
Titel
Synthesis of Built-in Self-Test Control Circuits Based on the Method of Boolean Complement to Constant-Weight 1-out-of-n Codes
verfasst von
D. V. Efanov
V. V. Sapozhnikov
Vl. V. Sapozhnikov
D. V. Pivovarov
Publikationsdatum
01.11.2019
Verlag
Pleiades Publishing
Erschienen in
Automatic Control and Computer Sciences / Ausgabe 6/2019
Print ISSN: 0146-4116
Elektronische ISSN: 1558-108X
DOI
https://doi.org/10.3103/S014641161906004X

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