Anzeige
Erschienen in:
25.07.2022
Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization
Erschienen in: Journal of Electronic Testing | Ausgabe 4/2022
EinloggenAktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
Abstract
A temperature and humidity-controlled test bench for a wirelessly-powered ultra-low-power temperature sensor IC is presented. It consists of a closed metallic structure of 0.02 m3, forming a faraday-cage around the design under test (DUT), thermally insulated using Polyethylene foam, to provide electromagnetic interference (EMI) clean and thermally stable test environment with an operating temperature range of -10 °C to 100 °C. The temperature control with a settling accuracy of ± 0.6 °C is achieved with air-cooled 100 W Peltier modules, having fast dynamics to reach 95% of the required temperature within 15 min. The humidity is controlled by air circulation through a desiccant pocket, managed at around 15% to avoid water droplets during defrosting. A controllable vacuum of ~ 1.3 kPa is achieved through a vacuum pump when < 15% of de-humification is needed. The system operates at a lower power consumption of 30 W during the temperature retention phase, with acoustic noise of 58 dB-SPL achieved.