Temperature-Dependent I–V Characteristics of In/p-SnSe Schottky Diode

Tin selenide (SnSe), a member of the IV-VI group, belongs to the layered transition metal chalcogenide (TMC) family. As TMCs are chemically inert, and have a binary layered structure of Sn-X (X = S, Se, Te) type, they are used widely in the areas of photovoltaic, electronic, and optoelectronic devices. In the present study, a direct vapor transport technique was used to grow single crystals. The synthesized crystals were examined with energy-dispersive analysis of x-rays, optical microscopy-scanning electron microscopy, and x-ray diffraction techniques to investigate the purity, surface morphology, and phase, respectively. The present work reports the use of a layered monochalcogenide single-crystal substrate for preparation of metal-semiconductor or Schottky junction devices. The In/p-SnSe Schottky diode was prepared by a thermal evaporation method. Analysis for the In/p-SnSe Schottky contact is based on the measurement of the current–voltage characteristics of the Schottky diode within the temperature range (313 K < T < 413 K). Characteristics were analyzed using thermionic emission theory and Schottky barrier diode parameters including barrier height, ideality factor, and series resistance, which were obtained and analyzed using a Ln (I)-V method and Cheung’s method. This work also reports the anisotropic current–voltage characteristics as well as the alteration in the Schottky barrier diode parameters at high temperature.