Skip to main content

2018 | OriginalPaper | Buchkapitel

Temporal Modelling of Bug Numbers of Open Source Software Applications Using LSTM

verfasst von : Jayadeep Pati, Krishnkant Swarnkar, Gourav Dhakad, K. K. Shukla

Erschienen in: Intelligent Systems Technologies and Applications

Verlag: Springer International Publishing

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

Predicting the number of bugs in any software application is an important but challenging task. The software manager by modelling the bug numbers, can take timely decisions in reducing the amount of effort investment and also the allocation of resources. The software developers can also take effective steps for reducing the number of bugs in the future version of the software application. The end users also can make a timely decision on adoption of a particular software application by knowing the growth pattern of bugs in advance. The challenges behind modeling the bug growth patterns are random causes behind a bug. A bug in any software may be caused during testing, development or application. Causal modelling of bug numbers is a complex and tedious task as they consider many internal characteristics to be modelled. In this paper, we have used we have used Long Short Term Memory (LSTM) [14] Network for temporal modelling the bug numbers of three different software applications. We have used both univariate and multivariate modelling approach to predict bug number in advance. The goal is to have an appropriate model for software bug growth pattern.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literatur
1.
Zurück zum Zitat Zimmermann, T., Nagappan, N., Zeller, A.: Predicting bugs from history. In: Software Evolution, pp. 69–88. Springer, Heidelberg (2008) Zimmermann, T., Nagappan, N., Zeller, A.: Predicting bugs from history. In: Software Evolution, pp. 69–88. Springer, Heidelberg (2008)
2.
Zurück zum Zitat Herraiz, I., Gonzalez-Barahona, J.M., Robles, G.: Forecasting the number of changes in Eclipse using time series analysis. In: Fourth International Workshop on ICSE Workshops on Mining Software Repositories, MSR 2007, p. 32. IEEE, May 2007 Herraiz, I., Gonzalez-Barahona, J.M., Robles, G.: Forecasting the number of changes in Eclipse using time series analysis. In: Fourth International Workshop on ICSE Workshops on Mining Software Repositories, MSR 2007, p. 32. IEEE, May 2007
3.
Zurück zum Zitat Wu, W., Zhang, W., Yang, Y., Wang, Q.: Time series analysis for bug number prediction. In: 2010 2nd International Conference on Software Engineering and Data Mining (SEDM), pp. 589–596. IEEE, June 2010 Wu, W., Zhang, W., Yang, Y., Wang, Q.: Time series analysis for bug number prediction. In: 2010 2nd International Conference on Software Engineering and Data Mining (SEDM), pp. 589–596. IEEE, June 2010
4.
Zurück zum Zitat Zhang, H.: An initial study of the growth of eclipse defects. In: Proceedings of the 2008 International Working Conference on Mining Software Repositories, pp. 141–144. ACM, May 2008 Zhang, H.: An initial study of the growth of eclipse defects. In: Proceedings of the 2008 International Working Conference on Mining Software Repositories, pp. 141–144. ACM, May 2008
5.
Zurück zum Zitat Pati, J., Shukla, K.K.: A nonlinear ARIMA technique for Debian bug number prediction. In: Proceedings of the International Conference on Advances in Computer and Electronics Technology - ACET 2014, SEEK-DL 2014, September 2014. doi:10.15224/978-1-63248-024-8-14 Pati, J., Shukla, K.K.: A nonlinear ARIMA technique for Debian bug number prediction. In: Proceedings of the International Conference on Advances in Computer and Electronics Technology - ACET 2014, SEEK-DL 2014, September 2014. doi:10.​15224/​978-1-63248-024-8-14
6.
Zurück zum Zitat Pati, J., Shukla, K.K.: A comparison of ARIMA, neural network and a hybrid technique for Debian bug number prediction. In: 2014 International Conference on Computer and Communication Technology (ICCCT), pp. 47–53. IEEE, September 2014 Pati, J., Shukla, K.K.: A comparison of ARIMA, neural network and a hybrid technique for Debian bug number prediction. In: 2014 International Conference on Computer and Communication Technology (ICCCT), pp. 47–53. IEEE, September 2014
10.
Zurück zum Zitat Zhao, X., Wang, C., Yang, Z., Zhang, Y., Yuan, X.: Online news emotion prediction with bidirectional LSTM. In: International Conference on Web-Age Information Management, pp. 238–250. Springer International Publishing, June 2016 Zhao, X., Wang, C., Yang, Z., Zhang, Y., Yuan, X.: Online news emotion prediction with bidirectional LSTM. In: International Conference on Web-Age Information Management, pp. 238–250. Springer International Publishing, June 2016
11.
12.
Zurück zum Zitat Greff, K., Srivastava, R.K., Koutník, J., Steunebrink, B.R., Schmidhuber, J.: LSTM: a search space odyssey. IEEE Trans. Neural Netw. Learn. Syst. (2016) Greff, K., Srivastava, R.K., Koutník, J., Steunebrink, B.R., Schmidhuber, J.: LSTM: a search space odyssey. IEEE Trans. Neural Netw. Learn. Syst. (2016)
13.
Zurück zum Zitat Gers, F.A., Schmidhuber, J., Cummins, F.: Learning to forget: continual prediction with LSTM. Neural Comput. 12(10), 2451–2471 (2000)CrossRef Gers, F.A., Schmidhuber, J., Cummins, F.: Learning to forget: continual prediction with LSTM. Neural Comput. 12(10), 2451–2471 (2000)CrossRef
14.
Zurück zum Zitat Hochreiter, S., Schmidhuber, J.: Long short-term memory. Neural Comput. 9(8), 1735–1780 (1997)CrossRef Hochreiter, S., Schmidhuber, J.: Long short-term memory. Neural Comput. 9(8), 1735–1780 (1997)CrossRef
15.
Zurück zum Zitat Graves, A.: Supervised sequence labelling. In: Supervised Sequence Labelling with Recurrent Neural Networks, pp. 5–13. Springer, Heidelberg (2012) Graves, A.: Supervised sequence labelling. In: Supervised Sequence Labelling with Recurrent Neural Networks, pp. 5–13. Springer, Heidelberg (2012)
Metadaten
Titel
Temporal Modelling of Bug Numbers of Open Source Software Applications Using LSTM
verfasst von
Jayadeep Pati
Krishnkant Swarnkar
Gourav Dhakad
K. K. Shukla
Copyright-Jahr
2018
DOI
https://doi.org/10.1007/978-3-319-68385-0_16