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Journal of Electronic Testing
Erschienen in: Journal of Electronic Testing 4/2018

31.05.2018

Test and Reliability in Approximate Computing

verfasst von: Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena Ioana Vatajelu

Erschienen in: Journal of Electronic Testing | Ausgabe 4/2018

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Abstract

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.
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Metadaten
Titel
Test and Reliability in Approximate Computing
verfasst von
Lorena Anghel
Mounir Benabdenbi
Alberto Bosio
Marcello Traiola
Elena Ioana Vatajelu
Publikationsdatum
31.05.2018
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 4/2018
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-018-5734-9

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