Anzeige
Erschienen in:
2014 | OriginalPaper | Buchkapitel
Test Generation for Short-Circuit Faults in Digital Circuits
verfasst von : József Sziray
Erschienen in: Issues and Challenges of Intelligent Systems and Computational Intelligence
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
Abstract
In the first part, the paper presents a test calculation principle which serves for producing tests of logic faults in digital circuits. The name of the principle is composite justification. The considered fault model includes stuck-at-0/1 logic faults. Both single and multiple faults are included. In this paper only combinational logic is taken into consideration. The computations are performed at the gate level. The calculation principle is comparatively simple. It is based only on successive line-value justification, and it yields an opportunity to be realized by an efficient computer program. The first part serves for presenting the basic principle which is used in the second part of the paper. The second part deals with another fault class, namely, short-circuit or bridging faults. A short circuit is an erroneous galvanic connection between two circuit lines. Here, a new algorithm is presented for generating tests, where the composite justification is extended to handle this type of faults, as well.