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Erschienen in:

01.06.2019

Testing Signals for Electronics: Criteria for Synthesis

verfasst von: S. Herasimov, V. Pavlii, O. Tymoshchuk, M.Yu. Yakovlev, D.Ye. Khaustov, Ye. Ryzhov, L. Sakovych, Yu.A. Nastishin

Erschienen in: Journal of Electronic Testing | Ausgabe 3/2019

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Abstract

Expressions for calculation of optimal criteria for highest information and sensitivity indices and lowest mean square error in test signals for radio-electronic systems (RES), working under influence of the additive Gaussian noise, are derived. In this framework, the technical state of a RES is determined via measurement of its dynamic characteristics. Because at negligible electromagnetic noise, all test signals are equivalently optimal, the test signal of the RES, which is optimal for a high-level noise, is considered to be optimal for the noise of lower level. It is proven, that at high levels of noise these three criteria (maximums of informative and sensitivity indices and minimum of mean square error) reduce into a single criterion. This universal criterion can be used to synthesize test signals with optimal parameters for determination of the technical state of any radio electronic device at any level of an additive Gaussian noise and can be applied in situ of RES operation.

Vorheriger Artikel Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas

Nächster Artikel Saleh Model and Digital Predistortion for Power Amplifiers in Wireless Communications Using the Third-Order Intercept Point

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Titel: Testing Signals for Electronics: Criteria for Synthesis
verfasst von: S. Herasimov
V. Pavlii
O. Tymoshchuk
M.Yu. Yakovlev
D.Ye. Khaustov
Ye. Ryzhov
L. Sakovych
Yu.A. Nastishin
Publikationsdatum: 01.06.2019
Verlag: Springer US
Erschienen in: Journal of Electronic Testing / Ausgabe 3/2019
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI: https://doi.org/10.1007/s10836-019-05798-9

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