2012 | OriginalPaper | Buchkapitel
The Research of Transparent Material Thickness Detection System Based on CCD
verfasst von : Zhang Ning, Qiao Yang, Xu Xiping, Li Hongwei
Erschienen in: Recent Advances in Computer Science and Information Engineering
Verlag: Springer Berlin Heidelberg
Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.
Wählen Sie Textabschnitte aus um mit Künstlicher Intelligenz passenden Patente zu finden. powered by
Markieren Sie Textabschnitte, um KI-gestützt weitere passende Inhalte zu finden. powered by
This paper proposes a transparent material thickness detecting system based on CCD sensor, in order to achieve non-contact on-line detection of transparent material thickness parameter. The system utilizes the principle that the displace error is different between the upper and lower surface of the transparent medium, which is simple in structure, high precision in measurement, and more convenient than the measuring solutions before. This design can solve the thickness and size detection problems of optical glass, optical crystal and optical transparent Polymer Material (or optical plastics).The measurement range is 1-10mm, and measuring accuracy is ±0.01mm.