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1990 | OriginalPaper | Buchkapitel

Theory of Scanning Tunneling Microscopy and Spectroscopy

verfasst von : J. Tersoff

Erschienen in: Scanning Tunneling Microscopy and Related Methods

Verlag: Springer Netherlands

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In the few years which have passed since its invention1 by Binnig, Rohrer, and coworkers, scanning tunneling microscopy (STM) has established itself as a remarkably powerful and versatile tool for studying surfaces. This paper reviews the present theoretical understanding of STM, with emphasis on the interpretation of atomic-resolution STM images. Some familiarity with the basic principles of STM is assumed here; the basic ideas and instrumentation have been described in detail elsewhere.1

Metadaten
Titel
Theory of Scanning Tunneling Microscopy and Spectroscopy
verfasst von
J. Tersoff
Copyright-Jahr
1990
Verlag
Springer Netherlands
DOI
https://doi.org/10.1007/978-94-015-7871-4_4