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Physics of Metals and Metallography
Erschienen in: Physics of Metals and Metallography 13/2019

01.12.2019

Thickness Dependence of Magnetic Properties of Tb–Co/Ti and Tb–Co/Si Multilayers

verfasst von: A. V. Svalov, E. V. Kudyukov, K. G. Balymov, E. A. Stepanova, V. O. Vas’kovskiy, A. Larrañaga, G. V. Kurlyandskaya

Erschienen in: Physics of Metals and Metallography | Ausgabe 13/2019

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Abstract

Nanoscale [Tb–Co/Ti]n and [Tb–Co/Si]n multilayers were designed and prepared by the rf-sputtering technique. Their structure and magnetic properties have been experimentally studied. Low-angle X‑ray diffraction studies confirmed that a well-defined layered structure was formed in all investigated cases. The change in the magnetic properties of multilayers with a decrease in the thickness of the Tb–Co layers was due to both the size effect and the influence of the material of the non-magnetic spacers, namely the reduction of the Co atom moment because of the electron charge transfer from atoms of the Ti or Si spacers to atoms of the cobalt.
Vorheriger Artikel Large Variety of the On-Site Order Parameters and Phase States in Quasi-2D HTSC Cuprates
Nächster Artikel Magneto-Optical Effects in Au/Ni Based Composite Hyperbolic Metamaterials

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Metadaten
Titel
Thickness Dependence of Magnetic Properties of Tb–Co/Ti and Tb–Co/Si Multilayers
verfasst von
A. V. Svalov
E. V. Kudyukov
K. G. Balymov
E. A. Stepanova
V. O. Vas’kovskiy
A. Larrañaga
G. V. Kurlyandskaya
Publikationsdatum
01.12.2019
Verlag
Pleiades Publishing
Erschienen in
Physics of Metals and Metallography / Ausgabe 13/2019
Print ISSN: 0031-918X
Elektronische ISSN: 1555-6190
DOI
https://doi.org/10.1134/S0031918X19130258

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