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2016 | OriginalPaper | Buchkapitel

Towards MC/DC Coverage of Properties Specification Patterns

verfasst von : Ana C. V. de Melo, Corina S. Păsăreanu, Simone Hanazumi

Erschienen in: Theoretical Aspects of Computing – ICTAC 2016

Verlag: Springer International Publishing

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Abstract

Model based testing is used to validate the actual system against its requirements described as formal specification, while formal verification proves that a requirement is not violated in the overall system. Verifying properties, in certain cases, becomes very expensive (or unpractical), mainly when the application of test techniques is enough for the users purposes. The Modified Condition/Decision Coverage (MC/DC), used in the avionics software industry, is recognised as a good technique to find out the possible mistakes on programs logics because it covers how each condition can affect the programs’ decisions outcomes. It has also been adapted to provide the coverage of specifications in the requirements-based approach.
This paper proposes a technique to decompose properties (specifications), defined as regular expressions, into subexpressions representing test cases to cover the MD/DC for specifications (Unique First Word Recognition). Then, instead of proving an entire property, we can use a model checker to observe and select program executions that cover all the test cases given as the subexpressions. To support this approach, we give a syntactic characterisation of the properties decomposition, inductively defined over the syntax of regular expressions, and show how to use the technique to decompose Specification Patterns (SPS) and monitor their satisfiability using the Java PathFinder (JPF).

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Fußnoten
1
Here, we use the relaxed term “recognised by a regular expression” meaning “recognised by a an automaton that recognises the language defined by a regular expression”.
 
2
Operator ? does not appear in the definition because it can be defined using the \(\mid \) operator.
 
Literatur
1.
Zurück zum Zitat Ammann, P., Offutt, J.: Introduction to Software Testing, vol. 54. Cambridge University Press, Cambridge (2008)CrossRefMATH Ammann, P., Offutt, J.: Introduction to Software Testing, vol. 54. Cambridge University Press, Cambridge (2008)CrossRefMATH
2.
Zurück zum Zitat Dwyer, M.B., Avrunin, G.S., Corbett, J.C.: Patterns in property specifications for finite-state verification. In: Proceedings of the 21st International Conference on Software Engineering, ICSE 1999, pp. 411–420. ACM, New York (1999) Dwyer, M.B., Avrunin, G.S., Corbett, J.C.: Patterns in property specifications for finite-state verification. In: Proceedings of the 21st International Conference on Software Engineering, ICSE 1999, pp. 411–420. ACM, New York (1999)
3.
Zurück zum Zitat Fraser, G., Wotawa, F., Ammann, P.E.: Testing with model checkers: a survey. Softw. Test. Verif. Reliab. 19(3), 215–261 (2009)CrossRef Fraser, G., Wotawa, F., Ammann, P.E.: Testing with model checkers: a survey. Softw. Test. Verif. Reliab. 19(3), 215–261 (2009)CrossRef
4.
Zurück zum Zitat Gargantini, A., Heitmeyer, C.: Using model checking to generate tests from requirements specifications. SIGSOFT Softw. Eng. Not. 24(6), 146–162 (1999)CrossRef Gargantini, A., Heitmeyer, C.: Using model checking to generate tests from requirements specifications. SIGSOFT Softw. Eng. Not. 24(6), 146–162 (1999)CrossRef
5.
Zurück zum Zitat Hanazumi, S., de Melo, A.C.V., Păsăreanu, C.S.: From testing purposes to formal JPF properties. In: Java PathFinder Workshop. ACM (2014) Hanazumi, S., de Melo, A.C.V., Păsăreanu, C.S.: From testing purposes to formal JPF properties. In: Java PathFinder Workshop. ACM (2014)
6.
Zurück zum Zitat Hesari, S., Behjati, R., Yue, T.: Towards a systematic requirement-based test generation framework: industrial challenges and needs. In: Proceedings of the 2013 21st IEEE International Requirements Engineering Conference, RE 2013, pp. 261–266 (2013) Hesari, S., Behjati, R., Yue, T.: Towards a systematic requirement-based test generation framework: industrial challenges and needs. In: Proceedings of the 2013 21st IEEE International Requirements Engineering Conference, RE 2013, pp. 261–266 (2013)
7.
Zurück zum Zitat Holloway, C.: Towards understanding the DO-178C/ED-12C assurance case. In: 7th IET International Conference on System Safety, Incorporating the Cyber Security Conference 2012, p. 14. Institution of Engineering and Technology (2012) Holloway, C.: Towards understanding the DO-178C/ED-12C assurance case. In: 7th IET International Conference on System Safety, Incorporating the Cyber Security Conference 2012, p. 14. Institution of Engineering and Technology (2012)
9.
Zurück zum Zitat Pecheur, C., Raimondi, F., Brat, G.: A formal analysis of requirements-based testing. In: Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, pp. 47–56 (2009) Pecheur, C., Raimondi, F., Brat, G.: A formal analysis of requirements-based testing. In: Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, pp. 47–56 (2009)
10.
Zurück zum Zitat Pnueli, A.: The temporal logic of programs. In: SFCS 1977: Proceedings of the 18th Annual Symposium on Foundations of Computer Science, pp. 46–57. IEEE Computer Society, Washington, DC (1977) Pnueli, A.: The temporal logic of programs. In: SFCS 1977: Proceedings of the 18th Annual Symposium on Foundations of Computer Science, pp. 46–57. IEEE Computer Society, Washington, DC (1977)
11.
Zurück zum Zitat Rajan, A., Whalen, M., Staats, M., Heimdahl, M.P.E.: Requirements coverage as an adequacy measure for conformance testing. In: Liu, S., Maibaum, T., Araki, K. (eds.) ICFEM 2008. LNCS, vol. 5256, pp. 86–104. Springer, Heidelberg (2008). doi:10.1007/978-3-540-88194-0_8 CrossRef Rajan, A., Whalen, M., Staats, M., Heimdahl, M.P.E.: Requirements coverage as an adequacy measure for conformance testing. In: Liu, S., Maibaum, T., Araki, K. (eds.) ICFEM 2008. LNCS, vol. 5256, pp. 86–104. Springer, Heidelberg (2008). doi:10.​1007/​978-3-540-88194-0_​8 CrossRef
12.
Zurück zum Zitat Sametinger, J., Rozenblit, J., Lysecky, R., Ott, P.: Security challenges for medical devices. Commun. ACM 58(4), 74–82 (2015)CrossRef Sametinger, J., Rozenblit, J., Lysecky, R., Ott, P.: Security challenges for medical devices. Commun. ACM 58(4), 74–82 (2015)CrossRef
13.
14.
Zurück zum Zitat Tan, L., Sokolsky, O., Lee, I.: Specification-based testing with linear temporal logic. In: Proceedings of the 2004 IEEE International Conference on Information Reuse and Integration, IRI 2004 (2004) Tan, L., Sokolsky, O., Lee, I.: Specification-based testing with linear temporal logic. In: Proceedings of the 2004 IEEE International Conference on Information Reuse and Integration, IRI 2004 (2004)
15.
Zurück zum Zitat Whalen, M.W., Rajan, A., Heimdahl, M.P., Miller, S.P.: Coverage metrics for requirements-based testing. In: International Symposium on Software Testing and Analysis, p. 25 (2006) Whalen, M.W., Rajan, A., Heimdahl, M.P., Miller, S.P.: Coverage metrics for requirements-based testing. In: International Symposium on Software Testing and Analysis, p. 25 (2006)
Metadaten
Titel
Towards MC/DC Coverage of Properties Specification Patterns
verfasst von
Ana C. V. de Melo
Corina S. Păsăreanu
Simone Hanazumi
Copyright-Jahr
2016
DOI
https://doi.org/10.1007/978-3-319-46750-4_10