Skip to main content
Erschienen in:

18.07.2024

Two-Step Single-Slope ADC Utilizing Differential Ramps for CMOS Image Sensors

verfasst von: Dongxing Fang, Kaiming Nie, Ziyang Zhang, Jiangtao Xu

Erschienen in: Circuits, Systems, and Signal Processing | Ausgabe 10/2024

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

This paper presents a two-step single-slope (TS-SS) analog-to-digital converter (ADC) for CMOS image sensors (CIS). The proposed TS-SS ADC divides the pixel signal into small and large signal regions using a precomparator. When quantizing large pixel signals, the TS-SS ADC enters accelerated mode, which leverages the differential topology of the ramp generator to speed up quantization. The accelerated mode reduces the row cycle, resulting in a 31.3% reduction at 320 MHz clock from 27.3 to 18.75 µs. The designed 12-bit TS-SS ADC was designed in a 110 nm 1P4M CMOS technology, and its linearity was verified by process corner post-simulation and Monte Carlo simulation.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

ATZelektronik

Die Fachzeitschrift ATZelektronik bietet für Entwickler und Entscheider in der Automobil- und Zulieferindustrie qualitativ hochwertige und fundierte Informationen aus dem gesamten Spektrum der Pkw- und Nutzfahrzeug-Elektronik. 

Lassen Sie sich jetzt unverbindlich 2 kostenlose Ausgabe zusenden.

ATZelectronics worldwide

ATZlectronics worldwide is up-to-speed on new trends and developments in automotive electronics on a scientific level with a high depth of information. 

Order your 30-days-trial for free and without any commitment.

Weitere Produktempfehlungen anzeigen
Literatur
1.
Zurück zum Zitat D.G. Chen, F. Tang, M.K. Law, A. Bermak, A 12 PJ/pixel analog-to-information converter based 816 \(\times \) 640 pixel CMOS image sensor. IEEE J. Solid-State Circ. 49(5), 1210–1222 (2014)CrossRef D.G. Chen, F. Tang, M.K. Law, A. Bermak, A 12 PJ/pixel analog-to-information converter based 816 \(\times \) 640 pixel CMOS image sensor. IEEE J. Solid-State Circ. 49(5), 1210–1222 (2014)CrossRef
2.
Zurück zum Zitat B.K. Jeon, S.K. Hong, O.K. Kwon, A low-power 10-bit single-slope ADC using power gating and multi-clocks for CMOS image sensors, in International SoC Design Conference (ISOCC), (IEEE, Jeju, South Korea, 2016), pp. 257–258 B.K. Jeon, S.K. Hong, O.K. Kwon, A low-power 10-bit single-slope ADC using power gating and multi-clocks for CMOS image sensors, in International SoC Design Conference (ISOCC), (IEEE, Jeju, South Korea, 2016), pp. 257–258
3.
Zurück zum Zitat J.Y. Jeong, J. Shim, S.K. Hong, O.K. Kwon, A high speed and energy efficient multi-bit cyclic ADC using single slope quantizer for CMOS image sensors. IEEE Trans. Circ. Syst. II Exp. Brief. 68(7), 2322–2326 (2021) J.Y. Jeong, J. Shim, S.K. Hong, O.K. Kwon, A high speed and energy efficient multi-bit cyclic ADC using single slope quantizer for CMOS image sensors. IEEE Trans. Circ. Syst. II Exp. Brief. 68(7), 2322–2326 (2021)
4.
Zurück zum Zitat D. Kim, J. Bae, M. Song, A high-speed CMOS image sensor with a novel digital correlated double sampling and a differential difference amplifier. Sensors 15(3), 5081–5095 (2015)CrossRef D. Kim, J. Bae, M. Song, A high-speed CMOS image sensor with a novel digital correlated double sampling and a differential difference amplifier. Sensors 15(3), 5081–5095 (2015)CrossRef
5.
Zurück zum Zitat H.J. Kim, 11-Bit column-parallel single-slope ADC with first-step half-reference ramping scheme for high-speed CMOS image sensor. IEEE J. Solid-State Circ. 56(7), 2132–2141 (2021)CrossRef H.J. Kim, 11-Bit column-parallel single-slope ADC with first-step half-reference ramping scheme for high-speed CMOS image sensor. IEEE J. Solid-State Circ. 56(7), 2132–2141 (2021)CrossRef
6.
Zurück zum Zitat M.K. Kim, S.K. Hong, O.K. Kwon, An area-efficient and low-power 12-b SAR/single-slope ADC without calibration method for CMOS image sensors. IEEE Trans. Electron Devices 63(9), 3599–3604 (2016)CrossRef M.K. Kim, S.K. Hong, O.K. Kwon, An area-efficient and low-power 12-b SAR/single-slope ADC without calibration method for CMOS image sensors. IEEE Trans. Electron Devices 63(9), 3599–3604 (2016)CrossRef
7.
Zurück zum Zitat D. Lee, G. Han, low-power correlated double sampling counter for column-parallel CMOS imagers. Electron. Lett. 43(24), 1362–1364 (2007)CrossRef D. Lee, G. Han, low-power correlated double sampling counter for column-parallel CMOS imagers. Electron. Lett. 43(24), 1362–1364 (2007)CrossRef
8.
Zurück zum Zitat J. Lee, J. Lee, J. Burm, A CMOS image sensor with non-memory capacitor two-step single slope ADC for high frame rate, in International SoC Design Conference (ISOCC), (IEEE, Gyeongju, South Korea, 2015), pp. 333–334 J. Lee, J. Lee, J. Burm, A CMOS image sensor with non-memory capacitor two-step single slope ADC for high frame rate, in International SoC Design Conference (ISOCC), (IEEE, Gyeongju, South Korea, 2015), pp. 333–334
9.
Zurück zum Zitat S. Lim, J. Lee, D. Kim, G. Han, A high-speed CMOS image sensor with column-parallel two-step single-slope ADCS. IEEE Trans. Electron Devices 56(3), 393–398 (2009)CrossRef S. Lim, J. Lee, D. Kim, G. Han, A high-speed CMOS image sensor with column-parallel two-step single-slope ADCS. IEEE Trans. Electron Devices 56(3), 393–398 (2009)CrossRef
10.
Zurück zum Zitat G. Liu, N. Yu, H. Zhang, J. He, A fully differential SAR/single-slope ADC for CMOS imager sensor, in IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), (IEEE, Xi’an, China, 2019), pp. 1–3 G. Liu, N. Yu, H. Zhang, J. He, A fully differential SAR/single-slope ADC for CMOS imager sensor, in IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), (IEEE, Xi’an, China, 2019), pp. 1–3
11.
Zurück zum Zitat K. Nie, W. Zha, X. Shi, J. Li, J. Xu, J. Ma, A single slope ADC with row-wise noise reduction technique for CMOS image sensor. IEEE Trans. Circ. Syst. I: Regul. Pap. 67(9), 2873–2882 (2020) K. Nie, W. Zha, X. Shi, J. Li, J. Xu, J. Ma, A single slope ADC with row-wise noise reduction technique for CMOS image sensor. IEEE Trans. Circ. Syst. I: Regul. Pap. 67(9), 2873–2882 (2020)
12.
Zurück zum Zitat H. Park, C. Yu, H. Kim, Y. Roh, J. Burm, Low power CMOS image sensors using two step single slope ADC with bandwidth-limited comparators voltage range extended ramp generator for battery-limited application. IEEE Sens. J. 20(6), 2831–2838 (2019)CrossRef H. Park, C. Yu, H. Kim, Y. Roh, J. Burm, Low power CMOS image sensors using two step single slope ADC with bandwidth-limited comparators voltage range extended ramp generator for battery-limited application. IEEE Sens. J. 20(6), 2831–2838 (2019)CrossRef
13.
Zurück zum Zitat S.Y. Park, H.J. Kim, CMOS image sensor with two-step single-slope ADC using differential ramp generator. IEEE Trans. Electron Devices 68(10), 4966–4971 (2021)CrossRef S.Y. Park, H.J. Kim, CMOS image sensor with two-step single-slope ADC using differential ramp generator. IEEE Trans. Electron Devices 68(10), 4966–4971 (2021)CrossRef
14.
Zurück zum Zitat M.R. Snoeij, P. Donegan, A.J.P. Theuwissen, K.A.A. Makinwa, J.H. Huijsing, A CMOS image sensor with a column-level multiple-ramp single-slope ADC, in IEEE International Solid-State Circuits Conference. Digest of Technical Papers, (IEEE, San Francisco, CA, USA, 2007), pp. 506–618 M.R. Snoeij, P. Donegan, A.J.P. Theuwissen, K.A.A. Makinwa, J.H. Huijsing, A CMOS image sensor with a column-level multiple-ramp single-slope ADC, in IEEE International Solid-State Circuits Conference. Digest of Technical Papers, (IEEE, San Francisco, CA, USA, 2007), pp. 506–618
15.
Zurück zum Zitat F. Tang, D.G. Chen, B. Wang, A. Bermak, Low-power CMOS image sensor based on column-parallel single-slope/SAR quantization scheme. IEEE Trans. Electron Devices 60(8), 2561–2566 (2013)CrossRef F. Tang, D.G. Chen, B. Wang, A. Bermak, Low-power CMOS image sensor based on column-parallel single-slope/SAR quantization scheme. IEEE Trans. Electron Devices 60(8), 2561–2566 (2013)CrossRef
16.
Zurück zum Zitat Q. Zhang, N. Ning, Z. Zhang, J. Li, K. Wu, Q. Yu, A 12-bit two-step single-slope ADC with a constant input-common-mode level resistor ramp generator. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 30(5), 644–655 (2022)CrossRef Q. Zhang, N. Ning, Z. Zhang, J. Li, K. Wu, Q. Yu, A 12-bit two-step single-slope ADC with a constant input-common-mode level resistor ramp generator. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 30(5), 644–655 (2022)CrossRef
Metadaten
Titel
Two-Step Single-Slope ADC Utilizing Differential Ramps for CMOS Image Sensors
verfasst von
Dongxing Fang
Kaiming Nie
Ziyang Zhang
Jiangtao Xu
Publikationsdatum
18.07.2024
Verlag
Springer US
Erschienen in
Circuits, Systems, and Signal Processing / Ausgabe 10/2024
Print ISSN: 0278-081X
Elektronische ISSN: 1531-5878
DOI
https://doi.org/10.1007/s00034-024-02767-2