2003 | OriginalPaper | Buchkapitel
X-Ray Spectral Measurement: EDS and WDS
Autoren: Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael
Verlag: Springer US
Enthalten in: Professional Book Archive
Chemical analysis in the scanning electron microscope and electron microprobe is performed by measuring the energy and intensity distribution of the x-ray signal generated by a focused electron beam. The subject of x-ray production has already been introduced in Chapter 6, which describes the mechanisms for both characteristic and continuum x-ray production. This chapter is concerned with the methods for detecting and measuring these x-rays as well as converting them into a useful form for qualitative and quantitative analysis.