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Erschienen in: Journal of Materials Science: Materials in Electronics 17/2020

24.07.2020

Z-Scheme mechanism study of ternary BiPO4/reduced graphene oxide/protonated g-C3N4 photocatalyst with interfacial electric field mediating for the effective photocatalytic degradation of tetracycline

verfasst von: Ya-Mu Xia, Shan-Peng Chu, Zi-Yang Liao, Shu-Yu Sun, Xu Cheng, Wei-Wei Gao

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 17/2020

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Abstract

Z-scheme heterojunction research has become a hotspot in the field of photocatalysis owing to the strong oxidative and reductive capacity for driving photocatalytic reactions. In this work, for the first time, a Z-scheme ternary bismuth phosphate/reduced graphene oxide/protonated g-C3N4 (BiPO4/rGO/pg-C3N4) photocatalyst was fabricated for photocatalytic degradation of tetracycline (TC). The optimal mass ratios of rGO and pg-C3N4 were confirmed as 1.2 wt% and 40 wt%, respectively. This Z-scheme heterojunction exhibited an enhanced TC degrading ability with an 80.0% of TC decomposition after 50 min simulated solar light irradiation, which was 3.3 and 6.3 times that of pg-C3N4 and BiPO4, respectively. Importantly, the internal electric field forced Z-scheme charge transfer of BiPO4/rGO/pg-C3N4 composites, possessing higher charge separation efficiency. The formation of the Z-scheme heterojunction was substantiated by radical scavenging experiments and Mott–Schottky measurements, and it was beneficial for the photocatalytic reaction by accelerating the charge separation and improving the redox ability. Moreover, rGO as cocatalyst could not only provide TC adsorption and catalytic sites but also further promote the charge transfer.

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Metadaten
Titel
Z-Scheme mechanism study of ternary BiPO4/reduced graphene oxide/protonated g-C3N4 photocatalyst with interfacial electric field mediating for the effective photocatalytic degradation of tetracycline
verfasst von
Ya-Mu Xia
Shan-Peng Chu
Zi-Yang Liao
Shu-Yu Sun
Xu Cheng
Wei-Wei Gao
Publikationsdatum
24.07.2020
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 17/2020
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-04050-x

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